DEVICE FOR CONTROLLING SCANNING SPEED OF TUNNEL MICROSCOPE
FIELD: scanning tunnel spectroscopy, possible use in probing microscopes and devices based on these. ^ SUBSTANCE: device for controlling scanning speed of tunnel microscope, input of which is connected to system for stabilizing height of microscope barb, contains serially connected differentiator, e...
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| creator | SHELKOVNIKOV EVGENIJ JUR'EVICH GULJAEV PAVEL VALENTINOVICH LIPANOV ALEKSEJ MATVEEVICH PANICH ANATOLIJ EVGEN'EVICH GUDTSOV DENIS VJACHESLAVOVICH |
| description | FIELD: scanning tunnel spectroscopy, possible use in probing microscopes and devices based on these. ^ SUBSTANCE: device for controlling scanning speed of tunnel microscope, input of which is connected to system for stabilizing height of microscope barb, contains serially connected differentiator, extrapolator and module generator. Adjustment of extrapolation range value is performed by source, connected to extrapolator. Output of module generator is connected to differential amplifier, output of which receives set-point signal. Output of differential amplifier is connected to circuit of serially connected limiter, integrator and block for control over linefeed, in which outputs of integrator and block for controlling linefeed are outputs of row and frame scanning of microscope respectively. ^ EFFECT: improved precision of control over speed of scanning. ^ 2 dwg |
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Adjustment of extrapolation range value is performed by source, connected to extrapolator. Output of module generator is connected to differential amplifier, output of which receives set-point signal. Output of differential amplifier is connected to circuit of serially connected limiter, integrator and block for control over linefeed, in which outputs of integrator and block for controlling linefeed are outputs of row and frame scanning of microscope respectively. ^ EFFECT: improved precision of control over speed of scanning. ^ 2 dwg</description><language>eng ; rus</language><subject>APPLICATIONS OF SCANNING-PROBE TECHNIQUES, e.g. SCANNING PROBEMICROSCOPY [SPM] ; BASIC ELECTRIC ELEMENTS ; ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS ; ELECTRICITY ; MEASURING ; OPTICAL ELEMENTS, SYSTEMS, OR APPARATUS ; OPTICS ; PHYSICS ; SCANNING-PROBE TECHNIQUES OR APPARATUS ; TESTING</subject><creationdate>2006</creationdate><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20060210&DB=EPODOC&CC=RU&NR=2269803C1$$EHTML$$P50$$Gepo$$Hfree_for_read</linktohtml><link.rule.ids>230,308,776,881,25542,76290</link.rule.ids><linktorsrc>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20060210&DB=EPODOC&CC=RU&NR=2269803C1$$EView_record_in_European_Patent_Office$$FView_record_in_$$GEuropean_Patent_Office$$Hfree_for_read</linktorsrc></links><search><creatorcontrib>SHELKOVNIKOV EVGENIJ JUR'EVICH</creatorcontrib><creatorcontrib>GULJAEV PAVEL VALENTINOVICH</creatorcontrib><creatorcontrib>LIPANOV ALEKSEJ MATVEEVICH</creatorcontrib><creatorcontrib>PANICH ANATOLIJ EVGEN'EVICH</creatorcontrib><creatorcontrib>GUDTSOV DENIS VJACHESLAVOVICH</creatorcontrib><title>DEVICE FOR CONTROLLING SCANNING SPEED OF TUNNEL MICROSCOPE</title><description>FIELD: scanning tunnel spectroscopy, possible use in probing microscopes and devices based on these. ^ SUBSTANCE: device for controlling scanning speed of tunnel microscope, input of which is connected to system for stabilizing height of microscope barb, contains serially connected differentiator, extrapolator and module generator. 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Adjustment of extrapolation range value is performed by source, connected to extrapolator. Output of module generator is connected to differential amplifier, output of which receives set-point signal. Output of differential amplifier is connected to circuit of serially connected limiter, integrator and block for control over linefeed, in which outputs of integrator and block for controlling linefeed are outputs of row and frame scanning of microscope respectively. ^ EFFECT: improved precision of control over speed of scanning. ^ 2 dwg</abstract><oa>free_for_read</oa></addata></record> |
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| language | eng ; rus |
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| subjects | APPLICATIONS OF SCANNING-PROBE TECHNIQUES, e.g. SCANNING PROBEMICROSCOPY [SPM] BASIC ELECTRIC ELEMENTS ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS ELECTRICITY MEASURING OPTICAL ELEMENTS, SYSTEMS, OR APPARATUS OPTICS PHYSICS SCANNING-PROBE TECHNIQUES OR APPARATUS TESTING |
| title | DEVICE FOR CONTROLLING SCANNING SPEED OF TUNNEL MICROSCOPE |
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