DYNAMIC REDUNDANCY FOR RANDOM ACCESS MEMORY ASSEMBLIES

REDUCED SPECIFICATION DRAMS ARE USED IN MEMORY ASSEMBLIES IN SUCH A WAY AS TO MAXIMIZE THE USE OF THE GOOD CELLS IN THE REDUCED SPECIFICATION DRAM CHIPS. AN EXTERNAL MEMORY ARRAY IS MAPPED TO REPLACE DEFECTIVE MEMORY LOCATIONS ON A REAL TIME BASIS. THE MAJOR COMPONENTS ARE (1) A NON-VOLATILE STORAGE...

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Bibliographische Detailangaben

Hauptverfasser:	MARK WILLIAM KELLOGG, TIMOTHY JAY DELL
Format:	Patent
Sprache:	eng
Schlagworte:	INFORMATION STORAGE MEASURING MEASURING ELECTRIC VARIABLES MEASURING MAGNETIC VARIABLES PHYSICS STATIC STORES TESTING
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