METHOD OF TESTING SYSTEM OF METALLOGRAPHIC ANALYSIS BASED ON SCANNING PROBE MICROSCOPE

FIELD: nanotechnology.SUBSTANCE: invention relates to nanotechnologies and methods of carrying out metallographic analysis of samples and determining the three-dimensional topography of their surface and the structure using the atomic-force microscopy with the resolving power in the nanometre range....

Ausführliche Beschreibung

Bibliographische Detailangaben

Hauptverfasser:	TSYGANOV ALEKSANDR BORISOVICH, SEN'KOVSKIJ BORIS VLADIMIROVICH, ADAMCHUK VERA KONSTANTINOVNA, UL'JANOV PAVEL GENNAD'EVICH, USACHEV DMITRIJ JUR'EVICH, BYKOV VIKTOR ALEKSANDROVICH
Format:	Patent
Sprache:	eng ; rus
Schlagworte:	INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES MEASURING PHYSICS TESTING
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