DEVICE FOR TESTING ELECTRONIC COMPONENTS
The invention proceeds from a device for testing electronic components, comprising at least one test base (13) for contacting the electronic components (17) and comprising a test head, which is coupled electrically to the test base (13). In accordance with the invention, in order to forward signals...
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| creator | GSCHWENDTBERGER, GERHARD STANISZEWSKI, GERALD PETERMANN, MANUEL |
| description | The invention proceeds from a device for testing electronic components, comprising at least one test base (13) for contacting the electronic components (17) and comprising a test head, which is coupled electrically to the test base (13). In accordance with the invention, in order to forward signals between the? test base (13) and test head, an adapter board (1) is provided, which, on its side facing the test base (13), has contact areas (2) which are adapted to the position of contacts of the test base (13), and, on its side facing away from the test base (13), is provided with contact sockets (4) which are adapted to the position of contact pins (10) of the test head or an intermediate board (6), the contact areas (2) each being electrically conductively connected to corresponding contact sockets (4). ( Figure 2 ) |
| format | Patent |
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In accordance with the invention, in order to forward signals between the? test base (13) and test head, an adapter board (1) is provided, which, on its side facing the test base (13), has contact areas (2) which are adapted to the position of contacts of the test base (13), and, on its side facing away from the test base (13), is provided with contact sockets (4) which are adapted to the position of contact pins (10) of the test head or an intermediate board (6), the contact areas (2) each being electrically conductively connected to corresponding contact sockets (4). 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In accordance with the invention, in order to forward signals between the? test base (13) and test head, an adapter board (1) is provided, which, on its side facing the test base (13), has contact areas (2) which are adapted to the position of contacts of the test base (13), and, on its side facing away from the test base (13), is provided with contact sockets (4) which are adapted to the position of contact pins (10) of the test head or an intermediate board (6), the contact areas (2) each being electrically conductively connected to corresponding contact sockets (4). ( Figure 2 )</description><fulltext>true</fulltext><rsrctype>patent</rsrctype><creationdate>2021</creationdate><recordtype>patent</recordtype><sourceid>EVB</sourceid><recordid>eNrjZNBwcQ3zdHZVcPMPUghxDQ7x9HNXcPVxdQ4J8vfzdFZw9vcN8Pdz9QsJ5mFgTUvMKU7lhdLcDHJuriHOHrqpBfnxqcUFicmpeakl8b6RhhYmpqZmjsYEFQAASCMjMA</recordid><startdate>20210402</startdate><enddate>20210402</enddate><creator>GSCHWENDTBERGER, GERHARD</creator><creator>STANISZEWSKI, GERALD</creator><creator>PETERMANN, MANUEL</creator><scope>EVB</scope></search><sort><creationdate>20210402</creationdate><title>DEVICE FOR TESTING ELECTRONIC COMPONENTS</title><author>GSCHWENDTBERGER, GERHARD ; STANISZEWSKI, GERALD ; PETERMANN, MANUEL</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-epo_espacenet_MY184556A3</frbrgroupid><rsrctype>patents</rsrctype><prefilter>patents</prefilter><language>eng</language><creationdate>2021</creationdate><toplevel>online_resources</toplevel><creatorcontrib>GSCHWENDTBERGER, GERHARD</creatorcontrib><creatorcontrib>STANISZEWSKI, GERALD</creatorcontrib><creatorcontrib>PETERMANN, MANUEL</creatorcontrib><collection>esp@cenet</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>GSCHWENDTBERGER, GERHARD</au><au>STANISZEWSKI, GERALD</au><au>PETERMANN, MANUEL</au><format>patent</format><genre>patent</genre><ristype>GEN</ristype><title>DEVICE FOR TESTING ELECTRONIC COMPONENTS</title><date>2021-04-02</date><risdate>2021</risdate><abstract>The invention proceeds from a device for testing electronic components, comprising at least one test base (13) for contacting the electronic components (17) and comprising a test head, which is coupled electrically to the test base (13). In accordance with the invention, in order to forward signals between the? test base (13) and test head, an adapter board (1) is provided, which, on its side facing the test base (13), has contact areas (2) which are adapted to the position of contacts of the test base (13), and, on its side facing away from the test base (13), is provided with contact sockets (4) which are adapted to the position of contact pins (10) of the test head or an intermediate board (6), the contact areas (2) each being electrically conductively connected to corresponding contact sockets (4). ( Figure 2 )</abstract><oa>free_for_read</oa></addata></record> |
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| title | DEVICE FOR TESTING ELECTRONIC COMPONENTS |
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