METHOD OF MEASURING PARAMETERS OF BEAM AND DEVICE

FIELD: physics.SUBSTANCE: invention relates to communication and is intended for measurement of beam parameters. Method includes steps of measuring, using a terminal device, parameters of at least one beam in accordance with measurement configuration information, wherein measurement configuration in...

Ausführliche Beschreibung

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Bibliographische Detailangaben
Hauptverfasser: LIN, Yanan, YAN, Nin, SYUJ, Khua
Format: Patent
Sprache:eng ; rus
Schlagworte:
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