SCATTERING CROSS-SECTION METER FOR REFERENCE METAL SPHERES

SCATTERING CROSS-SECTION METER FOR REFERENCE METAL SPHERES

FIELD: physics, measurement. ^ SUBSTANCE: meter includes flexible calibrated measuring band with notches at given distance from reference point. To measure SCS, reference sphere is encircled with loop end of measuring band along the perimetre of its major circle. Extended loose band end shows SCS va...

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Hauptverfasser: GRIBKOV ALEKSEJ SERGEEVICH, NESTEROV SERGEJ MIKHAJLOVICH, TERPUGOV ALEKSANDR VASIL'EVICH, SKORODUMOV IVAN ALEKSEEVICH, KOVALEV SERGEJ VLADIMIROVICH, KOROL' OLEG VLADIMIROVICH
Format: Patent
Sprache:eng ; rus
Schlagworte:
MEASURING
MEASURING ELECTRIC VARIABLES
MEASURING MAGNETIC VARIABLES
PHYSICS
TESTING
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creator GRIBKOV ALEKSEJ SERGEEVICH
NESTEROV SERGEJ MIKHAJLOVICH
TERPUGOV ALEKSANDR VASIL'EVICH
SKORODUMOV IVAN ALEKSEEVICH
KOVALEV SERGEJ VLADIMIROVICH
KOROL' OLEG VLADIMIROVICH
description FIELD: physics, measurement. ^ SUBSTANCE: meter includes flexible calibrated measuring band with notches at given distance from reference point. To measure SCS, reference sphere is encircled with loop end of measuring band along the perimetre of its major circle. Extended loose band end shows SCS value for the sphere in square metres at the point of reference point overlapping with notch. ^ EFFECT: simplified measurement of scattering cross-section (SCS) of reference metal spheres. ^ 4 dwg
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subjects MEASURING
MEASURING ELECTRIC VARIABLES
MEASURING MAGNETIC VARIABLES
PHYSICS
TESTING
title SCATTERING CROSS-SECTION METER FOR REFERENCE METAL SPHERES
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