APPARATUS AND METHOD FOR MEASURING SKIN CHARACTERISTIC

Provided is a method and an apparatus thereof for measuring a skin characteristic. The apparatus comprises a processor configured to receive, over a time period T, a first response indicating intensities of light of a first wavelength λ 1 reflected from skin, and a second response indicating intens...

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Bibliographische Detailangaben
Hauptverfasser: VAN KEMPEN Eric Gerard Marie, THUMMA Kiran Kumar, WARMERDAM Thomas Petrus Hendricus, VAN ABEELEN Frank Anton, BOAMFA Marius Iosif, MAZARAKIS Giorgos, VERHAGEN Rieko, BALTAZAR DOS SANTOS Nuno Filipe
Format: Patent
Sprache:eng ; spa
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