MECHATRONIC EQUIPMENT FOR CALIBRATION OF NANOTECHNOLOGICAL PRODUCTS
The invention relates to an equipment intended for the flow control of nanotechnological products. According to the invention, the equipment consists of a rotary feeding system (1) on which there are placed eight support tables (2) where, in order to be handled under optimal conditions, a nanodevice...
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| creator | ERBAN GHEORGHE BOGA IOAN POPAN GHEORGHE LUNG IOAN BUDU GICA |
| description | The invention relates to an equipment intended for the flow control of nanotechnological products. According to the invention, the equipment consists of a rotary feeding system (1) on which there are placed eight support tables (2) where, in order to be handled under optimal conditions, a nanodevice to be measured is placed, during the calibration process, on a support accurately positioned on a support table (2), the nanodevice being transferred from the rotary feeding system (1) to a precision displacement system (4) by means of a manipulator (3), the precision displacement system (4) conveying the nanodevice to be measured to an optically measuring system (5), to a laser measuring system (6) or in front of a measuring system (7) with an atomic force microscope, where, in case of measuring with the measuring system (7) with atomic force microscope, the feeding is performed by a feeding robot (8).
Invenţia se referă la un echipament destinat controlului pe flux al unor produse nanotehnologice. Echipamentul conform invenţiei este alcătuit dintr-un sistem (1) de alimentare rotativ, pe care sunt dispuse opt măsuţe (2) suport, în timpul procesului de calibrare, un nanodispozitiv de măsurat fiind aşezat, în vederea manipulării în condiţii optime, pe un suport care este poziţionat precis pe câte o măsuţă (2) suport, transferul nanodispozitivului, de la sistemul (1) de alimentare rotativ la un sistem (4) de deplasare de precizie, fiind realizat cu ajutorul unui manipulator (3), sistemul (4) de deplasare de precizie transportă nanodispozitivul de măsurat la un sistem (5) de măsurare optică, la un sistem (6) de măsurare cu laser sau în dreptul unui sistem (7) de măsurare cu microscop de forţă atomică, alimentarea în vederea măsurării cu sistemul (7) de măsurare cu microscop de forţă atomică fiind realizată cu un robot (8) de alimentare. |
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Invenţia se referă la un echipament destinat controlului pe flux al unor produse nanotehnologice. Echipamentul conform invenţiei este alcătuit dintr-un sistem (1) de alimentare rotativ, pe care sunt dispuse opt măsuţe (2) suport, în timpul procesului de calibrare, un nanodispozitiv de măsurat fiind aşezat, în vederea manipulării în condiţii optime, pe un suport care este poziţionat precis pe câte o măsuţă (2) suport, transferul nanodispozitivului, de la sistemul (1) de alimentare rotativ la un sistem (4) de deplasare de precizie, fiind realizat cu ajutorul unui manipulator (3), sistemul (4) de deplasare de precizie transportă nanodispozitivul de măsurat la un sistem (5) de măsurare optică, la un sistem (6) de măsurare cu laser sau în dreptul unui sistem (7) de măsurare cu microscop de forţă atomică, alimentarea în vederea măsurării cu sistemul (7) de măsurare cu microscop de forţă atomică fiind realizată cu un robot (8) de alimentare.</description><language>eng ; rum</language><subject>MEASURING ; MEASURING ANGLES ; MEASURING AREAS ; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS ; MEASURING LENGTH, THICKNESS OR SIMILAR LINEARDIMENSIONS ; PHYSICS ; TESTING</subject><creationdate>2012</creationdate><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20120629&DB=EPODOC&CC=RO&NR=127553A2$$EHTML$$P50$$Gepo$$Hfree_for_read</linktohtml><link.rule.ids>230,308,780,885,25564,76547</link.rule.ids><linktorsrc>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20120629&DB=EPODOC&CC=RO&NR=127553A2$$EView_record_in_European_Patent_Office$$FView_record_in_$$GEuropean_Patent_Office$$Hfree_for_read</linktorsrc></links><search><creatorcontrib>ERBAN GHEORGHE</creatorcontrib><creatorcontrib>BOGA IOAN</creatorcontrib><creatorcontrib>POPAN GHEORGHE</creatorcontrib><creatorcontrib>LUNG IOAN</creatorcontrib><creatorcontrib>BUDU GICA</creatorcontrib><title>MECHATRONIC EQUIPMENT FOR CALIBRATION OF NANOTECHNOLOGICAL PRODUCTS</title><description>The invention relates to an equipment intended for the flow control of nanotechnological products. According to the invention, the equipment consists of a rotary feeding system (1) on which there are placed eight support tables (2) where, in order to be handled under optimal conditions, a nanodevice to be measured is placed, during the calibration process, on a support accurately positioned on a support table (2), the nanodevice being transferred from the rotary feeding system (1) to a precision displacement system (4) by means of a manipulator (3), the precision displacement system (4) conveying the nanodevice to be measured to an optically measuring system (5), to a laser measuring system (6) or in front of a measuring system (7) with an atomic force microscope, where, in case of measuring with the measuring system (7) with atomic force microscope, the feeding is performed by a feeding robot (8).
