METHOD FOR ESTIMATING LINE BIAS, LINE BIAS ESTIMATING DEVICE, PROGRAM AND RECORD MEDIUM

FIELD: technological processes.SUBSTANCE: method is proposed for estimating the line bias when estimating a line offset occurring in a stamping article during stamping during the formation of a characteristic line. This method involves obtaining a cross-section profile of a stamped article measured...

Ausführliche Beschreibung

Bibliographische Detailangaben

Hauptverfasser:	SAITO Masakhiro, JOSIDA Tokhru
Format:	Patent
Sprache:	eng ; rus
Schlagworte:	MEASURING MEASURING ANGLES MEASURING AREAS MEASURING IRREGULARITIES OF SURFACES OR CONTOURS MEASURING LENGTH, THICKNESS OR SIMILAR LINEARDIMENSIONS PHYSICS TESTING
Online-Zugang:	Volltext bestellen
Tags:	Tag hinzufügen Keine Tags, Fügen Sie den ersten Tag hinzu!