Method of obtaining a copper platform for the measurements of surface-strengthened Raman effect and the copper platform for the measurements of surface-strengthened Raman effect

Method of obtaining a copper platform for the measurements of surface-strengthened Raman effect and the copper platform for the measurements of surface-strengthened Raman effect

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Hauptverfasser: KOWALSKA ANETA ANIELA, ADAMKIEWICZ WITOLD, MICHOTA-KAMIŃSKA AGNIESZKA, TKACZ MAREK
Format: Patent
Sprache:eng ; pol
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INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES
MANUFACTURE OR TREATMENT OF NANOSTRUCTURES
MEASUREMENT OR ANALYSIS OF NANOSTRUCTURES
MEASURING
NANOTECHNOLOGY
PERFORMING OPERATIONS
PHYSICS
SPECIFIC USES OR APPLICATIONS OF NANOSTRUCTURES
TESTING
TRANSPORTING
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creator KOWALSKA ANETA ANIELA
ADAMKIEWICZ WITOLD
MICHOTA-KAMIŃSKA AGNIESZKA
TKACZ MAREK
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subjects INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES
MANUFACTURE OR TREATMENT OF NANOSTRUCTURES
MEASUREMENT OR ANALYSIS OF NANOSTRUCTURES
MEASURING
NANOTECHNOLOGY
PERFORMING OPERATIONS
PHYSICS
SPECIFIC USES OR APPLICATIONS OF NANOSTRUCTURES
TESTING
TRANSPORTING
title Method of obtaining a copper platform for the measurements of surface-strengthened Raman effect and the copper platform for the measurements of surface-strengthened Raman effect
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