DEVICE MODELING FRICTION PROCESS

DEVICE MODELING FRICTION PROCESS

FIELD: equipment studying mechanisms of friction. SUBSTANCE: invention is related to instruments for examination of mechanism of friction in nanotribocontacts by way of modeling process of interaction of needle of atomic-power microscope with monatomic-smooth surface of specimen under mode of measur...

Ausführliche Beschreibung

Gespeichert in:
Bibliographische Detailangaben
Hauptverfasser: KARAMURZOV B.S, NASIPOV A.ZH, DEDKOV G.V
Format: Patent
Sprache:eng ; rus
Schlagworte:
INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES
MEASURING
PHYSICS
TESTING
Online-Zugang:Volltext bestellen
Tags: Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
container_end_page
container_issue
container_start_page
container_title
container_volume
creator KARAMURZOV B.S
NASIPOV A.ZH
DEDKOV G.V
description FIELD: equipment studying mechanisms of friction. SUBSTANCE: invention is related to instruments for examination of mechanism of friction in nanotribocontacts by way of modeling process of interaction of needle of atomic-power microscope with monatomic-smooth surface of specimen under mode of measurement of lateral forces for visualization of effect of adhesion-sliding. Device modeling friction process in nanotribocontacts includes specimen simulating examined surface, probe on pendulum suspension simulating needle of atomic- power microscope and possessing adjustable center of gravity, mechanisms reading angle of inclination of probe and movement of specimen. Specimen comes in the form of plane-parallel plate with set of round holes made in nodes of two-dimensional periodic lattice where magnets of cylindrical shape imitating atoms of specimen and demonstrating vertical degree of freedom are located. Probe comes in the form disc with round holes in which same magnets are positioned. EFFECT: provision for study of mechanism of friction in nanotribocontacts. 1 dwg
format Patent
fullrecord <record><control><sourceid>epo_EVB</sourceid><recordid>TN_cdi_epo_espacenet_RU2212649C2</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>RU2212649C2</sourcerecordid><originalsourceid>FETCH-epo_espacenet_RU2212649C23</originalsourceid><addsrcrecordid>eNrjZFBwcQ3zdHZV8PV3cfXx9HNXcAvydA7x9PdTCAjyd3YNDuZhYE1LzClO5YXS3AwKbq4hzh66qQX58anFBYnJqXmpJfFBoUZGhkZmJpbORsZEKAEAtyMhqQ</addsrcrecordid><sourcetype>Open Access Repository</sourcetype><iscdi>true</iscdi><recordtype>patent</recordtype></control><display><type>patent</type><title>DEVICE MODELING FRICTION PROCESS</title><source>esp@cenet</source><creator>KARAMURZOV B.S ; NASIPOV A.ZH ; DEDKOV G.V</creator><creatorcontrib>KARAMURZOV B.S ; NASIPOV A.ZH ; DEDKOV G.V</creatorcontrib><description>FIELD: equipment studying mechanisms of friction. SUBSTANCE: invention is related to instruments for examination of mechanism of friction in nanotribocontacts by way of modeling process of interaction of needle of atomic-power microscope with monatomic-smooth surface of specimen under mode of measurement of lateral forces for visualization of effect of adhesion-sliding. Device modeling friction process in nanotribocontacts includes specimen simulating examined surface, probe on pendulum suspension simulating needle of atomic- power microscope and possessing adjustable center of gravity, mechanisms reading angle of inclination of probe and movement of specimen. Specimen comes in the form of plane-parallel plate with set of round holes made in nodes of two-dimensional periodic lattice where magnets of cylindrical shape imitating atoms of specimen and demonstrating vertical degree of freedom are located. Probe comes in the form disc with round holes in which same magnets are positioned. EFFECT: provision for study of mechanism of friction in nanotribocontacts. 1 dwg</description><edition>7</edition><language>eng ; rus</language><subject>INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES ; MEASURING ; PHYSICS ; TESTING</subject><creationdate>2003</creationdate><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&amp;date=20030920&amp;DB=EPODOC&amp;CC=RU&amp;NR=2212649C2$$EHTML$$P50$$Gepo$$Hfree_for_read</linktohtml><link.rule.ids>230,308,776,881,25542,76289</link.rule.ids><linktorsrc>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&amp;date=20030920&amp;DB=EPODOC&amp;CC=RU&amp;NR=2212649C2$$EView_record_in_European_Patent_Office$$FView_record_in_$$GEuropean_Patent_Office$$Hfree_for_read</linktorsrc></links><search><creatorcontrib>KARAMURZOV B.S</creatorcontrib><creatorcontrib>NASIPOV A.ZH</creatorcontrib><creatorcontrib>DEDKOV