LUMINESCENT METHOD DETERMINING CONCENTRATION OF GLOW CENTERS IN OXYGEN-CARRYING MATERIALS

FIELD: spectral analysis. SUBSTANCE: proposed method includes excitation of luminescent impurities and inherent defects by electron beam which duration amounts to 0.1 radiation time of life of most short-lived glow center, registration of luminescence, exposure of characteristic bands in spectrum of...

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Bibliographische Detailangaben
Hauptverfasser:	BARYSHNIKOV V.I, KOLESNIKOVA T.A, SHCHEPINA L.I
Format:	Patent
Sprache:	eng
Schlagworte:	INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES MEASURING PHYSICS TESTING
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Beschreibung
Zusammenfassung:	FIELD: spectral analysis. SUBSTANCE: proposed method includes excitation of luminescent impurities and inherent defects by electron beam which duration amounts to 0.1 radiation time of life of most short-lived glow center, registration of luminescence, exposure of characteristic bands in spectrum of luminescence, identification of glow centers, measurement of intensities of standard and of characteristic bands, determination of concentration with usage of data on calibration samples. Fundamental wide-band glow of tested material which duration is less than radiation time of glow centers is chosen as internal standard of sensitivity. EFFECT: improved authenticity of method. 7 dwg , 1 tblp