METHOD FOR DIAGNOSING AND REPAIRING PATCHY OUTLIERS IN SENSOR MEASUREMENT DATA

The present disclosure provides a method for diagnosing and repairing patchy outliers in sensor measurement data, which belongs to the field of sensor measurement data processing and application, and is suitable for data analysis and processing in different fields such as petrochemical engineering a...

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Bibliographische Detailangaben
Hauptverfasser:	CAIXIA ZHANG, HE SONG, GAOWEI LEI, NAIQUAN SU, QINGHUA ZHANG, LONGQIU SHAO, SHIHUA WANG, CHENGLIN WEN, SHAOLIN HU
Format:	Patent
Sprache:	eng
Schlagworte:	ARRANGEMENTS FOR MEASURING TWO OR MORE VARIABLES NOT COVEREDIN A SINGLE OTHER SUBCLASS CALCULATING COMPUTING COUNTING ELECTRIC DIGITAL DATA PROCESSING MEASURING MEASURING NOT SPECIALLY ADAPTED FOR A SPECIFIC VARIABLE MEASURING OR TESTING NOT OTHERWISE PROVIDED FOR PHYSICS TARIFF METERING APPARATUS TESTING
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Beschreibung
Zusammenfassung:	The present disclosure provides a method for diagnosing and repairing patchy outliers in sensor measurement data, which belongs to the field of sensor measurement data processing and application, and is suitable for data analysis and processing in different fields such as petrochemical engineering and spacecraft telemetry. The patchy outliers diagnosis and repairing technology proposed in the present disclosure can repair a single outlier and successively appearing outliers by performing 50%-deletion fitting on a sampling data sequence, calculating a fitting residual variance, creating a safe pipeline radius, and repairing abnormal data not within the safe pipeline. The present disclosure is engineering practicable, and can conveniently complete diagnosis and repairing of patchy outliers in various different types of measurement data sequences