G.V</creatorcontrib><title>DEVICE MODELING FRICTION PROCESS</title><description>FIELD: equipment studying mechanisms of friction. SUBSTANCE: invention is related to instruments for examination of mechanism of friction in nanotribocontacts by way of modeling process of interaction of needle of atomic-power microscope with monatomic-smooth surface of specimen under mode of measurement of lateral forces for visualization of effect of adhesion-sliding. Device modeling friction process in nanotribocontacts includes specimen simulating examined surface, probe on pendulum suspension simulating needle of atomic- power microscope and possessing adjustable center of gravity, mechanisms reading angle of inclination of probe and movement of specimen. Specimen comes in the form of plane-parallel plate with set of round holes made in nodes of two-dimensional periodic lattice where magnets of cylindrical shape imitating atoms of specimen and demonstrating vertical degree of freedom are located. Probe comes in the form disc with round holes in which same magnets are positioned. EFFECT: provision for study of mechanism of friction in nanotribocontacts. 1 dwg</description><subject>INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES</subject><subject>MEASURING</subject><subject>PHYSICS</subject><subject>TESTING</subject><fulltext>true</fulltext><rsrctype>patent</rsrctype><creationdate>2003</creationdate><recordtype>patent</recordtype><sourceid>EVB</sourceid><recordid>eNrjZFBwcQ3zdHZV8PV3cfXx9HNXcAvydA7x9PdTCAjyd3YNDuZhYE1LzClO5YXS3AwKbq4hzh66qQX58anFBYnJqXmpJfFBoUZGhkZmJpbORsZEKAEAtyMhqQ</recordid><startdate>20030920</startdate><enddate>20030920</enddate><creator>KARAMURZOV B.S</creator><creator>NASIPOV A.ZH</creator><creator>DEDKOV G.V</creator><scope>EVB</scope></search><sort><creationdate>20030920</creationdate><title>DEVICE MODELING FRICTION PROCESS</title><author>KARAMURZOV B.S ; NASIPOV A.ZH ; DEDKOV G.V</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-epo_espacenet_RU2212649C23</frbrgroupid><rsrctype>patents</rsrctype><prefilter>patents</prefilter><language>eng ; rus</language><creationdate>2003</creationdate><topic>INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES</topic><topic>MEASURING</topic><topic>PHYSICS</topic><topic>TESTING</topic><toplevel>online_resources</toplevel><creatorcontrib>KARAMURZOV B.S</creatorcontrib><creatorcontrib>NASIPOV A.ZH</creatorcontrib><creatorcontrib>DEDKOV G.V</creatorcontrib><collection>esp@cenet</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>KARAMURZOV B.S</au><au>NASIPOV A.ZH</au><au>DEDKOV G.V</au><format>patent</format><genre>patent</genre><ristype>GEN</ristype><title>DEVICE MODELING FRICTION PROCESS</title><date>2003-09-20</date><risdate>2003</risdate><abstract>FIELD: equipment studying mechanisms of friction. SUBSTANCE: invention is related to instruments for examination of mechanism of friction in nanotribocontacts by way of modeling process of interaction of needle of atomic-power microscope with monatomic-smooth surface of specimen under mode of measurement of lateral forces for visualization of effect of adhesion-sliding. Device modeling friction process in nanotribocontacts includes specimen simulating examined surface, probe on pendulum suspension simulating needle of atomic- power microscope and possessing adjustable center of gravity, mechanisms reading angle of inclination of probe and movement of specimen. Specimen comes in the form of plane-parallel plate with set of round holes made in nodes of two-dimensional periodic lattice where magnets of cylindrical shape imitating atoms of specimen and demonstrating vertical degree of freedom are located. Probe comes in the form disc with round holes in which same magnets are positioned. EFFECT: provision for study of mechanism of friction in nanotribocontacts. 1 dwg</abstract><edition>7</edition><oa>free_for_read</oa></addata></record>
fulltext fulltext_linktorsrc
identifier
ispartof
issn
language eng ; rus
recordid cdi_epo_espacenet_RU2212649C2
source esp@cenet
subjects INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES
MEASURING
PHYSICS
TESTING
title DEVICE MODELING FRICTION PROCESS
url https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2025-02-11T09%3A12%3A32IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-epo_EVB&rft_val_fmt=info:ofi/fmt:kev:mtx:patent&rft.genre=patent&rft.au=KARAMURZOV%20B.S&rft.date=2003-09-20&rft_id=info:doi/&rft_dat=%3Cepo_EVB%3ERU2212649C2%3C/epo_EVB%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_id=info:pmid/&rfr_iscdi=true