프로파일 검출 방법 및 프로파일 검출 장치
프로파일 검출 방법은, 검출 공정과, 출력 공정을 가진다. 검출 공정은, 특정 형상을 포함하는 학습용 화상과 당해 학습용 화상에 포함되는 특정 형상에 관한 정보를 학습한 모델을 이용하여, 특정 형상을 포함하는 검출 대상 화상으로부터 당해 검출 대상 화상에 포함되는 특정 형상을 검출한다. 출력 공정은, 검출된 특정 형상의 형상 정보를 출력한다. The profile detecting method includes: detecting a specific shape included in a detection target image from...
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| creator | KITAO TOSHIHIRO KAZUI MASATO OHNO TOSHIHIRO SHINAGAWA JUN IGARASHI MAKOTO |
| description | 프로파일 검출 방법은, 검출 공정과, 출력 공정을 가진다. 검출 공정은, 특정 형상을 포함하는 학습용 화상과 당해 학습용 화상에 포함되는 특정 형상에 관한 정보를 학습한 모델을 이용하여, 특정 형상을 포함하는 검출 대상 화상으로부터 당해 검출 대상 화상에 포함되는 특정 형상을 검출한다. 출력 공정은, 검출된 특정 형상의 형상 정보를 출력한다.
The profile detecting method includes: detecting a specific shape included in a detection target image from the detection target image including the specific shape using a model that has learned a learning image including the specific shape and information regarding the specific shape included in the learning image; and outputting shape information of the detected specific shape. |
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The profile detecting method includes: detecting a specific shape included in a detection target image from the detection target image including the specific shape using a model that has learned a learning image including the specific shape and information regarding the specific shape included in the learning image; and outputting shape information of the detected specific shape.</description><language>kor</language><subject>CALCULATING ; COMPUTER SYSTEMS BASED ON SPECIFIC COMPUTATIONAL MODELS ; COMPUTING ; COUNTING ; INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES ; MEASURING ; MEASURING ANGLES ; MEASURING AREAS ; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS ; MEASURING LENGTH, THICKNESS OR SIMILAR LINEARDIMENSIONS ; PHYSICS ; TESTING</subject><creationdate>2024</creationdate><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20241025&DB=EPODOC&CC=KR&NR=20240154557A$$EHTML$$P50$$Gepo$$Hfree_for_read</linktohtml><link.rule.ids>230,308,780,885,25564,76547</link.rule.ids><linktorsrc>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20241025&DB=EPODOC&CC=KR&NR=20240154557A$$EView_record_in_European_Patent_Office$$FView_record_in_$$GEuropean_Patent_Office$$Hfree_for_read</linktorsrc></links><search><creatorcontrib>KITAO TOSHIHIRO</creatorcontrib><creatorcontrib>KAZUI MASATO</creatorcontrib><creatorcontrib>OHNO TOSHIHIRO</creatorcontrib><creatorcontrib>SHINAGAWA JUN</creatorcontrib><creatorcontrib>IGARASHI MAKOTO</creatorcontrib><title>프로파일 검출 방법 및 프로파일 검출 장치</title><description>프로파일 검출 방법은, 검출 공정과, 출력 공정을 가진다. 검출 공정은, 특정 형상을 포함하는 학습용 화상과 당해 학습용 화상에 포함되는 특정 형상에 관한 정보를 학습한 모델을 이용하여, 특정 형상을 포함하는 검출 대상 화상으로부터 당해 검출 대상 화상에 포함되는 특정 형상을 검출한다. 출력 공정은, 검출된 특정 형상의 형상 정보를 출력한다.
