DEVICE FOR MEASURING COMPONENTS OF COMPLEX IMPEDANCE OF TWO-TERMINAL NETWORK
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creator | PROKUNTSEV ALEKSANDR F,SU YUMAEV RAVIL M,SU GADZHIEV OLEG S,SU CHISTYAKOV OLEG N,SU |
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fullrecord | <record><control><sourceid>epo_EVB</sourceid><recordid>TN_cdi_epo_espacenet_SU1348739A1</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>SU1348739A1</sourcerecordid><originalsourceid>FETCH-epo_espacenet_SU1348739A13</originalsourceid><addsrcrecordid>eNrjZPBxcQ3zdHZVcPMPUvB1dQwODfL0c1dw9vcN8Pdz9QsJVvB3A_N8XCMUPH0DXF0c_YCqgYIh4f66Ia5Bvp5-jj4Kfq5AbpA3DwNrWmJOcSovlOZmUHBzDXH20E0tyI9PLS5ITE7NSy2JDw41NDaxMDe2dDQ0JkIJAHIRLeQ</addsrcrecordid><sourcetype>Open Access Repository</sourcetype><iscdi>true</iscdi><recordtype>patent</recordtype></control><display><type>patent</type><title>DEVICE FOR MEASURING COMPONENTS OF COMPLEX IMPEDANCE OF TWO-TERMINAL NETWORK</title><source>esp@cenet</source><creator>PROKUNTSEV ALEKSANDR F,SU ; YUMAEV RAVIL M,SU ; GADZHIEV OLEG S,SU ; CHISTYAKOV OLEG N,SU</creator><creatorcontrib>PROKUNTSEV ALEKSANDR F,SU ; YUMAEV RAVIL M,SU ; GADZHIEV OLEG S,SU ; CHISTYAKOV OLEG N,SU</creatorcontrib><language>eng ; rus</language><subject>MEASURING ; MEASURING ELECTRIC VARIABLES ; MEASURING MAGNETIC VARIABLES ; PHYSICS ; TESTING</subject><creationdate>1987</creationdate><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=19871030&DB=EPODOC&CC=SU&NR=1348739A1$$EHTML$$P50$$Gepo$$Hfree_for_read</linktohtml><link.rule.ids>230,308,777,882,25545,76296</link.rule.ids><linktorsrc>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=19871030&DB=EPODOC&CC=SU&NR=1348739A1$$EView_record_in_European_Patent_Office$$FView_record_in_$$GEuropean_Patent_Office$$Hfree_for_read</linktorsrc></links><search><creatorcontrib>PROKUNTSEV ALEKSANDR F,SU</creatorcontrib><creatorcontrib>YUMAEV RAVIL M,SU</creatorcontrib><creatorcontrib>GADZHIEV OLEG S,SU</creatorcontrib><creatorcontrib>CHISTYAKOV OLEG N,SU</creatorcontrib><title>DEVICE FOR MEASURING COMPONENTS OF COMPLEX IMPEDANCE OF TWO-TERMINAL NETWORK</title><subject>MEASURING</subject><subject>MEASURING ELECTRIC VARIABLES</subject><subject>MEASURING MAGNETIC VARIABLES</subject><subject>PHYSICS</subject><subject>TESTING</subject><fulltext>true</fulltext><rsrctype>patent</rsrctype><creationdate>1987</creationdate><recordtype>patent</recordtype><sourceid>EVB</sourceid><recordid>eNrjZPBxcQ3zdHZVcPMPUvB1dQwODfL0c1dw9vcN8Pdz9QsJVvB3A_N8XCMUPH0DXF0c_YCqgYIh4f66Ia5Bvp5-jj4Kfq5AbpA3DwNrWmJOcSovlOZmUHBzDXH20E0tyI9PLS5ITE7NSy2JDw41NDaxMDe2dDQ0JkIJAHIRLeQ</recordid><startdate>19871030</startdate><enddate>19871030</enddate><creator>PROKUNTSEV ALEKSANDR F,SU</creator><creator>YUMAEV RAVIL M,SU</creator><creator>GADZHIEV OLEG S,SU</creator><creator>CHISTYAKOV OLEG N,SU</creator><scope>EVB</scope></search><sort><creationdate>19871030</creationdate><title>DEVICE FOR MEASURING COMPONENTS OF COMPLEX IMPEDANCE OF TWO-TERMINAL NETWORK</title><author>PROKUNTSEV ALEKSANDR F,SU ; YUMAEV RAVIL M,SU ; GADZHIEV OLEG S,SU ; CHISTYAKOV OLEG N,SU</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-epo_espacenet_SU1348739A13</frbrgroupid><rsrctype>patents</rsrctype><prefilter>patents</prefilter><language>eng ; rus</language><creationdate>1987</creationdate><topic>MEASURING</topic><topic>MEASURING ELECTRIC VARIABLES</topic><topic>MEASURING MAGNETIC VARIABLES</topic><topic>PHYSICS</topic><topic>TESTING</topic><toplevel>online_resources</toplevel><creatorcontrib>PROKUNTSEV ALEKSANDR F,SU</creatorcontrib><creatorcontrib>YUMAEV RAVIL M,SU</creatorcontrib><creatorcontrib>GADZHIEV OLEG S,SU</creatorcontrib><creatorcontrib>CHISTYAKOV OLEG N,SU</creatorcontrib><collection>esp@cenet</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>PROKUNTSEV ALEKSANDR F,SU</au><au>YUMAEV RAVIL M,SU</au><au>GADZHIEV OLEG S,SU</au><au>CHISTYAKOV OLEG N,SU</au><format>patent</format><genre>patent</genre><ristype>GEN</ristype><title>DEVICE FOR MEASURING COMPONENTS OF COMPLEX IMPEDANCE OF TWO-TERMINAL NETWORK</title><date>1987-10-30</date><risdate>1987</risdate><oa>free_for_read</oa></addata></record> |
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language | eng ; rus |
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subjects | MEASURING MEASURING ELECTRIC VARIABLES MEASURING MAGNETIC VARIABLES PHYSICS TESTING |
title | DEVICE FOR MEASURING COMPONENTS OF COMPLEX IMPEDANCE OF TWO-TERMINAL NETWORK |
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