OPTICAL ACOUSTIC SUBSTRATE ASSESSMENT SYSTEM AND METHOD

OPTICAL ACOUSTIC SUBSTRATE ASSESSMENT SYSTEM AND METHOD

A system and method for identifying one or more characteristics of a structure formed into a substrate is herein disclosed. Surface and bulk acoustic waves are induced in the substrate and travel past a structure of interest where the acoustic waves are sensed. Information concerning one or more cha...

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Hauptverfasser: KOTELYANSKII, MICHAEL, MEHENDALE, MANJUSHA, MUKUNDHAN, PRIYA, MAIR, ROBIN, MURRAY, TODD
Format: Patent
Sprache:eng
Schlagworte:
BASIC ELECTRIC ELEMENTS
ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR
ELECTRICITY
SEMICONDUCTOR DEVICES
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creator KOTELYANSKII, MICHAEL
MEHENDALE, MANJUSHA
MUKUNDHAN, PRIYA
MAIR, ROBIN
MURRAY, TODD
description A system and method for identifying one or more characteristics of a structure formed into a substrate is herein disclosed. Surface and bulk acoustic waves are induced in the substrate and travel past a structure of interest where the acoustic waves are sensed. Information concerning one or more characteristics of the structure is encoded in the wave. The encoded information is assessed to determine the characteristic of interest.
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fullrecord <record><control><sourceid>epo_EVB</sourceid><recordid>TN_cdi_epo_espacenet_SG11201507587QA</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>SG11201507587QA</sourcerecordid><originalsourceid>FETCH-epo_espacenet_SG11201507587QA3</originalsourceid><addsrcrecordid>eNrjZDD3DwjxdHb0UXB09g8NBjIVgkOdgkOCHENcFRyDg12Dg31d_UIUgiODQ1x9FRz9XBR8XUM8_F14GFjTEnOKU3mhNDeDiptriLOHbmpBfnxqcUFicmpeakl8sLuhoZGBoamBuamFeaCjMZHKAFmAKgU</addsrcrecordid><sourcetype>Open Access Repository</sourcetype><iscdi>true</iscdi><recordtype>patent</recordtype></control><display><type>patent</type><title>OPTICAL ACOUSTIC SUBSTRATE ASSESSMENT SYSTEM AND METHOD</title><source>esp@cenet</source><creator>KOTELYANSKII, MICHAEL ; MEHENDALE, MANJUSHA ; MUKUNDHAN, PRIYA ; MAIR, ROBIN ; MURRAY, TODD</creator><creatorcontrib>KOTELYANSKII, MICHAEL ; MEHENDALE, MANJUSHA ; MUKUNDHAN, PRIYA ; MAIR, ROBIN ; MURRAY, TODD</creatorcontrib><description>A system and method for identifying one or more characteristics of a structure formed into a substrate is herein disclosed. Surface and bulk acoustic waves are induced in the substrate and travel past a structure of interest where the acoustic waves are sensed. Information concerning one or more characteristics of the structure is encoded in the wave. The encoded information is assessed to determine the characteristic of interest.</description><language>eng</language><subject>BASIC ELECTRIC ELEMENTS ; ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR ; ELECTRICITY ; SEMICONDUCTOR DEVICES</subject><creationdate>2015</creationdate><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&amp;date=20151029&amp;DB=EPODOC&amp;CC=SG&amp;NR=11201507587QA$$EHTML$$P50$$Gepo$$Hfree_for_read</linktohtml><link.rule.ids>230,308,780,885,25564,76547</link.rule.ids><linktorsrc>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&amp;date=20151029&amp;DB=EPODOC&amp;CC=SG&amp;NR=11201507587QA$$EView_record_in_European_Patent_Office$$FView_record_in_$$GEuropean_Patent_Office$$Hfree_for_read</linktorsrc></links><search><creatorcontrib>KOTELYANSKII, MICHAEL</creatorcontrib><creatorcontrib>MEHENDALE, MANJUSHA</creatorcontrib><creatorcontrib>MUKUNDHAN, PRIYA</creatorcontrib><creatorcontrib>MAIR, ROBIN</creatorcontrib><creatorcontrib>MURRAY, TODD</creatorcontrib><title>OPTICAL ACOUSTIC SUBSTRATE ASSESSMENT SYSTEM AND METHOD</title><description>A system and method for identifying one or more characteristics of a structure formed into a substrate is herein disclosed. Surface and bulk acoustic waves are induced in the substrate and travel past a structure of interest where the acoustic waves are sensed. Information concerning one or more characteristics of the structure is encoded in the wave. The encoded information is assessed to determine the characteristic of interest.