INTERFEROMETER FOR MEASURING LINEAR DISPLACEMENTS OF OBJECTS

INTERFEROMETER FOR MEASURING LINEAR DISPLACEMENTS OF OBJECTS

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Hauptverfasser: FEDCHENKO OLEG I,SU, SAVKIN VLADIMIR V,SU
Format: Patent
Sprache:eng ; rus
Schlagworte:
MEASURING
MEASURING ANGLES
MEASURING AREAS
MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
MEASURING LENGTH, THICKNESS OR SIMILAR LINEARDIMENSIONS
PHYSICS
TESTING
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creator FEDCHENKO OLEG I,SU
SAVKIN VLADIMIR V,SU
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language eng ; rus
recordid cdi_epo_espacenet_SU1416861A1
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subjects MEASURING
MEASURING ANGLES
MEASURING AREAS
MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
MEASURING LENGTH, THICKNESS OR SIMILAR LINEARDIMENSIONS
PHYSICS
TESTING
title INTERFEROMETER FOR MEASURING LINEAR DISPLACEMENTS OF OBJECTS
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