SUBSTRATE PROCESSING APPARATUS

A substrate processing apparatus includes a polishing section and a transport section. The polishing section has a first polishing unit, a second polishing unit, and a transport mechanism. The first polishing unit has a first polishing apparatus and a second polishing apparatus. The second polishing...

Ausführliche Beschreibung

Gespeichert in:
Bibliographische Detailangaben
Hauptverfasser: SHINKAI Kenji, MAEDA Koji, YAMAGUCHI Kuniaki, TAMURA Masayuki, YOSHINARI Dai, EHARA Shun, ISOBE Soichi, HAIYANG Xu, ASANO Kentaro, SHIMOMOTO Hiroshi, ISOKAWA Hidetatsu
Format: Patent
Sprache:eng
Schlagworte:
Online-Zugang:Volltext bestellen
Tags: Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
container_end_page
container_issue
container_start_page
container_title
container_volume
creator SHINKAI Kenji
MAEDA Koji
YAMAGUCHI Kuniaki
TAMURA Masayuki
YOSHINARI Dai
EHARA Shun
ISOBE Soichi
HAIYANG Xu
ASANO Kentaro
SHIMOMOTO Hiroshi
ISOKAWA Hidetatsu
description A substrate processing apparatus includes a polishing section and a transport section. The polishing section has a first polishing unit, a second polishing unit, and a transport mechanism. The first polishing unit has a first polishing apparatus and a second polishing apparatus. The second polishing unit has a third polishing apparatus and a fourth polishing apparatus. Each of the first to fourth polishing apparatuses has a polishing table to which a polishing pad is mounted, a top ring, and auxiliary units that perform a process on the polishing pad during polishing. Around the polishing table, a pair of auxiliary unit mounting units for mounting the respective auxiliary units in a left-right switchable manner with respect to a straight line connecting a swing center of the top ring and a center of rotation of the polishing table is provided at respective positions symmetrical with respect to the straight line.
format Patent
fullrecord <record><control><sourceid>epo_EVB</sourceid><recordid>TN_cdi_epo_espacenet_SG11202009373PA</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>SG11202009373PA</sourcerecordid><originalsourceid>FETCH-epo_espacenet_SG11202009373PA3</originalsourceid><addsrcrecordid>eNrjZJALDnUKDglyDHFVCAjyd3YNDvb0c1dwDAhwBIqFBvMwsKYl5hSn8kJpbgYVN9cQZw_d1IL8-NTigsTk1LzUkvhgd0NDIwMjAwNLY3PjAEdjIpUBAKKUIyA</addsrcrecordid><sourcetype>Open Access Repository</sourcetype><iscdi>true</iscdi><recordtype>patent</recordtype></control><display><type>patent</type><title>SUBSTRATE PROCESSING APPARATUS</title><source>esp@cenet</source><creator>SHINKAI Kenji ; MAEDA Koji ; YAMAGUCHI Kuniaki ; TAMURA Masayuki ; YOSHINARI Dai ; EHARA Shun ; ISOBE Soichi ; HAIYANG Xu ; ASANO Kentaro ; SHIMOMOTO Hiroshi ; ISOKAWA Hidetatsu</creator><creatorcontrib>SHINKAI Kenji ; MAEDA Koji ; YAMAGUCHI Kuniaki ; TAMURA Masayuki ; YOSHINARI Dai ; EHARA Shun ; ISOBE Soichi ; HAIYANG Xu ; ASANO Kentaro ; SHIMOMOTO Hiroshi ; ISOKAWA Hidetatsu</creatorcontrib><description>A substrate processing apparatus includes a polishing section and a transport section. The polishing section has a first polishing unit, a second polishing unit, and a transport mechanism. The first polishing unit has a first polishing apparatus and a second polishing apparatus. The second polishing unit has a third polishing apparatus and a fourth polishing apparatus. Each of the first to fourth polishing apparatuses has a polishing table to which a polishing pad is mounted, a top ring, and auxiliary units that perform a process on the polishing pad during polishing. Around the polishing table, a pair of auxiliary unit mounting units for mounting the respective auxiliary units in a left-right switchable manner with respect to a straight line connecting a swing center of the top ring and a center of rotation of the polishing table is provided at respective positions symmetrical with respect to the straight line.