SCATTERING CROSS-SECTION METER FOR REFERENCE METAL SPHERES

FIELD: physics, measurement. ^ SUBSTANCE: meter includes flexible calibrated measuring band with notches at given distance from reference point. To measure SCS, reference sphere is encircled with loop end of measuring band along the perimetre of its major circle. Extended loose band end shows SCS va...

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Bibliographische Detailangaben
Hauptverfasser:	GRIBKOV ALEKSEJ SERGEEVICH, NESTEROV SERGEJ MIKHAJLOVICH, TERPUGOV ALEKSANDR VASIL'EVICH, SKORODUMOV IVAN ALEKSEEVICH, KOVALEV SERGEJ VLADIMIROVICH, KOROL' OLEG VLADIMIROVICH
Format:	Patent
Sprache:	eng ; rus
Schlagworte:	MEASURING MEASURING ELECTRIC VARIABLES MEASURING MAGNETIC VARIABLES PHYSICS TESTING
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Beschreibung
Zusammenfassung:	FIELD: physics, measurement. ^ SUBSTANCE: meter includes flexible calibrated measuring band with notches at given distance from reference point. To measure SCS, reference sphere is encircled with loop end of measuring band along the perimetre of its major circle. Extended loose band end shows SCS value for the sphere in square metres at the point of reference point overlapping with notch. ^ EFFECT: simplified measurement of scattering cross-section (SCS) of reference metal spheres. ^ 4 dwg