ADAPTIVE ERROR CORRECTION TO IMPROVE FOR SYSTEM MEMORY RELIABILITY, AVAILABILITY, AND SERVICEABILITY (RAS)

memory subsystem includes memory devices with space dynamically allocated for improvement of reliability, availability, and serviceability (RAS) in the system. Error checking and correction (ECC) logic detects an error in all or a portion of a memory device. In response to error detection, the syste...

Ausführliche Beschreibung

Bibliographische Detailangaben

Hauptverfasser:	HSING-MIN CHEN, KULJIT BAINS, SREENIVAS MANDAVA, JING LING, WEI P. CHEN, THEODROS YIGZAW, VAIBHAV SINGH, DEEP K. BUCH, ANDREW M. RUDOFF, RAJAT AGARWAL, JOHN G. HOLM, KJERSTEN E. CRISS, WEI WU
Format:	Patent
Sprache:	eng
Schlagworte:	CALCULATING COMPUTING COUNTING ELECTRIC DIGITAL DATA PROCESSING INFORMATION STORAGE PHYSICS STATIC STORES
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