PROCESS OF MANUFACTURE OF SEMICONDUCTOR DETECTOR OF IONIZING PARTICLES

Gespeichert in:
Bibliographische Detailangaben
Hauptverfasser: SUROVTSEV IGOR STEPANOVICH, TSIGANKOV VIKTOR YUREVICH, IVAKIN ANATOLIJ NIKOLAEVICH, EVSEEV IGOR IVANOVICH, ZAIKIN ALEKSANDR IVANOVICH
Format: Patent
Sprache:eng
Schlagworte:
Online-Zugang:Volltext bestellen
Tags: Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
container_end_page
container_issue
container_start_page
container_title
container_volume
creator SUROVTSEV IGOR STEPANOVICH
TSIGANKOV VIKTOR YUREVICH
IVAKIN ANATOLIJ NIKOLAEVICH
EVSEEV IGOR IVANOVICH
ZAIKIN ALEKSANDR IVANOVICH
description
format Patent
fullrecord <record><control><sourceid>epo_EVB</sourceid><recordid>TN_cdi_epo_espacenet_RU2035807C1</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>RU2035807C1</sourcerecordid><originalsourceid>FETCH-epo_espacenet_RU2035807C13</originalsourceid><addsrcrecordid>eNrjZHALCPJ3dg0OVvB3U_B19At1c3QOCQ1yBXGDXX09nf39XEKdQ_yDFFxcQ1zBDKCMp7-fZ5Snn7tCgGNQiKezj2swDwNrWmJOcSovlOZmUHBzDXH20E0tyI9PLS5ITE7NSy2JDwo1MjA2tTAwdzY0JkIJAHq7LE8</addsrcrecordid><sourcetype>Open Access Repository</sourcetype><iscdi>true</iscdi><recordtype>patent</recordtype></control><display><type>patent</type><title>PROCESS OF MANUFACTURE OF SEMICONDUCTOR DETECTOR OF IONIZING PARTICLES</title><source>esp@cenet</source><creator>SUROVTSEV IGOR STEPANOVICH ; TSIGANKOV VIKTOR YUREVICH ; IVAKIN ANATOLIJ NIKOLAEVICH ; EVSEEV IGOR IVANOVICH ; ZAIKIN ALEKSANDR IVANOVICH</creator><creatorcontrib>SUROVTSEV IGOR STEPANOVICH ; TSIGANKOV VIKTOR YUREVICH ; IVAKIN ANATOLIJ NIKOLAEVICH ; EVSEEV IGOR IVANOVICH ; ZAIKIN ALEKSANDR IVANOVICH</creatorcontrib><edition>6</edition><language>eng</language><subject>BASIC ELECTRIC ELEMENTS ; ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR ; ELECTRICITY ; MEASUREMENT OF NUCLEAR OR X-RADIATION ; MEASURING ; PHYSICS ; SEMICONDUCTOR DEVICES ; TESTING</subject><creationdate>1995</creationdate><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&amp;date=19950520&amp;DB=EPODOC&amp;CC=RU&amp;NR=2035807C1$$EHTML$$P50$$Gepo$$Hfree_for_read</linktohtml><link.rule.ids>230,308,780,885,25564,76547</link.rule.ids><linktorsrc>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&amp;date=19950520&amp;DB=EPODOC&amp;CC=RU&amp;NR=2035807C1$$EView_record_in_European_Patent_Office$$FView_record_in_$$GEuropean_Patent_Office$$Hfree_for_read</linktorsrc></links><search><creatorcontrib>SUROVTSEV IGOR STEPANOVICH</creatorcontrib><creatorcontrib>TSIGANKOV VIKTOR YUREVICH</creatorcontrib><creatorcontrib>IVAKIN ANATOLIJ NIKOLAEVICH</creatorcontrib><creatorcontrib>EVSEEV IGOR IVANOVICH</creatorcontrib><creatorcontrib>ZAIKIN ALEKSANDR IVANOVICH</creatorcontrib><title>PROCESS OF MANUFACTURE OF SEMICONDUCTOR DETECTOR OF IONIZING PARTICLES</title><subject>BASIC ELECTRIC ELEMENTS</subject><subject>ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR</subject><subject>ELECTRICITY</subject><subject>MEASUREMENT OF NUCLEAR OR X-RADIATION</subject><subject>MEASURING</subject><subject>PHYSICS</subject><subject>SEMICONDUCTOR