DEVICE FOR MEASURING THICKNESS OF EXTRUDED DIELECTRIC FILM

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Hauptverfasser: SKRIPNIK YURIJ A,SU, PETUKHOV ARKADIJ D,SU, EFREMOV VIKTOR A,SU, SENATOS VLADIMIR A,SU, MARCHENKO VALERIJ T,SU, ZNACHKOVSKIJ BORIS N,SU, SVIRIDOV NIKOLAJ M,SU, OSETSKIJ YURIJ M,SU
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creator SKRIPNIK YURIJ A,SU
PETUKHOV ARKADIJ D,SU
EFREMOV VIKTOR A,SU
SENATOS VLADIMIR A,SU
MARCHENKO VALERIJ T,SU
ZNACHKOVSKIJ BORIS N,SU
SVIRIDOV NIKOLAJ M,SU
OSETSKIJ YURIJ M,SU
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fullrecord <record><control><sourceid>epo_EVB</sourceid><recordid>TN_cdi_epo_espacenet_SU1318784A1</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>SU1318784A1</sourcerecordid><originalsourceid>FETCH-epo_espacenet_SU1318784A13</originalsourceid><addsrcrecordid>eNrjZLBycQ3zdHZVcPMPUvB1dQwODfL0c1cI8fB09vZzDQ5W8HdTcI0ICQp1cXVRcPF09XF1DgnydFZw8_Tx5WFgTUvMKU7lhdLcDApuriHOHrqpBfnxqcUFicmpeakl8cGhhsaGFuYWJo6GxkQoAQBgFii3</addsrcrecordid><sourcetype>Open Access Repository</sourcetype><iscdi>true</iscdi><recordtype>patent</recordtype></control><display><type>patent</type><title>DEVICE FOR MEASURING THICKNESS OF EXTRUDED DIELECTRIC FILM</title><source>esp@cenet</source><creator>SKRIPNIK YURIJ A,SU ; PETUKHOV ARKADIJ D,SU ; EFREMOV VIKTOR A,SU ; SENATOS VLADIMIR A,SU ; MARCHENKO VALERIJ T,SU ; ZNACHKOVSKIJ BORIS N,SU ; SVIRIDOV NIKOLAJ M,SU ; OSETSKIJ YURIJ M,SU</creator><creatorcontrib>SKRIPNIK YURIJ A,SU ; PETUKHOV ARKADIJ D,SU ; EFREMOV VIKTOR A,SU ; SENATOS VLADIMIR A,SU ; MARCHENKO VALERIJ T,SU ; ZNACHKOVSKIJ BORIS N,SU ; SVIRIDOV NIKOLAJ M,SU ; OSETSKIJ YURIJ M,SU</creatorcontrib><language>eng ; rus</language><subject>MEASURING ; MEASURING ANGLES ; MEASURING AREAS ; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS ; MEASURING LENGTH, THICKNESS OR SIMILAR LINEARDIMENSIONS ; PHYSICS ; TESTING</subject><creationdate>1987</creationdate><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&amp;date=19870623&amp;DB=EPODOC&amp;CC=SU&amp;NR=1318784A1$$EHTML$$P50$$Gepo$$Hfree_for_read</linktohtml><link.rule.ids>230,308,780,885,25564,76547</link.rule.ids><linktorsrc>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&amp;date=19870623&amp;DB=EPODOC&amp;CC=SU&amp;NR=1318784A1$$EView_record_in_European_Patent_Office$$FView_record_in_$$GEuropean_Patent_Office$$Hfree_for_read</linktorsrc></links><search><creatorcontrib>SKRIPNIK YURIJ A,SU</creatorcontrib><creatorcontrib>PETUKHOV ARKADIJ D,SU</creatorcontrib><creatorcontrib>EFREMOV VIKTOR A,SU</creatorcontrib><creatorcontrib>SENATOS VLADIMIR A,SU</creatorcontrib><creatorcontrib>MARCHENKO VALERIJ T,SU</creatorcontrib><creatorcontrib>ZNACHKOVSKIJ BORIS N,SU</creatorcontrib><creatorcontrib>SVIRIDOV NIKOLAJ M,SU</creatorcontrib><creatorcontrib>OSETSKIJ YURIJ M,SU</creatorcontrib><title>DEVICE FOR MEASURING THICKNESS OF EXTRUDED DIELECTRIC FILM</title><subject>MEASURING</subject><subject>MEASURING ANGLES</subject><subject>MEASURING AREAS</subject><subject>MEASURING IRREGULARITIES OF SURFACES OR CONTOURS</subject><subject>MEASURING LENGTH, THICKNESS OR SIMILAR