METHOD OF EVALUATING RESISTANCE OF MICROELECTRONIC EQUIPMENT TO EXTERNAL ELECTROMAGNETIC ACTION

FIELD: test technology.SUBSTANCE: invention relates to testing of electronic equipment, in particular to investigation of resistance of articles of microelectronics (electronic equipment) to action of electromagnetic fields of high and ultrahigh frequency, and can be used in taking measures to count...

Ausführliche Beschreibung

Gespeichert in:

Bibliographische Detailangaben
Hauptverfasser:	Shibalko Konstantin Viktorovich, Semenov Aleksej Valentinovich, Serov Andrej Vasilevich, Zhdanov Viktor Stanislavovich
Format:	Patent
Sprache:	eng ; rus
Schlagworte:	MEASURING MEASURING ELECTRIC VARIABLES MEASURING MAGNETIC VARIABLES PHYSICS TESTING
Online-Zugang:	Volltext bestellen
Tags:	Tag hinzufügen Keine Tags, Fügen Sie den ersten Tag hinzu!

Schreiben Sie den ersten Kommentar!