THERMAL DEFORMATION MEASURING SYSTEM OF CERANICS AND THE LIKE

THERMAL DEFORMATION MEASURING SYSTEM OF CERANICS AND THE LIKE

A thermal deformation measuring system of ceramics and the like comprises at least one illuminator (9) for projecting a light beam to the edge portions of a specimen (2), and at least one deformation measuring camera (15) equipped with a telescopic lens (14) and an infrared ray removing filter (13)...

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Hauptverfasser: KYODEN HIROSI, ENDO YASUHIRO, NISIKAWA KIHACHIRO, MIRULA TOSISADA, FUJIWARA DEIICHI, NISIZAWA SYOICHI
Format: Patent
Sprache:eng
Schlagworte:
INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES
MEASURING
MEASURING ANGLES
MEASURING AREAS
MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
MEASURING LENGTH, THICKNESS OR SIMILAR LINEARDIMENSIONS
PHYSICS
TESTING
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creator KYODEN HIROSI
ENDO YASUHIRO
NISIKAWA KIHACHIRO
MIRULA TOSISADA
FUJIWARA DEIICHI
NISIZAWA SYOICHI
description A thermal deformation measuring system of ceramics and the like comprises at least one illuminator (9) for projecting a light beam to the edge portions of a specimen (2), and at least one deformation measuring camera (15) equipped with a telescopic lens (14) and an infrared ray removing filter (13) and data processing means (16).
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subjects INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES
MEASURING
MEASURING ANGLES
MEASURING AREAS
MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
MEASURING LENGTH, THICKNESS OR SIMILAR LINEARDIMENSIONS
PHYSICS
TESTING
title THERMAL DEFORMATION MEASURING SYSTEM OF CERANICS AND THE LIKE
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