DEVICE TO REVEAL POTENTIALLY UNRELIABLE SOLID STATE INTEGRATED CIRCUITS BY ANALYSING SHAPES AND/OR PARAMETERS OF DYNAMIC CURRENT

FIELD: physics, semiconductors. ^ SUBSTANCE: invention relates to microelectronics and can be used in production of solid-state integrated circuitry (IC) as well as for analysis of IC failures. The proposed device incorporates a test oscillator, test oscillator control beard, IC power supply, IC interface card, analogue-digital converter (ADC) and computer. The test oscillator output is connected to one of the IC inputs. The other IC input is connected to the power supply. One of the IC outputs is connected to the current-voltage converter input. The other IC output is connected to the IC interface card input. The outputs of interface card and ADC are connected to appropriate computer inputs, the computer output being connected to the test oscillator input. ^ EFFECT: higher accuracy of diagnostics and expanded performances of IC. ^ 2 dwg