METHOD OF DETERMINATION OF ANGLE BETWEEN OPTICAL AXIS OF SINGLE-AXIS CRYSTAL AND ENTRANCE FACE THEREOF
Gespeichert in:
| Hauptverfasser: | , , , |
|---|---|
| Format: | Patent |
| Sprache: | eng |
| Schlagworte: | |
| Online-Zugang: | Volltext bestellen |
| Tags: |
Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
|
| container_end_page | |
|---|---|
| container_issue | |
| container_start_page | |
| container_title | |
| container_volume | |
| creator | LAPUSHKINA GALINA I,SU SHENDEROVICH LEV S,SU PETROV ALEKSANDR K,SU MUNITS RAISA M,SU |
| description | |
| format | Patent |
| fullrecord | <record><control><sourceid>epo_EVB</sourceid><recordid>TN_cdi_epo_espacenet_SU1121605A1</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>SU1121605A1</sourcerecordid><originalsourceid>FETCH-epo_espacenet_SU1121605A13</originalsourceid><addsrcrecordid>eNqNikEKwjAQRbNxIeod5gIFo-h-TCYm0CaSjKirUiRdiRbq_bERD-Dmf_57fy76htgGDcGAJqbYOI_sgi8A_bEmOBBfiCZwYqewBry6VGxyRVffqeItcXFeA3mO6BWBwSnYUqRglmLWd48xr369EGCIla3y8GrzOHT3_MzvNp2l3Mj9eody-8flAxd5NEU</addsrcrecordid><sourcetype>Open Access Repository</sourcetype><iscdi>true</iscdi><recordtype>patent</recordtype></control><display><type>patent</type><title>METHOD OF DETERMINATION OF ANGLE BETWEEN OPTICAL AXIS OF SINGLE-AXIS CRYSTAL AND ENTRANCE FACE THEREOF</title><source>esp@cenet</source><creator>LAPUSHKINA GALINA I,SU ; SHENDEROVICH LEV S,SU ; PETROV ALEKSANDR K,SU ; MUNITS RAISA M,SU</creator><creatorcontrib>LAPUSHKINA GALINA I,SU ; SHENDEROVICH LEV S,SU ; PETROV ALEKSANDR K,SU ; MUNITS RAISA M,SU</creatorcontrib><language>eng</language><subject>INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES ; MEASURING ; PHYSICS ; TESTING</subject><creationdate>1984</creationdate><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=19841030&DB=EPODOC&CC=SU&NR=1121605A1$$EHTML$$P50$$Gepo$$Hfree_for_read</linktohtml><link.rule.ids>230,308,780,885,25564,76547</link.rule.ids><linktorsrc>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=19841030&DB=EPODOC&CC=SU&NR=1121605A1$$EView_record_in_European_Patent_Office$$FView_record_in_$$GEuropean_Patent_Office$$Hfree_for_read</linktorsrc></links><search><creatorcontrib>LAPUSHKINA GALINA I,SU</creatorcontrib><creatorcontrib>SHENDEROVICH LEV S,SU</creatorcontrib><creatorcontrib>PETROV ALEKSANDR K,SU</creatorcontrib><creatorcontrib>MUNITS RAISA M,SU</creatorcontrib><title>METHOD OF DETERMINATION OF ANGLE BETWEEN OPTICAL AXIS OF SINGLE-AXIS CRYSTAL AND ENTRANCE FACE THEREOF</title><subject>INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES</subject><subject>MEASURING</subject><subject>PHYSICS</subject><subject>TESTING</subject><fulltext>true</fulltext><rsrctype>patent</rsrctype><creationdate>1984</creationdate><recordtype>patent</recordtype><sourceid>EVB</sourceid><recordid>eNqNikEKwjAQRbNxIeod5gIFo-h-TCYm0CaSjKirUiRdiRbq_bERD-Dmf_57fy76htgGDcGAJqbYOI_sgi8A_bEmOBBfiCZwYqewBry6VGxyRVffqeItcXFeA3mO6BWBwSnYUqRglmLWd48xr369EGCIla3y8GrzOHT3_MzvNp2l3Mj9eody-8flAxd5NEU</recordid><startdate>19841030</startdate><enddate>19841030</enddate><creator>LAPUSHKINA GALINA I,SU</creator><creator>SHENDEROVICH LEV S,SU</creator><creator>PETROV ALEKSANDR K,SU</creator><creator>MUNITS RAISA M,SU</creator><scope>EVB</scope></search><sort><creationdate>19841030</creationdate><title>METHOD OF DETERMINATION OF ANGLE BETWEEN OPTICAL AXIS OF SINGLE-AXIS CRYSTAL AND ENTRANCE FACE THEREOF</title><author>LAPUSHKINA GALINA I,SU ; SHENDEROVICH LEV S,SU ; PETROV ALEKSANDR K,SU ; MUNITS RAISA M,SU</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-epo_espacenet_SU1121605A13</frbrgroupid><rsrctype>patents</rsrctype><prefilter>patents</prefilter><language>eng</language><creationdate>1984</creationdate><topic>INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES</topic><topic>MEASURING</topic><topic>PHYSICS</topic><topic>TESTING</topic><toplevel>online_resources</toplevel><creatorcontrib>LAPUSHKINA GALINA I,SU</creatorcontrib><creatorcontrib>SHENDEROVICH LEV S,SU</creatorcontrib><creatorcontrib>PETROV ALEKSANDR K,SU</creatorcontrib><creatorcontrib>MUNITS RAISA M,SU</creatorcontrib><collection>esp@cenet</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>LAPUSHKINA GALINA I,SU</au><au>SHENDEROVICH LEV S,SU</au><au>PETROV ALEKSANDR K,SU</au><au>MUNITS RAISA M,SU</au><format>patent</format><genre>patent</genre><ristype>GEN</ristype><title>METHOD OF DETERMINATION OF ANGLE BETWEEN OPTICAL AXIS OF SINGLE-AXIS CRYSTAL AND ENTRANCE FACE THEREOF</title><date>1984-10-30</date><risdate>1984</risdate><oa>free_for_read</oa></addata></record> |
| fulltext | fulltext_linktorsrc |
| identifier | |
| ispartof | |
| issn | |
| language | eng |
| recordid | cdi_epo_espacenet_SU1121605A1 |
| source | esp@cenet |
| subjects | INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES MEASURING PHYSICS TESTING |
| title | METHOD OF DETERMINATION OF ANGLE BETWEEN OPTICAL AXIS OF SINGLE-AXIS CRYSTAL AND ENTRANCE FACE THEREOF |
| url | https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2024-12-19T09%3A42%3A00IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-epo_EVB&rft_val_fmt=info:ofi/fmt:kev:mtx:patent&rft.genre=patent&rft.au=LAPUSHKINA%20GALINA%20I,SU&rft.date=1984-10-30&rft_id=info:doi/&rft_dat=%3Cepo_EVB%3ESU1121605A1%3C/epo_EVB%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_id=info:pmid/&rfr_iscdi=true |