</description><language>eng</language><subject>BASIC ELECTRIC ELEMENTS ; DRESSING OR CONDITIONING OF ABRADING SURFACES ; ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR ; ELECTRICITY ; FEEDING OF GRINDING, POLISHING, OR LAPPING AGENTS ; GRINDING ; MACHINES, DEVICES, OR PROCESSES FOR GRINDING OR POLISHING ; PERFORMING OPERATIONS ; POLISHING ; SEMICONDUCTOR DEVICES ; TRANSPORTING</subject><creationdate>2020</creationdate><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&amp;date=20201029&amp;DB=EPODOC&amp;CC=SG&amp;NR=11202009373PA$$EHTML$$P50$$Gepo$$Hfree_for_read</linktohtml><link.rule.ids>230,308,780,885,25562,76317</link.rule.ids><linktorsrc>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&amp;date=20201029&amp;DB=EPODOC&amp;CC=SG&amp;NR=11202009373PA$$EView_record_in_European_Patent_Office$$FView_record_in_$$GEuropean_Patent_Office$$Hfree_for_read</linktorsrc></links><search><creatorcontrib>SHINKAI Kenji</creatorcontrib><creatorcontrib>MAEDA Koji</creatorcontrib><creatorcontrib>YAMAGUCHI Kuniaki</creatorcontrib><creatorcontrib>TAMURA Masayuki</creatorcontrib><creatorcontrib>YOSHINARI Dai</creatorcontrib><creatorcontrib>EHARA Shun</creatorcontrib><creatorcontrib>ISOBE Soichi</creatorcontrib><creatorcontrib>HAIYANG Xu</creatorcontrib><creatorcontrib>ASANO Kentaro</creatorcontrib><creatorcontrib>SHIMOMOTO Hiroshi</creatorcontrib><creatorcontrib>ISOKAWA Hidetatsu</creatorcontrib><title>SUBSTRATE PROCESSING APPARATUS</title><description>A substrate processing apparatus includes a polishing section and a transport section. The polishing section has a first polishing unit, a second polishing unit, and a transport mechanism. The first polishing unit has a first polishing apparatus and a second polishing apparatus. The second polishing unit has a third polishing apparatus and a fourth polishing apparatus. Each of the first to fourth polishing apparatuses has a polishing table to which a polishing pad is mounted, a top ring, and auxiliary units that perform a process on the polishing pad during polishing. Around the polishing table, a pair of auxiliary unit mounting units for mounting the respective auxiliary units in a left-right switchable manner with respect to a straight line connecting a swing center of the top ring and a center of rotation of the polishing table is provided at respective positions symmetrical with respect to the straight line.</description><subject>BASIC ELECTRIC ELEMENTS</subject><subject>DRESSING OR CONDITIONING OF ABRADING SURFACES</subject><subject>ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR</subject><subject>ELECTRICITY</subject><subject>FEEDING OF GRINDING, POLISHING, OR LAPPING AGENTS</subject><subject>GRINDING</subject><subject>MACHINES, DEVICES, OR PROCESSES FOR GRINDING OR POLISHING</subject><subject>PERFORMING OPERATIONS</subject><subject>POLISHING</subject><subject>SEMICONDUCTOR DEVICES</subject><subject>TRANSPORTING</subject><fulltext>true</fulltext><rsrctype>patent</rsrctype><creationdate>2020</creationdate><recordtype>patent</recordtype><sourceid>EVB</sourceid><recordid>eNrjZJALDnUKDglyDHFVCAjyd3YNDvb0c1dwDAhwBIqFBvMwsKYl5hSn8kJpbgYVN9cQZw_d1IL8-NTigsTk1LzUkvhgd0NDIwMjAwNLY3PjAEdjIpUBAKKUIyA</recordid><startdate>20201029</startdate><enddate>20201029</enddate><creator>SHINKAI Kenji</creator><creator>MAEDA Koji</creator><creator>YAMAGUCHI Kuniaki</creator><creator>TAMURA Masayuki</creator><creator>YOSHINARI Dai</creator><creator>EHARA Shun</creator><creator>ISOBE Soichi</creator><creator>HAIYANG Xu</creator><creator>ASANO Kentaro</creator><creator>SHIMOMOTO Hiroshi</creator><creator>ISOKAWA Hidetatsu</creator><scope>EVB</scope></search><sort><creationdate>20201029</creationdate><title>SUBSTRATE