THICKNESS GAUGE
FIELD: measurement technology. SUBSTANCE: proposed thickness gauge has base with frame housing measurement system, reading and centering devices. Measurement system is made of upper and lower measuring members mounted for movement along measurement axis. Upper and lower measurement members include u...
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| creator | KOPIJ N.V TREGUB V.P SKVORTSOV JU.S PONKRATOV A.N |
| description | FIELD: measurement technology. SUBSTANCE: proposed thickness gauge has base with frame housing measurement system, reading and centering devices. Measurement system is made of upper and lower measuring members mounted for movement along measurement axis. Upper and lower measurement members include upper and lower tail spindles correspondingly. Inductive converters with measurement rods are installed in tail spindles. First and second scales are located correspondingly on upper and lower tail spindles. Each tail spindle can be moved by means of sliding nuts kinematically coupled to electric motor drives. Upper tail spindle rests against sliding nut. Lower tail spindle is coupled to sliding nut with the use of flexible suspension. Reading device includes converters of linear translations installed in frame, is tied up with first and second scales and is connected to outputs of inductive converters and converters of linear translations of electron complex connected to electric motor drives via control unit. EFFECT: increased measurement accuracy and prevention of damage to lenses. 1 dwg |
| format | Patent |
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EFFECT: increased measurement accuracy and prevention of damage to lenses. 1 dwg</description><subject>MEASURING</subject><subject>MEASURING ANGLES</subject><subject>MEASURING AREAS</subject><subject>MEASURING IRREGULARITIES OF SURFACES OR CONTOURS</subject><subject>MEASURING LENGTH, THICKNESS OR SIMILAR LINEARDIMENSIONS</subject><subject>PHYSICS</subject><subject>TESTING</subject><fulltext>true</fulltext><rsrctype>patent</rsrctype><creationdate>1999</creationdate><recordtype>patent</recordtype><sourceid>EVB</sourceid><recordid>eNrjZOAP8fB09vZzDQ5WcHcMdXflYWBNS8wpTuWF0twMCm6uIc4euqkF-fGpxQWJyal5qSXxQaFGhibGBpYWzobGRCgBAK_PHPE</recordid><startdate>19991220</startdate><enddate>19991220</enddate><creator>KOPIJ N.V</creator><creator>TREGUB V.P</creator><creator>SKVORTSOV JU.S</creator><creator>PONKRATOV A.N</creator><scope>EVB</scope></search><sort><creationdate>19991220</creationdate><title>THICKNESS GAUGE</title><author>KOPIJ N.V ; TREGUB V.P ; SKVORTSOV JU.S ; PONKRATOV A.N</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-epo_espacenet_RU2143098C13</frbrgroupid><rsrctype>patents</rsrctype><prefilter>patents</prefilter><language>eng</language><creationdate>1999</creationdate><topic>MEASURING</topic><topic>MEASURING ANGLES</topic><topic>MEASURING AREAS</topic><topic>MEASURING IRREGULARITIES OF SURFACES OR CONTOURS</topic><topic>MEASURING LENGTH, THICKNESS OR SIMILAR LINEARDIMENSIONS</topic><topic>PHYSICS</topic><topic>TESTING</topic><toplevel>online_resources</toplevel><creatorcontrib>KOPIJ N.V</creatorcontrib><creatorcontrib>TREGUB V.P</creatorcontrib><creatorcontrib>SKVORTSOV JU.S</creatorcontrib><creatorcontrib>PONKRATOV A.N</creatorcontrib><collection>esp@cenet</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>KOPIJ N.V</au><au>TREGUB V.P</au><au>SKVORTSOV JU.S</au><au>PONKRATOV A.N</au><format>patent</format><genre>patent</genre><ristype>GEN</ristype><title>THICKNESS GAUGE</title><date>1999-12-20</date><risdate>1999</risdate><abstract>FIELD: measurement technology. SUBSTANCE: proposed thickness gauge has base with frame housing measurement system, reading and centering devices. Measurement system is made of upper and lower measuring members mounted for movement along measurement axis. Upper and lower measurement members include upper and lower tail spindles correspondingly. Inductive converters with measurement rods are installed in tail spindles. First and second scales are located correspondingly on upper and lower tail spindles. Each tail spindle can be moved by means of sliding nuts kinematically coupled to electric motor drives. Upper tail spindle rests against sliding nut. Lower tail spindle is coupled to sliding nut with the use of flexible suspension. Reading device includes converters of linear translations installed in frame, is tied up with first and second scales and is connected to outputs of inductive converters and converters of linear translations of electron complex connected to electric motor drives via control unit. EFFECT: increased measurement accuracy and prevention of damage to lenses. 1 dwg</abstract><edition>6</edition><oa>free_for_read</oa></addata></record> |
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| language | eng |
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| subjects | MEASURING MEASURING ANGLES MEASURING AREAS MEASURING IRREGULARITIES OF SURFACES OR CONTOURS MEASURING LENGTH, THICKNESS OR SIMILAR LINEARDIMENSIONS PHYSICS TESTING |
| title | THICKNESS GAUGE |
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