APPARATUS FOR ANALYZING GAS

본 발명은 가스 분석 장치에 관한 것으로, 자동화된 시스템으로 전지에서 발생하는 가스를 발화 상태에 발생하는 것과 누출에 인해 발생하는 것으로 분류하여 포집 및 분석 가능한 가스 분석 장치를 제공하기 위한 것이다.

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Hauptverfasser:	KWANGYEON PARK, KYUNG MIN KIM, DONGGUK HWANG, NAK HEE CHOI
Format:	Patent
Sprache:	eng ; kor
Schlagworte:	ARRANGEMENTS FOR MEASURING TWO OR MORE VARIABLES NOT COVEREDIN A SINGLE OTHER SUBCLASS INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES MEASURING MEASURING NOT SPECIALLY ADAPTED FOR A SPECIFIC VARIABLE MEASURING OR TESTING NOT OTHERWISE PROVIDED FOR PHYSICS TARIFF METERING APPARATUS TESTING
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creator	KWANGYEON PARK KYUNG MIN KIM DONGGUK HWANG NAK HEE CHOI
description	본 발명은 가스 분석 장치에 관한 것으로, 자동화된 시스템으로 전지에서 발생하는 가스를 발화 상태에 발생하는 것과 누출에 인해 발생하는 것으로 분류하여 포집 및 분석 가능한 가스 분석 장치를 제공하기 위한 것이다.
format	Patent
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subjects	ARRANGEMENTS FOR MEASURING TWO OR MORE VARIABLES NOT COVEREDIN A SINGLE OTHER SUBCLASS INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES MEASURING MEASURING NOT SPECIALLY ADAPTED FOR A SPECIFIC VARIABLE MEASURING OR TESTING NOT OTHERWISE PROVIDED FOR PHYSICS TARIFF METERING APPARATUS TESTING
title	APPARATUS FOR ANALYZING GAS
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