APPARATUS FOR TESTING SEMICONDUCTOR DEVICES
An apparatus for testing a semiconductor device (30), comprising a closable chamber (20) formed by a plurality of walls (22, 22?, 22??, 22???), at least one motherboard (12), at least one adapter (10), at least one door to allow access to the adapter (10), and a layer of insulate material (24) dispo...
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| creator | Amran bin Kassim Reuben J. Chang Ali Akbar Abdul Aziz Satyanarayan S. Iyer |
| description | An apparatus for testing a semiconductor device (30), comprising a closable chamber (20) formed by a plurality of walls (22, 22?, 22??, 22???), at least one motherboard (12), at least one adapter (10), at least one door to allow access to the adapter (10), and a layer of insulate material (24) disposed between the motherboard (12) and a wall (22, 22?, 22??, 22???) of the chamber (20). The adapter (10) allows signals from the semiconductor device (30) to be transposed to correspond with signal lines on the motherboard (12). (Figure 2) |
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Iyer</creatorcontrib><collection>esp@cenet</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>Amran bin Kassim</au><au>Reuben J. Chang</au><au>Ali Akbar Abdul Aziz</au><au>Satyanarayan S. Iyer</au><format>patent</format><genre>patent</genre><ristype>GEN</ristype><title>APPARATUS FOR TESTING SEMICONDUCTOR DEVICES</title><date>2023-04-20</date><risdate>2023</risdate><abstract>An apparatus for testing a semiconductor device (30), comprising a closable chamber (20) formed by a plurality of walls (22, 22?, 22??, 22???), at least one motherboard (12), at least one adapter (10), at least one door to allow access to the adapter (10), and a layer of insulate material (24) disposed between the motherboard (12) and a wall (22, 22?, 22??, 22???) of the chamber (20). The adapter (10) allows signals from the semiconductor device (30) to be transposed to correspond with signal lines on the motherboard (12). (Figure 2)</abstract><oa>free_for_read</oa></addata></record> |
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| subjects | BASIC ELECTRIC ELEMENTS ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR ELECTRICITY MEASURING MEASURING ELECTRIC VARIABLES MEASURING MAGNETIC VARIABLES PHYSICS SEMICONDUCTOR DEVICES TESTING |
| title | APPARATUS FOR TESTING SEMICONDUCTOR DEVICES |
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