Invenţia se referă la un echipament destinat controlului pe flux al unor produse nanotehnologice. Echipamentul conform invenţiei este alcătuit dintr-un sistem (1) de alimentare rotativ, pe care sunt dispuse opt măsuţe (2) suport, în timpul procesului de calibrare, un nanodispozitiv de măsurat fiind aşezat, în vederea manipulării în condiţii optime, pe un suport care este poziţionat precis pe câte o măsuţă (2) suport, transferul nanodispozitivului, de la sistemul (1) de alimentare rotativ la un sistem (4) de deplasare de precizie, fiind realizat cu ajutorul unui manipulator (3), sistemul (4) de deplasare de precizie transportă nanodispozitivul de măsurat la un sistem (5) de măsurare optică, la un sistem (6) de măsurare cu laser sau în dreptul unui sistem (7) de măsurare cu microscop de forţă atomică, alimentarea în vederea măsurării cu sistemul (7) de măsurare cu microscop de forţă atomică fiind realizată cu un robot (8) de alimentare.</description><subject>MEASURING</subject><subject>MEASURING ANGLES</subject><subject>MEASURING AREAS</subject><subject>MEASURING IRREGULARITIES OF SURFACES OR CONTOURS</subject><subject>MEASURING LENGTH, THICKNESS OR SIMILAR LINEARDIMENSIONS</subject><subject>PHYSICS</subject><subject>TESTING</subject><fulltext>true</fulltext><rsrctype>patent</rsrctype><creationdate>2012</creationdate><recordtype>patent</recordtype><sourceid>EVB</sourceid><recordid>eNrjZHD2dXX2cAwJ8vfzdFZwDQz1DPB19QtRcPMPUnB29PF0CnIM8fT3U_B3U_Bz9PMPASr28_fxd_cESioEBPm7hDqHBPMwsKYl5hSn8kJpbgZ5N9cQZw_d1IL8-NTigsTk1LzUkvggf0Mjc1NTY0cjY8IqAK1MKx0</recordid><startdate>20120629</startdate><enddate>20120629</enddate><creator>ERBAN GHEORGHE</creator><creator>BOGA IOAN</creator><creator>POPAN GHEORGHE</creator><creator>LUNG IOAN</creator><creator>BUDU GICA</creator><scope>EVB</scope></search><sort><creationdate>20120629</creationdate><title>MECHATRONIC EQUIPMENT FOR CALIBRATION OF NANOTECHNOLOGICAL PRODUCTS</title><author>ERBAN GHEORGHE ; BOGA IOAN ; POPAN GHEORGHE ; LUNG IOAN ; BUDU GICA</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-epo_espacenet_RO127553A23</frbrgroupid><rsrctype>patents</rsrctype><prefilter>patents</prefilter><language>eng ; rum</language><creationdate>2012</creationdate><topic>MEASURING</topic><topic>MEASURING ANGLES</topic><topic>MEASURING AREAS</topic><topic>MEASURING IRREGULARITIES OF SURFACES OR CONTOURS</topic><topic>MEASURING LENGTH, THICKNESS OR SIMILAR LINEARDIMENSIONS</topic><topic>PHYSICS</topic><topic>TESTING</topic><toplevel>online_resources</toplevel><creatorcontrib>ERBAN GHEORGHE</creatorcontrib><creatorcontrib>BOGA IOAN</creatorcontrib><creatorcontrib>POPAN GHEORGHE</creatorcontrib><creatorcontrib>LUNG IOAN</creatorcontrib><creatorcontrib>BUDU GICA</creatorcontrib><collection>esp@cenet</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>ERBAN GHEORGHE</au><au>BOGA IOAN</au><au>POPAN GHEORGHE</au><au>LUNG IOAN</au><au>BUDU GICA</au><format>patent</format><genre>patent</genre><ristype>GEN</ristype><title>MECHATRONIC EQUIPMENT FOR CALIBRATION OF NANOTECHNOLOGICAL PRODUCTS</title><date>2012-06-29</date><risdate>2012</risdate><abstract>The invention relates to an equipment intended for the flow control of nanotechnological products. According to the invention, the equipment consists of a rotary feeding system (1) on which there are placed eight support tables (2) where, in order to be handled under optimal conditions, a nanodevice to be measured is placed, during the calibration process, on a support accurately positioned on a support table (2), the nanodevice being transferred from the rotary feeding system (1) to a precision displacement system (4) by means of a manipulator (3), the precision displacement system (4) conveying the nanodevice to be measured to an optically measuring system (5), to a laser measuring system (6) or in front of a measuring system (7) with an atomic force microscope, where, in case of measuring with the measuring system (7) with atomic force microscope, the feeding is performed by a feeding robot (8).
Invenţia se referă la un echipament destinat controlului pe flux al unor produse nanotehnologice. Echipamentul conform invenţiei este alcătuit dintr-un sistem (1) de alimentare rotativ, pe care sunt dispuse opt măsuţe (2) suport, în timpul procesului de calibrare, un nanodispozitiv de măsurat fiind aşezat, în vederea manipulării în condiţii optime, pe un suport care este poziţionat precis pe câte o măsuţă (2) suport, transferul nanodispozitivului, de la sistemul (1) de alimentare rotativ la un sistem (4) de deplasare de precizie, fiind realizat cu ajutorul unui manipulator (3), sistemul (4) de deplasare de precizie transportă nanodispozitivul de măsurat la un sistem (5) de măsurare optică, la un sistem (6) de măsurare cu laser sau în dreptul unui sistem (7) de măsurare cu microscop de forţă atomică, alimentarea în vederea măsurării cu sistemul (7) de măsurare cu microscop de forţă atomică fiind realizată cu un robot (8) de alimentare.</abstract><oa>free_for_read</oa></addata></record> |
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| subjects | MEASURING MEASURING ANGLES MEASURING AREAS MEASURING IRREGULARITIES OF SURFACES OR CONTOURS MEASURING LENGTH, THICKNESS OR SIMILAR LINEARDIMENSIONS PHYSICS TESTING |
| title | MECHATRONIC EQUIPMENT FOR CALIBRATION OF NANOTECHNOLOGICAL PRODUCTS |
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