SEMICONDUCTOR INTEGRATED CIRCUIT DEVICE EMPLOYING MOSFETS

A semiconductor integrated circuit device which enables the relaxation of deterioration in reliability due to the hot electron effect and a further promotion of high integration density is disclosed. For this purpose, a MOSFET having a drain region consisting of a low concentration impurity diffused...

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Bibliographische Detailangaben
1. Verfasser: KOSHIMARU, SHIGERU
Format: Patent
Sprache:eng ; kor
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