Method of obtaining a copper platform for the measurements of surface-strengthened Raman effect and the copper platform for the measurements of surface-strengthened Raman effect

Bibliographische Detailangaben

Hauptverfasser:	KOWALSKA ANETA ANIELA, ADAMKIEWICZ WITOLD, MICHOTA-KAMIŃSKA AGNIESZKA, TKACZ MAREK
Format:	Patent
Sprache:	eng ; pol
Schlagworte:	INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES MANUFACTURE OR TREATMENT OF NANOSTRUCTURES MEASUREMENT OR ANALYSIS OF NANOSTRUCTURES MEASURING NANOTECHNOLOGY PERFORMING OPERATIONS PHYSICS SPECIFIC USES OR APPLICATIONS OF NANOSTRUCTURES TESTING TRANSPORTING
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