APPARATUS FOR TESTING SEMICONDUCTOR DEVICES

An apparatus for testing a semiconductor device (30), comprising a closable chamber (20) formed by a plurality of walls (22, 22?, 22??, 22???), at least one motherboard (12), at least one adapter (10), at least one door to allow access to the adapter (10), and a layer of insulate material (24) dispo...

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Bibliographische Detailangaben
Hauptverfasser:	Amran bin Kassim, Reuben J. Chang, Ali Akbar Abdul Aziz, Satyanarayan S. Iyer
Format:	Patent
Sprache:	eng
Schlagworte:	BASIC ELECTRIC ELEMENTS ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR ELECTRICITY MEASURING MEASURING ELECTRIC VARIABLES MEASURING MAGNETIC VARIABLES PHYSICS SEMICONDUCTOR DEVICES TESTING
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Beschreibung
Zusammenfassung:	An apparatus for testing a semiconductor device (30), comprising a closable chamber (20) formed by a plurality of walls (22, 22?, 22??, 22???), at least one motherboard (12), at least one adapter (10), at least one door to allow access to the adapter (10), and a layer of insulate material (24) disposed between the motherboard (12) and a wall (22, 22?, 22??, 22???) of the chamber (20). The adapter (10) allows signals from the semiconductor device (30) to be transposed to correspond with signal lines on the motherboard (12). (Figure 2)