LINEARDIMENSIONS</subject><subject>PHYSICS</subject><subject>TESTING</subject><fulltext>true</fulltext><rsrctype>patent</rsrctype><creationdate>1987</creationdate><recordtype>patent</recordtype><sourceid>EVB</sourceid><recordid>eNrjZLBycQ3zdHZVcPMPUvB1dQwODfL0c1cI8fB09vZzDQ5W8HdTcI0ICQp1cXVRcPF09XF1DgnydFZw8_Tx5WFgTUvMKU7lhdLcDApuriHOHrqpBfnxqcUFicmpeakl8cGhhsaGFuYWJo6GxkQoAQBgFii3</recordid><startdate>19870623</startdate><enddate>19870623</enddate><creator>SKRIPNIK YURIJ A,SU</creator><creator>PETUKHOV ARKADIJ D,SU</creator><creator>EFREMOV VIKTOR A,SU</creator><creator>SENATOS VLADIMIR A,SU</creator><creator>MARCHENKO VALERIJ T,SU</creator><creator>ZNACHKOVSKIJ BORIS N,SU</creator><creator>SVIRIDOV NIKOLAJ M,SU</creator><creator>OSETSKIJ YURIJ M,SU</creator><scope>EVB</scope></search><sort><creationdate>19870623</creationdate><title>DEVICE FOR MEASURING THICKNESS OF EXTRUDED DIELECTRIC FILM</title><author>SKRIPNIK YURIJ A,SU ; PETUKHOV ARKADIJ D,SU ; EFREMOV VIKTOR A,SU ; SENATOS VLADIMIR A,SU ; MARCHENKO VALERIJ T,SU ; ZNACHKOVSKIJ BORIS N,SU ; SVIRIDOV NIKOLAJ M,SU ; OSETSKIJ YURIJ M,SU</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-epo_espacenet_SU1318784A13</frbrgroupid><rsrctype>patents</rsrctype><prefilter>patents</prefilter><language>eng ; rus</language><creationdate>1987</creationdate><topic>MEASURING</topic><topic>MEASURING ANGLES</topic><topic>MEASURING AREAS</topic><topic>MEASURING IRREGULARITIES OF SURFACES OR CONTOURS</topic><topic>MEASURING LENGTH, THICKNESS OR SIMILAR LINEARDIMENSIONS</topic><topic>PHYSICS</topic><topic>TESTING</topic><toplevel>online_resources</toplevel><creatorcontrib>SKRIPNIK YURIJ A,SU</creatorcontrib><creatorcontrib>PETUKHOV ARKADIJ D,SU</creatorcontrib><creatorcontrib>EFREMOV VIKTOR A,SU</creatorcontrib><creatorcontrib>SENATOS VLADIMIR A,SU</creatorcontrib><creatorcontrib>MARCHENKO VALERIJ T,SU</creatorcontrib><creatorcontrib>ZNACHKOVSKIJ BORIS N,SU</creatorcontrib><creatorcontrib>SVIRIDOV NIKOLAJ M,SU</creatorcontrib><creatorcontrib>OSETSKIJ YURIJ M,SU</creatorcontrib><collection>esp@cenet</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>SKRIPNIK YURIJ A,SU</au><au>PETUKHOV ARKADIJ D,SU</au><au>EFREMOV VIKTOR A,SU</au><au>SENATOS VLADIMIR A,SU</au><au>MARCHENKO VALERIJ T,SU</au><au>ZNACHKOVSKIJ BORIS N,SU</au><au>SVIRIDOV NIKOLAJ M,SU</au><au>OSETSKIJ YURIJ M,SU</au><format>patent</format><genre>patent</genre><ristype>GEN</ristype><title>DEVICE FOR MEASURING THICKNESS OF EXTRUDED DIELECTRIC FILM</title><date>1987-06-23</date><risdate>1987</risdate><oa>free_for_read</oa></addata></record>
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language eng ; rus
recordid cdi_epo_espacenet_SU1318784A1
source esp@cenet
subjects MEASURING
MEASURING ANGLES
MEASURING AREAS
MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
MEASURING LENGTH, THICKNESS OR SIMILAR LINEARDIMENSIONS
PHYSICS
TESTING
title DEVICE FOR MEASURING THICKNESS OF EXTRUDED DIELECTRIC FILM
url https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2025-01-04T15%3A29%3A24IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-epo_EVB&rft_val_fmt=info:ofi/fmt:kev:mtx:patent&rft.genre=patent&rft.au=SKRIPNIK%20YURIJ%20A,SU&rft.date=1987-06-23&rft_id=info:doi/&rft_dat=%3Cepo_EVB%3ESU1318784A1%3C/epo_EVB%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_id=info:pmid/&rfr_iscdi=true