EFFECTIVE AND NOVEL DESIGN FOR LOWER PARTICLE COUNT AND BETTER WAFER QUALITY BY DIFFUSING THE FLOW INSIDE THE CHAMBER

Embodiments described herein generally relate to a processing chamber having one or more gas inlet ports located at a bottom of the processing chamber. Gas flowing into the processing chamber via the one or more gas inlet ports is directed along a lower side wall of the processing chamber by a plate...

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Bibliographische Detailangaben
Hauptverfasser: TONG, Edric, VASUDEVA, Prashanth, PANDEY, Vishwas Kumar, SHAH, Kartik
Format: Patent
Sprache:eng
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