SCANNER FOR FLAW DETECTOR FOR INSPECTION OF EXTENDED ARTICLES

SCANNER FOR FLAW DETECTOR FOR INSPECTION OF EXTENDED ARTICLES

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Hauptverfasser: VINOGREEV MIKHAIL YU, BABIKOV ANATOLIJ D, VINOGREEVA LYUDMILA A, GALPERIN YULIJ M
Format: Patent
Sprache:eng
Schlagworte:
INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES
MEASURING
PHYSICS
TESTING
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creator VINOGREEV MIKHAIL YU
BABIKOV ANATOLIJ D
VINOGREEVA LYUDMILA A
GALPERIN YULIJ M
description
format Patent
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language eng
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subjects INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES
MEASURING
PHYSICS
TESTING
title SCANNER FOR FLAW DETECTOR FOR INSPECTION OF EXTENDED ARTICLES
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