QUANTITATIVE DIAGNOSTIC METHOD FOR QUALITY OF MANUFACTURING EQUIPMENT
The present invention relates to a method for quantifying and diagnosing the quality of manufacturing equipment, that is, to a quantitative diagnostic method for the quality of manufacturing equipment. It is possible to quantify the quality of manufacturing equipment having a plurality of production...
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| creator | SUL, DONG HEE KIM, HYUN TAE LIM, SEUNG HYUN SUNG, KI EUN |
| description | The present invention relates to a method for quantifying and diagnosing the quality of manufacturing equipment, that is, to a quantitative diagnostic method for the quality of manufacturing equipment. It is possible to quantify the quality of manufacturing equipment having a plurality of production elements and diagnose same in a single attempt. |
| format | Patent |
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| subjects | BASIC ELECTRIC ELEMENTS CALCULATING COMPUTING COUNTING DATA PROCESSING SYSTEMS OR METHODS, SPECIALLY ADAPTED FORADMINISTRATIVE, COMMERCIAL, FINANCIAL, MANAGERIAL, SUPERVISORYOR FORECASTING PURPOSES ELECTRIC DIGITAL DATA PROCESSING ELECTRICITY INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES MEASUREMENT OF MECHANICAL VIBRATIONS OR ULTRASONIC, SONIC ORINFRASONIC WAVES MEASURING PHYSICS PROCESSES OR MEANS, e.g. BATTERIES, FOR THE DIRECT CONVERSIONOF CHEMICAL INTO ELECTRICAL ENERGY SYSTEMS OR METHODS SPECIALLY ADAPTED FOR ADMINISTRATIVE,COMMERCIAL, FINANCIAL, MANAGERIAL, SUPERVISORY OR FORECASTINGPURPOSES, NOT OTHERWISE PROVIDED FOR TESTING |
| title | QUANTITATIVE DIAGNOSTIC METHOD FOR QUALITY OF MANUFACTURING EQUIPMENT |
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