METHOD OF DETERMINING RESONATNT FREQUENCY OF ELASTI ELEMENT OF SEMICONDUCTOR INTEGRAL CONVERTER

METHOD OF DETERMINING RESONATNT FREQUENCY OF ELASTI ELEMENT OF SEMICONDUCTOR INTEGRAL CONVERTER

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Hauptverfasser: BORSHCHEV VYACHESLAV N,SU, PONOMARENKO VYACHESLAV V,SU, SPALEK YURIJ M,SU, TIKHOMIROV MIKHAIL YU,SU
Format: Patent
Sprache:eng ; rus
Schlagworte:
MEASUREMENT OF MECHANICAL VIBRATIONS OR ULTRASONIC, SONIC ORINFRASONIC WAVES
MEASURING
PHYSICS
TESTING
TESTING STATIC OR DYNAMIC BALANCE OF MACHINES ORSTRUCTURES
TESTING STRUCTURES OR APPARATUS NOT OTHERWISE PROVIDED FOR
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creator BORSHCHEV VYACHESLAV N,SU
PONOMARENKO VYACHESLAV V,SU
SPALEK YURIJ M,SU
TIKHOMIROV MIKHAIL YU,SU
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subjects MEASUREMENT OF MECHANICAL VIBRATIONS OR ULTRASONIC, SONIC ORINFRASONIC WAVES
MEASURING
PHYSICS
TESTING
TESTING STATIC OR DYNAMIC BALANCE OF MACHINES ORSTRUCTURES
TESTING STRUCTURES OR APPARATUS NOT OTHERWISE PROVIDED FOR
title METHOD OF DETERMINING RESONATNT FREQUENCY OF ELASTI ELEMENT OF SEMICONDUCTOR INTEGRAL CONVERTER
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