</description><subject>BASIC ELECTRIC ELEMENTS</subject><subject>ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR</subject><subject>ELECTRICITY</subject><subject>SEMICONDUCTOR DEVICES</subject><fulltext>true</fulltext><rsrctype>patent</rsrctype><creationdate>2015</creationdate><recordtype>patent</recordtype><sourceid>EVB</sourceid><recordid>eNrjZDD3DwjxdHb0UXB09g8NBjIVgkOdgkOCHENcFRyDg12Dg31d_UIUgiODQ1x9FRz9XBR8XUM8_F14GFjTEnOKU3mhNDeDiptriLOHbmpBfnxqcUFicmpeakl8sLuhoZGBoamBuamFeaCjMZHKAFmAKgU</recordid><startdate>20151029</startdate><enddate>20151029</enddate><creator>KOTELYANSKII, MICHAEL</creator><creator>MEHENDALE, MANJUSHA</creator><creator>MUKUNDHAN, PRIYA</creator><creator>MAIR, ROBIN</creator><creator>MURRAY, TODD</creator><scope>EVB</scope></search><sort><creationdate>20151029</creationdate><title>OPTICAL ACOUSTIC SUBSTRATE ASSESSMENT SYSTEM AND METHOD</title><author>KOTELYANSKII, MICHAEL ; MEHENDALE, MANJUSHA ; MUKUNDHAN, PRIYA ; MAIR, ROBIN ; MURRAY, TODD</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-epo_espacenet_SG11201507587QA3</frbrgroupid><rsrctype>patents</rsrctype><prefilter>patents</prefilter><language>eng</language><creationdate>2015</creationdate><topic>BASIC ELECTRIC ELEMENTS</topic><topic>ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR</topic><topic>ELECTRICITY</topic><topic>SEMICONDUCTOR DEVICES</topic><toplevel>online_resources</toplevel><creatorcontrib>KOTELYANSKII, MICHAEL</creatorcontrib><creatorcontrib>MEHENDALE, MANJUSHA</creatorcontrib><creatorcontrib>MUKUNDHAN, PRIYA</creatorcontrib><creatorcontrib>MAIR, ROBIN</creatorcontrib><creatorcontrib>MURRAY, TODD</creatorcontrib><collection>esp@cenet</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>KOTELYANSKII, MICHAEL</au><au>MEHENDALE, MANJUSHA</au><au>MUKUNDHAN, PRIYA</au><au>MAIR, ROBIN</au><au>MURRAY, TODD</au><format>patent</format><genre>patent</genre><ristype>GEN</ristype><title>OPTICAL ACOUSTIC SUBSTRATE ASSESSMENT SYSTEM AND METHOD</title><date>2015-10-29</date><risdate>2015</risdate><abstract>A system and method for identifying one or more characteristics of a structure formed into a substrate is herein disclosed. Surface and bulk acoustic waves are induced in the substrate and travel past a structure of interest where the acoustic waves are sensed. Information concerning one or more characteristics of the structure is encoded in the wave. The encoded information is assessed to determine the characteristic of interest.</abstract><oa>free_for_read</oa></addata></record>
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subjects BASIC ELECTRIC ELEMENTS
ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR
ELECTRICITY
SEMICONDUCTOR DEVICES
title OPTICAL ACOUSTIC SUBSTRATE ASSESSMENT SYSTEM AND METHOD
url https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2025-01-03T22%3A45%3A23IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-epo_EVB&rft_val_fmt=info:ofi/fmt:kev:mtx:patent&rft.genre=patent&rft.au=KOTELYANSKII,%20MICHAEL&rft.date=2015-10-29&rft_id=info:doi/&rft_dat=%3Cepo_EVB%3ESG11201507587QA%3C/epo_EVB%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_id=info:pmid/&rfr_iscdi=true