SCANNING PROBE OF ATOMIC-FORCE MICROSCOPE WITH SEPARABLE REMOTE-CONTROLLED NANOCOMPOSITE RADIATING ELEMENT BASED ON UPCONVERTING AND MAGNETIC NANOPARTICLES OF CORE-SHELL STRUCTURE

FIELD: measuring equipment.SUBSTANCE: invention relates to a measuring technique and can be used in atomic force microscopy for diagnosing nanoscale structures. Magnetically transparent cantilever is connected to electrically conductive magnetically transparent probing needle, which vertex is movabl...

Ausführliche Beschreibung

Bibliographische Detailangaben

Hauptverfasser:	Linkov Yurij Vladimirovich, Linkov Pavel Vladimirovich, Linkov Vladimir Anatolevich
Format:	Patent
Sprache:	eng ; rus
Schlagworte:	APPLICATIONS OF SCANNING-PROBE TECHNIQUES, e.g. SCANNING PROBEMICROSCOPY [SPM] MANUFACTURE OR TREATMENT OF NANOSTRUCTURES MEASUREMENT OR ANALYSIS OF NANOSTRUCTURES MEASURING NANOTECHNOLOGY PERFORMING OPERATIONS PHYSICS SCANNING-PROBE TECHNIQUES OR APPARATUS SPECIFIC USES OR APPLICATIONS OF NANOSTRUCTURES TESTING TRANSPORTING
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