Silicon with structured oxygen doping, its production and use

Silicon and a process for producing silicon having a total oxygen content of 8x1017 atoms/cm3 to 1x1019 atoms/cm3 and a dislocation density of 1x105 cm-2 to 5x107 cm-2. The silicon has at least 25% of the oxygen contained in the form of silicon/oxygen precipitations that are concentrated in the area...

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Bibliographische Detailangaben
Hauptverfasser: THURM, SIEGFRIED, BREITENSTEIN, OTWIN, HOFS, HANS-ULRICH, HABLER, CHRISTIAN, KOCH, WOLFGANG
Format: Patent
Sprache:eng
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Zusammenfassung:Silicon and a process for producing silicon having a total oxygen content of 8x1017 atoms/cm3 to 1x1019 atoms/cm3 and a dislocation density of 1x105 cm-2 to 5x107 cm-2. The silicon has at least 25% of the oxygen contained in the form of silicon/oxygen precipitations that are concentrated in the area of the grain boundaries and dislocations. The process involves molten silicon being in contact with silicon monoxide and/or silicon dioxide therefore becoming saturated with oxygen, and/or the molten silicon is treated with an oxygen-containing gas before or during the crystallization. The dislocation density is set by means of the cooling rate of the silicon. The silicon finds use in film-casting or film drawing processes and in photovoltaics.