APPARATUS FOR TESTING THICKNESS OF DIELECTRIC COATING ON DIELECTRIC BASE

Gespeichert in:
Bibliographische Detailangaben
Hauptverfasser: SKRIPNIK YURIJ A,SU, DYKOV ANATOLIJ N,SU, SVIRIDOV NIKOLAJ M,SU
Format: Patent
Sprache:eng ; rus
Schlagworte:
Online-Zugang:Volltext bestellen
Tags: Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
container_end_page
container_issue
container_start_page
container_title
container_volume
creator SKRIPNIK YURIJ A,SU
DYKOV ANATOLIJ N,SU
SVIRIDOV NIKOLAJ M,SU
description
format Patent
fullrecord <record><control><sourceid>epo_EVB</sourceid><recordid>TN_cdi_epo_espacenet_SU1186935A1</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>SU1186935A1</sourcerecordid><originalsourceid>FETCH-epo_espacenet_SU1186935A13</originalsourceid><addsrcrecordid>eNrjZPBwDAhwDHIMCQ1WcPMPUghxDQ7x9HNXCPHwdPb2cw0OVvB3U3DxdPVxdQ4J8nRWcPZ3BMv7-yGLOjkGu_IwsKYl5hSn8kJpbgYFN9cQZw_d1IL8-NTigsTk1LzUkvjgUENDCzNLY1NHQ2MilAAArmEsgw</addsrcrecordid><sourcetype>Open Access Repository</sourcetype><iscdi>true</iscdi><recordtype>patent</recordtype></control><display><type>patent</type><title>APPARATUS FOR TESTING THICKNESS OF DIELECTRIC COATING ON DIELECTRIC BASE</title><source>esp@cenet</source><creator>SKRIPNIK YURIJ A,SU ; DYKOV ANATOLIJ N,SU ; SVIRIDOV NIKOLAJ M,SU</creator><creatorcontrib>SKRIPNIK YURIJ A,SU ; DYKOV ANATOLIJ N,SU ; SVIRIDOV NIKOLAJ M,SU</creatorcontrib><edition>4</edition><language>eng ; rus</language><subject>MEASURING ; MEASURING ANGLES ; MEASURING AREAS ; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS ; MEASURING LENGTH, THICKNESS OR SIMILAR LINEARDIMENSIONS ; PHYSICS ; TESTING</subject><creationdate>1985</creationdate><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&amp;date=19851023&amp;DB=EPODOC&amp;CC=SU&amp;NR=1186935A1$$EHTML$$P50$$Gepo$$Hfree_for_read</linktohtml><link.rule.ids>230,308,780,885,25555,76308</link.rule.ids><linktorsrc>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&amp;date=19851023&amp;DB=EPODOC&amp;CC=SU&amp;NR=1186935A1$$EView_record_in_European_Patent_Office$$FView_record_in_$$GEuropean_Patent_Office$$Hfree_for_read</linktorsrc></links><search><creatorcontrib>SKRIPNIK YURIJ A,SU</creatorcontrib><creatorcontrib>DYKOV ANATOLIJ N,SU</creatorcontrib><creatorcontrib>SVIRIDOV NIKOLAJ M,SU</creatorcontrib><title>APPARATUS FOR TESTING THICKNESS OF DIELECTRIC COATING ON DIELECTRIC BASE</title><subject>MEASURING</subject><subject>MEASURING ANGLES</subject><subject>MEASURING AREAS</subject><subject>MEASURING IRREGULARITIES OF SURFACES OR CONTOURS</subject><subject>MEASURING LENGTH, THICKNESS OR SIMILAR LINEARDIMENSIONS</subject><subject>PHYSICS</subject><subject>TESTING</subject><fulltext>true</fulltext><rsrctype>patent</rsrctype><creationdate>1985</creationdate><recordtype>patent</recordtype><sourceid>EVB</sourceid><recordid>eNrjZPBwDAhwDHIMCQ1WcPMPUghxDQ7x9HNXCPHwdPb2cw0OVvB3U3DxdPVxdQ4J8nRWcPZ3BMv7-yGLOjkGu_IwsKYl5hSn8kJpbgYFN9cQZw_d1IL8-NTigsTk1LzUkvjgUENDCzNLY1NHQ2MilAAArmEsgw</recordid><startdate>19851023</startdate><enddate>19851023</enddate><creator>SKRIPNIK YURIJ A,SU</creator><creator>DYKOV ANATOLIJ N,SU</creator><creator>SVIRIDOV NIKOLAJ M,SU</creator><scope>EVB</scope></search><sort><creationdate>19851023</creationdate><title>APPARATUS FOR TESTING THICKNESS OF DIELECTRIC COATING ON DIELECTRIC BASE</title><author>SKRIPNIK YURIJ A,SU ; DYKOV ANATOLIJ N,SU ; SVIRIDOV NIKOLAJ M,SU</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-epo_espacenet_SU1186935A13</frbrgroupid><rsrctype>patents</rsrctype><prefilter>patents</prefilter><language>eng ; rus</language><creationdate>1985</creationdate><topic>MEASURING</topic><topic>MEASURING ANGLES</topic><topic>MEASURING AREAS</topic><topic>MEASURING IRREGULARITIES OF SURFACES OR CONTOURS</topic><topic>MEASURING LENGTH, THICKNESS OR SIMILAR LINEARDIMENSIONS</topic><topic>PHYSICS</topic><topic>TESTING</topic><toplevel>online_resources</toplevel><creatorcontrib>SKRIPNIK YURIJ A,SU</creatorcontrib><creatorcontrib>DYKOV ANATOLIJ N,SU</creatorcontrib><creatorcontrib>SVIRIDOV NIKOLAJ M,SU</creatorcontrib><collection>esp@cenet</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>SKRIPNIK YURIJ A,SU</au><au>DYKOV ANATOLIJ N,SU</au><au>SVIRIDOV NIKOLAJ M,SU</au><format>patent</format><genre>patent</genre><ristype>GEN</ristype><title>APPARATUS FOR TESTING THICKNESS OF DIELECTRIC COATING ON DIELECTRIC BASE</title><date>1985-10-23</date><risdate>1985</risdate><edition>4</edition><oa>free_for_read</oa></addata></record>
fulltext fulltext_linktorsrc
identifier
ispartof
issn
language eng ; rus
recordid cdi_epo_espacenet_SU1186935A1
source esp@cenet
subjects MEASURING
MEASURING ANGLES
MEASURING AREAS
MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
MEASURING LENGTH, THICKNESS OR SIMILAR LINEARDIMENSIONS
PHYSICS
TESTING
title APPARATUS FOR TESTING THICKNESS OF DIELECTRIC COATING ON DIELECTRIC BASE
url https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2025-01-14T22%3A11%3A32IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-epo_EVB&rft_val_fmt=info:ofi/fmt:kev:mtx:patent&rft.genre=patent&rft.au=SKRIPNIK%20YURIJ%20A,SU&rft.date=1985-10-23&rft_id=info:doi/&rft_dat=%3Cepo_EVB%3ESU1186935A1%3C/epo_EVB%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_id=info:pmid/&rfr_iscdi=true