METRIC BASED PERFORMANCE MONITORING METHOD AND SYSTEM

METRIC BASED PERFORMANCE MONITORING METHOD AND SYSTEM

A metric based performance monitoring A process control system is disclosed in which diagnostics are performed at multiple levels of the plant, results of the diagnostics converted into Key Performance Indicators and compared to predetermined benchmarks such that an integrated and overall determinat...

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Hauptverfasser: HUA JOSEPH LEE CHING, VISHWASRAO SHARAD, KASHYAP NAVEEN, ORNELAS EMELIN
Format: Patent
Sprache:eng
Schlagworte:
CONTROL OR REGULATING SYSTEMS IN GENERAL
CONTROLLING
FUNCTIONAL ELEMENTS OF SUCH SYSTEMS
MONITORING OR TESTING ARRANGEMENTS FOR SUCH SYSTEMS ORELEMENTS
PHYSICS
REGULATING
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creator HUA JOSEPH LEE CHING
VISHWASRAO SHARAD
KASHYAP NAVEEN
ORNELAS EMELIN
description A metric based performance monitoring A process control system is disclosed in which diagnostics are performed at multiple levels of the plant, results of the diagnostics converted into Key Performance Indicators and compared to predetermined benchmarks such that an integrated and overall determination of the plants' performance may be displayed.
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subjects CONTROL OR REGULATING SYSTEMS IN GENERAL
CONTROLLING
FUNCTIONAL ELEMENTS OF SUCH SYSTEMS
MONITORING OR TESTING ARRANGEMENTS FOR SUCH SYSTEMS ORELEMENTS
PHYSICS
REGULATING
title METRIC BASED PERFORMANCE MONITORING METHOD AND SYSTEM
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