INTERFERENCE REFRACTOMETER

INTERFERENCE REFRACTOMETER

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Hauptverfasser: MISHCHENKO YURIJ V, RINKEVICHYUS BRONYUS S
Format: Patent
Sprache:eng
Schlagworte:
INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES
MEASURING
PHYSICS
TESTING
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creator MISHCHENKO YURIJ V
RINKEVICHYUS BRONYUS S
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fullrecord <record><control><sourceid>epo_EVB</sourceid><recordid>TN_cdi_epo_espacenet_RU2008653C1</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>RU2008653C1</sourcerecordid><originalsourceid>FETCH-epo_espacenet_RU2008653C13</originalsourceid><addsrcrecordid>eNrjZJDy9AtxDXJzDXL1c3ZVCHJ1C3J0DvH3dQUK8jCwpiXmFKfyQmluBgU31xBnD93Ugvz41OKCxOTUvNSS-KBQIwMDCzNTY2dDYyKUAAAL4yAu</addsrcrecordid><sourcetype>Open Access Repository</sourcetype><iscdi>true</iscdi><recordtype>patent</recordtype></control><display><type>patent</type><title>INTERFERENCE REFRACTOMETER</title><source>esp@cenet</source><creator>MISHCHENKO YURIJ V ; RINKEVICHYUS BRONYUS S</creator><creatorcontrib>MISHCHENKO YURIJ V ; RINKEVICHYUS BRONYUS S</creatorcontrib><edition>5</edition><language>eng</language><subject>INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES ; MEASURING ; PHYSICS ; TESTING</subject><creationdate>1994</creationdate><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&amp;date=19940228&amp;DB=EPODOC&amp;CC=RU&amp;NR=2008653C1$$EHTML$$P50$$Gepo$$Hfree_for_read</linktohtml><link.rule.ids>230,308,780,885,25564,76547</link.rule.ids><linktorsrc>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&amp;date=19940228&amp;DB=EPODOC&amp;CC=RU&amp;NR=2008653C1$$EView_record_in_European_Patent_Office$$FView_record_in_$$GEuropean_Patent_Office$$Hfree_for_read</linktorsrc></links><search><creatorcontrib>MISHCHENKO YURIJ V</creatorcontrib><creatorcontrib>RINKEVICHYUS BRONYUS S</creatorcontrib><title>INTERFERENCE REFRACTOMETER</title><subject>INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES</subject><subject>MEASURING</subject><subject>PHYSICS</subject><subject>TESTING</subject><fulltext>true</fulltext><rsrctype>patent</rsrctype><creationdate>1994</creationdate><recordtype>patent</recordtype><sourceid>EVB</sourceid><recordid>eNrjZJDy9AtxDXJzDXL1c3ZVCHJ1C3J0DvH3dQUK8jCwpiXmFKfyQmluBgU31xBnD93Ugvz41OKCxOTUvNSS-KBQIwMDCzNTY2dDYyKUAAAL4yAu</recordid><startdate>19940228</startdate><enddate>19940228</enddate><creator>MISHCHENKO YURIJ V</creator><creator>RINKEVICHYUS BRONYUS S</creator><scope>EVB</scope></search><sort><creationdate>19940228</creationdate><title>INTERFERENCE REFRACTOMETER</title><author>MISHCHENKO YURIJ V ; RINKEVICHYUS BRONYUS S</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-epo_espacenet_RU2008653C13</frbrgroupid><rsrctype>patents</rsrctype><prefilter>patents</prefilter><language>eng</language><creationdate>1994</creationdate><topic>INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES</topic><topic>MEASURING</topic><topic>PHYSICS</topic><topic>TESTING</topic><toplevel>online_resources</toplevel><creatorcontrib>MISHCHENKO YURIJ V</creatorcontrib><creatorcontrib>RINKEVICHYUS BRONYUS S</creatorcontrib><collection>esp@cenet</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>MISHCHENKO YURIJ V</au><au>RINKEVICHYUS BRONYUS S</au><format>patent</format><genre>patent</genre><ristype>GEN</ristype><title>INTERFERENCE REFRACTOMETER</title><date>1994-02-28</date><risdate>1994</risdate><edition>5</edition><oa>free_for_read</oa></addata></record>
fulltext fulltext_linktorsrc
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language eng
recordid cdi_epo_espacenet_RU2008653C1
source esp@cenet
subjects INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES
MEASURING
PHYSICS
TESTING
title INTERFERENCE REFRACTOMETER
url https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2024-12-29T18%3A49%3A56IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-epo_EVB&rft_val_fmt=info:ofi/fmt:kev:mtx:patent&rft.genre=patent&rft.au=MISHCHENKO%20YURIJ%20V&rft.date=1994-02-28&rft_id=info:doi/&rft_dat=%3Cepo_EVB%3ERU2008653C1%3C/epo_EVB%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_id=info:pmid/&rfr_iscdi=true