ARRANGEMENT FOR MEASURING DEFORMATIONS

ARRANGEMENT FOR MEASURING DEFORMATIONS

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Hauptverfasser: PANCHENKO ALEKSANDR I,SU, STOLYAROV VASILIJ R,SU
Format: Patent
Sprache:eng ; rus
Schlagworte:
MEASURING
MEASURING ANGLES
MEASURING AREAS
MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
MEASURING LENGTH, THICKNESS OR SIMILAR LINEARDIMENSIONS
PHYSICS
TESTING
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creator PANCHENKO ALEKSANDR I,SU
STOLYAROV VASILIJ R,SU
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language eng ; rus
recordid cdi_epo_espacenet_SU1564489A1
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subjects MEASURING
MEASURING ANGLES
MEASURING AREAS
MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
MEASURING LENGTH, THICKNESS OR SIMILAR LINEARDIMENSIONS
PHYSICS
TESTING
title ARRANGEMENT FOR MEASURING DEFORMATIONS
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