The profile detecting method includes: detecting a specific shape included in a detection target image from the detection target image including the specific shape using a model that has learned a learning image including the specific shape and information regarding the specific shape included in the learning image; and outputting shape information of the detected specific shape.</description><subject>CALCULATING</subject><subject>COMPUTER SYSTEMS BASED ON SPECIFIC COMPUTATIONAL MODELS</subject><subject>COMPUTING</subject><subject>COUNTING</subject><subject>INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES</subject><subject>MEASURING</subject><subject>MEASURING ANGLES</subject><subject>MEASURING AREAS</subject><subject>MEASURING IRREGULARITIES OF SURFACES OR CONTOURS</subject><subject>MEASURING LENGTH, THICKNESS OR SIMILAR LINEARDIMENSIONS</subject><subject>PHYSICS</subject><subject>TESTING</subject><fulltext>true</fulltext><rsrctype>patent</rsrctype><creationdate>2024</creationdate><recordtype>patent</recordtype><sourceid>EVB</sourceid><recordid>eNrjZLB8O6Xl9cI5b3t63szdo_BqU8ObbXMUXm9Y-XrTVCDVr4BN-s28pW92zuBhYE1LzClO5YXS3AzKbq4hzh66qQX58anFBYnJqXmpJfHeQUYGRiYGhqYmpqbmjsbEqQIAhG8_cA</recordid><startdate>20241025</startdate><enddate>20241025</enddate><creator>KITAO TOSHIHIRO</creator><creator>KAZUI MASATO</creator><creator>OHNO TOSHIHIRO</creator><creator>SHINAGAWA JUN</creator><creator>IGARASHI MAKOTO</creator><scope>EVB</scope></search><sort><creationdate>20241025</creationdate><title>프로파일 검출 방법 및 프로파일 검출 장치</title><author>KITAO TOSHIHIRO ; KAZUI MASATO ; OHNO TOSHIHIRO ; SHINAGAWA JUN ; IGARASHI MAKOTO</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-epo_espacenet_KR20240154557A3</frbrgroupid><rsrctype>patents</rsrctype><prefilter>patents</prefilter><language>kor</language><creationdate>2024</creationdate><topic>CALCULATING</topic><topic>COMPUTER SYSTEMS BASED ON SPECIFIC COMPUTATIONAL MODELS</topic><topic>COMPUTING</topic><topic>COUNTING</topic><topic>INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES</topic><topic>MEASURING</topic><topic>MEASURING ANGLES</topic><topic>MEASURING AREAS</topic><topic>MEASURING IRREGULARITIES OF SURFACES OR CONTOURS</topic><topic>MEASURING LENGTH, THICKNESS OR SIMILAR LINEARDIMENSIONS</topic><topic>PHYSICS</topic><topic>TESTING</topic><toplevel>online_resources</toplevel><creatorcontrib>KITAO TOSHIHIRO</creatorcontrib><creatorcontrib>KAZUI MASATO</creatorcontrib><creatorcontrib>OHNO TOSHIHIRO</creatorcontrib><creatorcontrib>SHINAGAWA JUN</creatorcontrib><creatorcontrib>IGARASHI MAKOTO</creatorcontrib><collection>esp@cenet</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>KITAO TOSHIHIRO</au><au>KAZUI MASATO</au><au>OHNO TOSHIHIRO</au><au>SHINAGAWA JUN</au><au>IGARASHI MAKOTO</au><format>patent</format><genre>patent</genre><ristype>GEN</ristype><title>프로파일 검출 방법 및 프로파일 검출 장치</title><date>2024-10-25</date><risdate>2024</risdate><abstract>프로파일 검출 방법은, 검출 공정과, 출력 공정을 가진다. 검출 공정은, 특정 형상을 포함하는 학습용 화상과 당해 학습용 화상에 포함되는 특정 형상에 관한 정보를 학습한 모델을 이용하여, 특정 형상을 포함하는 검출 대상 화상으로부터 당해 검출 대상 화상에 포함되는 특정 형상을 검출한다. 출력 공정은, 검출된 특정 형상의 형상 정보를 출력한다.
The profile detecting method includes: detecting a specific shape included in a detection target image from the detection target image including the specific shape using a model that has learned a learning image including the specific shape and information regarding the specific shape included in the learning image; and outputting shape information of the detected specific shape.</abstract><oa>free_for_read</oa></addata></record> |
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| subjects | CALCULATING COMPUTER SYSTEMS BASED ON SPECIFIC COMPUTATIONAL MODELS COMPUTING COUNTING INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES MEASURING MEASURING ANGLES MEASURING AREAS MEASURING IRREGULARITIES OF SURFACES OR CONTOURS MEASURING LENGTH, THICKNESS OR SIMILAR LINEARDIMENSIONS PHYSICS TESTING |
| title | 프로파일 검출 방법 및 프로파일 검출 장치 |
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