CONDITION ANALYING DEVICE, DISPLAY METHOD, AND PROGRAM
A state analyzing device (10) is provided with: an electric current acquiring unit (11) which acquires an electric current signal flowing to a target device (30); a parameter calculating unit (12) which, on the basis of the electric current signal and with a timing related to a fixed cycle, calculat...
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| creator | SONODA Takashi KUMANO Shintaro MORISHITA Yasushi |
| description | A state analyzing device (10) is provided with: an electric current acquiring unit (11) which acquires an electric current signal flowing to a target device (30); a parameter calculating unit (12) which, on the basis of the electric current signal and with a timing related to a fixed cycle, calculates the values of a plurality of parameters which are mutually correlated and vary in accordance with a state of the target device; and a display information generating unit (17) which generates display information in which a dividing line representing a pre-determined threshold serving as a reference for determining the state of the target device, a first shape representing the values of the plurality of parameters relating to one timing, and a second shape representing an amount of change in the values of the plurality of parameters calculated at a different timing are arranged in a coordinate space in which each of the plurality of parameters serves as an axis. |
| format | Patent |
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a parameter calculating unit (12) which, on the basis of the electric current signal and with a timing related to a fixed cycle, calculates the values of a plurality of parameters which are mutually correlated and vary in accordance with a state of the target device; and a display information generating unit (17) which generates display information in which a dividing line representing a pre-determined threshold serving as a reference for determining the state of the target device, a first shape representing the values of the plurality of parameters relating to one timing, and a second shape representing an amount of change in the values of the plurality of parameters calculated at a different timing are arranged in a coordinate space in which each of the plurality of parameters serves as an axis.</description><language>eng</language><subject>CONTROL OR REGULATING SYSTEMS IN GENERAL ; CONTROLLING ; FUNCTIONAL ELEMENTS OF SUCH SYSTEMS ; MEASURING ; MEASURING ELECTRIC VARIABLES ; MEASURING MAGNETIC VARIABLES ; 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KUMANO Shintaro ; MORISHITA Yasushi</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-epo_espacenet_PH12019501815A13</frbrgroupid><rsrctype>patents</rsrctype><prefilter>patents</prefilter><language>eng</language><creationdate>2020</creationdate><topic>CONTROL OR REGULATING SYSTEMS IN GENERAL</topic><topic>CONTROLLING</topic><topic>FUNCTIONAL ELEMENTS OF SUCH SYSTEMS</topic><topic>MEASURING</topic><topic>MEASURING ELECTRIC VARIABLES</topic><topic>MEASURING MAGNETIC VARIABLES</topic><topic>MONITORING OR TESTING ARRANGEMENTS FOR SUCH SYSTEMS ORELEMENTS</topic><topic>PHYSICS</topic><topic>REGULATING</topic><topic>TESTING</topic><topic>TESTING STATIC OR DYNAMIC BALANCE OF MACHINES ORSTRUCTURES</topic><topic>TESTING STRUCTURES OR APPARATUS NOT OTHERWISE PROVIDED FOR</topic><toplevel>online_resources</toplevel><creatorcontrib>SONODA Takashi</creatorcontrib><creatorcontrib>KUMANO Shintaro</creatorcontrib><creatorcontrib>MORISHITA Yasushi</creatorcontrib><collection>esp@cenet</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>SONODA Takashi</au><au>KUMANO Shintaro</au><au>MORISHITA Yasushi</au><format>patent</format><genre>patent</genre><ristype>GEN</ristype><title>CONDITION ANALYING DEVICE, DISPLAY METHOD, AND PROGRAM</title><date>2020-09-14</date><risdate>2020</risdate><abstract>A state analyzing device (10) is provided with: an electric current acquiring unit (11) which acquires an electric current signal flowing to a target device (30); a parameter calculating unit (12) which, on the basis of the electric current signal and with a timing related to a fixed cycle, calculates the values of a plurality of parameters which are mutually correlated and vary in accordance with a state of the target device; and a display information generating unit (17) which generates display information in which a dividing line representing a pre-determined threshold serving as a reference for determining the state of the target device, a first shape representing the values of the plurality of parameters relating to one timing, and a second shape representing an amount of change in the values of the plurality of parameters calculated at a different timing are arranged in a coordinate space in which each of the plurality of parameters serves as an axis.</abstract><oa>free_for_read</oa></addata></record> |
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| subjects | CONTROL OR REGULATING SYSTEMS IN GENERAL CONTROLLING FUNCTIONAL ELEMENTS OF SUCH SYSTEMS MEASURING MEASURING ELECTRIC VARIABLES MEASURING MAGNETIC VARIABLES MONITORING OR TESTING ARRANGEMENTS FOR SUCH SYSTEMS ORELEMENTS PHYSICS REGULATING TESTING TESTING STATIC OR DYNAMIC BALANCE OF MACHINES ORSTRUCTURES TESTING STRUCTURES OR APPARATUS NOT OTHERWISE PROVIDED FOR |
| title | CONDITION ANALYING DEVICE, DISPLAY METHOD, AND PROGRAM |
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