DEVICES</subject><subject>TESTING</subject><fulltext>true</fulltext><rsrctype>patent</rsrctype><creationdate>1995</creationdate><recordtype>patent</recordtype><sourceid>EVB</sourceid><recordid>eNrjZHALCPJ3dg0OVvB3U_B19At1c3QOCQ1yBXGDXX09nf39XEKdQ_yDFFxcQ1zBDKCMp7-fZ5Snn7tCgGNQiKezj2swDwNrWmJOcSovlOZmUHBzDXH20E0tyI9PLS5ITE7NSy2JDwo1MjA2tTAwdzY0JkIJAHq7LE8</recordid><startdate>19950520</startdate><enddate>19950520</enddate><creator>SUROVTSEV IGOR STEPANOVICH</creator><creator>TSIGANKOV VIKTOR YUREVICH</creator><creator>IVAKIN ANATOLIJ NIKOLAEVICH</creator><creator>EVSEEV IGOR IVANOVICH</creator><creator>ZAIKIN ALEKSANDR IVANOVICH</creator><scope>EVB</scope></search><sort><creationdate>19950520</creationdate><title>PROCESS OF MANUFACTURE OF SEMICONDUCTOR DETECTOR OF IONIZING PARTICLES</title><author>SUROVTSEV IGOR STEPANOVICH ; TSIGANKOV VIKTOR YUREVICH ; IVAKIN ANATOLIJ NIKOLAEVICH ; EVSEEV IGOR IVANOVICH ; ZAIKIN ALEKSANDR IVANOVICH</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-epo_espacenet_RU2035807C13</frbrgroupid><rsrctype>patents</rsrctype><prefilter>patents</prefilter><language>eng</language><creationdate>1995</creationdate><topic>BASIC ELECTRIC ELEMENTS</topic><topic>ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR</topic><topic>ELECTRICITY</topic><topic>MEASUREMENT OF NUCLEAR OR X-RADIATION</topic><topic>MEASURING</topic><topic>PHYSICS</topic><topic>SEMICONDUCTOR DEVICES</topic><topic>TESTING</topic><toplevel>online_resources</toplevel><creatorcontrib>SUROVTSEV IGOR STEPANOVICH</creatorcontrib><creatorcontrib>TSIGANKOV VIKTOR YUREVICH</creatorcontrib><creatorcontrib>IVAKIN ANATOLIJ NIKOLAEVICH</creatorcontrib><creatorcontrib>EVSEEV IGOR IVANOVICH</creatorcontrib><creatorcontrib>ZAIKIN ALEKSANDR IVANOVICH</creatorcontrib><collection>esp@cenet</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>SUROVTSEV IGOR STEPANOVICH</au><au>TSIGANKOV VIKTOR YUREVICH</au><au>IVAKIN ANATOLIJ NIKOLAEVICH</au><au>EVSEEV IGOR IVANOVICH</au><au>ZAIKIN ALEKSANDR IVANOVICH</au><format>patent</format><genre>patent</genre><ristype>GEN</ristype><title>PROCESS OF MANUFACTURE OF SEMICONDUCTOR DETECTOR OF IONIZING PARTICLES</title><date>1995-05-20</date><risdate>1995</risdate><edition>6</edition><oa>free_for_read</oa></addata></record>
fulltext fulltext_linktorsrc
identifier
ispartof
issn
language eng
recordid cdi_epo_espacenet_RU2035807C1
source esp@cenet
subjects BASIC ELECTRIC ELEMENTS
ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR
ELECTRICITY
MEASUREMENT OF NUCLEAR OR X-RADIATION
MEASURING
PHYSICS
SEMICONDUCTOR DEVICES
TESTING
title PROCESS OF MANUFACTURE OF SEMICONDUCTOR DETECTOR OF IONIZING PARTICLES
url https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2024-12-23T00%3A23%3A57IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-epo_EVB&rft_val_fmt=info:ofi/fmt:kev:mtx:patent&rft.genre=patent&rft.au=SUROVTSEV%20IGOR%20STEPANOVICH&rft.date=1995-05-20&rft_id=info:doi/&rft_dat=%3Cepo_EVB%3ERU2035807C1%3C/epo_EVB%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_id=info:pmid/&rfr_iscdi=true