PROCESSING APPARATUS</title><author>SHINKAI Kenji ; MAEDA Koji ; YAMAGUCHI Kuniaki ; TAMURA Masayuki ; YOSHINARI Dai ; EHARA Shun ; ISOBE Soichi ; HAIYANG Xu ; ASANO Kentaro ; SHIMOMOTO Hiroshi ; ISOKAWA Hidetatsu</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-epo_espacenet_SG11202009373PA3</frbrgroupid><rsrctype>patents</rsrctype><prefilter>patents</prefilter><language>eng</language><creationdate>2020</creationdate><topic>BASIC ELECTRIC ELEMENTS</topic><topic>DRESSING OR CONDITIONING OF ABRADING SURFACES</topic><topic>ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR</topic><topic>ELECTRICITY</topic><topic>FEEDING OF GRINDING, POLISHING, OR LAPPING AGENTS</topic><topic>GRINDING</topic><topic>MACHINES, DEVICES, OR PROCESSES FOR GRINDING OR POLISHING</topic><topic>PERFORMING OPERATIONS</topic><topic>POLISHING</topic><topic>SEMICONDUCTOR DEVICES</topic><topic>TRANSPORTING</topic><toplevel>online_resources</toplevel><creatorcontrib>SHINKAI Kenji</creatorcontrib><creatorcontrib>MAEDA Koji</creatorcontrib><creatorcontrib>YAMAGUCHI Kuniaki</creatorcontrib><creatorcontrib>TAMURA Masayuki</creatorcontrib><creatorcontrib>YOSHINARI Dai</creatorcontrib><creatorcontrib>EHARA Shun</creatorcontrib><creatorcontrib>ISOBE Soichi</creatorcontrib><creatorcontrib>HAIYANG Xu</creatorcontrib><creatorcontrib>ASANO Kentaro</creatorcontrib><creatorcontrib>SHIMOMOTO Hiroshi</creatorcontrib><creatorcontrib>ISOKAWA Hidetatsu</creatorcontrib><collection>esp@cenet</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>SHINKAI Kenji</au><au>MAEDA Koji</au><au>YAMAGUCHI Kuniaki</au><au>TAMURA Masayuki</au><au>YOSHINARI Dai</au><au>EHARA Shun</au><au>ISOBE Soichi</au><au>HAIYANG Xu</au><au>ASANO Kentaro</au><au>SHIMOMOTO Hiroshi</au><au>ISOKAWA Hidetatsu</au><format>patent</format><genre>patent</genre><ristype>GEN</ristype><title>SUBSTRATE PROCESSING APPARATUS</title><date>2020-10-29</date><risdate>2020</risdate><abstract>A substrate processing apparatus includes a polishing section and a transport section. The polishing section has a first polishing unit, a second polishing unit, and a transport mechanism. The first polishing unit has a first polishing apparatus and a second polishing apparatus. The second polishing unit has a third polishing apparatus and a fourth polishing apparatus. Each of the first to fourth polishing apparatuses has a polishing table to which a polishing pad is mounted, a top ring, and auxiliary units that perform a process on the polishing pad during polishing. Around the polishing table, a pair of auxiliary unit mounting units for mounting the respective auxiliary units in a left-right switchable manner with respect to a straight line connecting a swing center of the top ring and a center of rotation of the polishing table is provided at respective positions symmetrical with respect to the straight line.</abstract><oa>free_for_read</oa></addata></record>
fulltext fulltext_linktorsrc
identifier
ispartof
issn
language eng
recordid cdi_epo_espacenet_SG11202009373PA
source esp@cenet
subjects BASIC ELECTRIC ELEMENTS
DRESSING OR CONDITIONING OF ABRADING SURFACES
ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR
ELECTRICITY
FEEDING OF GRINDING, POLISHING, OR LAPPING AGENTS
GRINDING
MACHINES, DEVICES, OR PROCESSES FOR GRINDING OR POLISHING
PERFORMING OPERATIONS
POLISHING
SEMICONDUCTOR DEVICES
TRANSPORTING
title SUBSTRATE PROCESSING APPARATUS
url https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2025-01-09T20%3A02%3A01IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-epo_EVB&rft_val_fmt=info:ofi/fmt:kev:mtx:patent&rft.genre=patent&rft.au=SHINKAI%20Kenji&rft.date=2020-10-29&rft_id=info:doi/&rft_dat=%3Cepo_EVB%3ESG11202009373PA%3C/epo_EVB%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_id=info:pmid/&rfr_iscdi=true