METHOD AND SYSTEM FOR DETECTING THE ALIGNMENT OF THE SECONDARY BATTERY BASED ON OPTICAL COHERENCE TOMOGRAPHY
According to one embodiment of the present invention, a method for inspecting an alignment state of a secondary battery, which is performed by an optical coherence tomography (OCT) device, includes the steps of: (a) irradiating light of the OCT device toward at least one surface of both sides of the...
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description | According to one embodiment of the present invention, a method for inspecting an alignment state of a secondary battery, which is performed by an optical coherence tomography (OCT) device, includes the steps of: (a) irradiating light of the OCT device toward at least one surface of both sides of the secondary battery and collecting the light reflected from the secondary battery; (b) identifying edges of electrode plates included in the secondary battery from an OCT image obtained based on the collected light; and (c) determining an alignment state between the electrode plates by comparing positions of the edges. According to one embodiment of the present invention, it is possible to perform an inspection during transfer of the secondary battery in the manufacturing process.
본 발명의 일 실시예에 따르는, OCT장치에 의해 수행되는, 이차전지 정렬상태 검사 방법은, (a) 이차전지의 양 측면 중 적어도 한 면을 향해 OCT장치의 광을 조사하고 상기 이차전지로부터 반사된 광을 수집하는 단계; (b) 상기 수집된 광을 기초로 획득된 OCT영상으로부터 상기 이차전지에 포함된 전극판들의 에지(edge)를 파악하는 단계; 및 (c) 각 에지의 위치를 비교하여 상기 전극판들 간 정렬상태를 판단하는 단계;를 포함한다. |
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fullrecord | <record><control><sourceid>epo_EVB</sourceid><recordid>TN_cdi_epo_espacenet_KR20230161686A</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>KR20230161686A</sourcerecordid><originalsourceid>FETCH-epo_espacenet_KR20230161686A3</originalsourceid><addsrcrecordid>eNqNyr8KwjAQgPEuDqK-w4Gz0D9QXM_kmhSbXElu6VSKxKloob4_QvEBnH7w8e2z2ZFY1oBeQxyikIOGA2gSUtJ6A2IJsGuNd-QFuNlCJMVeYxjghiK0GUkDe-BeWoUdKLYUyCsCYccmYG-HY7Z7TvOaTj8P2bkhUfaSlveY1mV6pFf6jPdQ5mWVF3VRX2us_ru-qqc3Yw</addsrcrecordid><sourcetype>Open Access Repository</sourcetype><iscdi>true</iscdi><recordtype>patent</recordtype></control><display><type>patent</type><title>METHOD AND SYSTEM FOR DETECTING THE ALIGNMENT OF THE SECONDARY BATTERY BASED ON OPTICAL COHERENCE TOMOGRAPHY</title><source>esp@cenet</source><creator>CHUNG JUNG HO ; JANG GWANG HOON ; OH HYUN HO</creator><creatorcontrib>CHUNG JUNG HO ; JANG GWANG HOON ; OH HYUN HO</creatorcontrib><description>According to one embodiment of the present invention, a method for inspecting an alignment state of a secondary battery, which is performed by an optical coherence tomography (OCT) device, includes the steps of: (a) irradiating light of the OCT device toward at least one surface of both sides of the secondary battery and collecting the light reflected from the secondary battery; (b) identifying edges of electrode plates included in the secondary battery from an OCT image obtained based on the collected light; and (c) determining an alignment state between the electrode plates by comparing positions of the edges. According to one embodiment of the present invention, it is possible to perform an inspection during transfer of the secondary battery in the manufacturing process.
본 발명의 일 실시예에 따르는, OCT장치에 의해 수행되는, 이차전지 정렬상태 검사 방법은, (a) 이차전지의 양 측면 중 적어도 한 면을 향해 OCT장치의 광을 조사하고 상기 이차전지로부터 반사된 광을 수집하는 단계; (b) 상기 수집된 광을 기초로 획득된 OCT영상으로부터 상기 이차전지에 포함된 전극판들의 에지(edge)를 파악하는 단계; 및 (c) 각 에지의 위치를 비교하여 상기 전극판들 간 정렬상태를 판단하는 단계;를 포함한다.</description><language>eng ; kor</language><subject>BASIC ELECTRIC ELEMENTS ; ELECTRICITY ; MEASURING ; MEASURING ANGLES ; MEASURING AREAS ; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS ; MEASURING LENGTH, THICKNESS OR SIMILAR LINEARDIMENSIONS ; PHYSICS ; PROCESSES OR MEANS, e.g. BATTERIES, FOR THE DIRECT CONVERSIONOF CHEMICAL INTO ELECTRICAL ENERGY ; TESTING</subject><creationdate>2023</creationdate><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20231128&DB=EPODOC&CC=KR&NR=20230161686A$$EHTML$$P50$$Gepo$$Hfree_for_read</linktohtml><link.rule.ids>230,308,776,881,25542,76289</link.rule.ids><linktorsrc>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20231128&DB=EPODOC&CC=KR&NR=20230161686A$$EView_record_in_European_Patent_Office$$FView_record_in_$$GEuropean_Patent_Office$$Hfree_for_read</linktorsrc></links><search><creatorcontrib>CHUNG JUNG HO</creatorcontrib><creatorcontrib>JANG GWANG HOON</creatorcontrib><creatorcontrib>OH HYUN HO</creatorcontrib><title>METHOD AND SYSTEM FOR DETECTING THE ALIGNMENT OF THE SECONDARY BATTERY BASED ON OPTICAL COHERENCE TOMOGRAPHY</title><description>According to one embodiment of the present invention, a method for inspecting an alignment state of a secondary battery, which is performed by an optical coherence tomography (OCT) device, includes the steps of: (a) irradiating light of the OCT device toward at least one surface of both sides of the secondary battery and collecting the light reflected from the secondary battery; (b) identifying edges of electrode plates included in the secondary battery from an OCT image obtained based on the collected light; and (c) determining an alignment state between the electrode plates by comparing positions of the edges. According to one embodiment of the present invention, it is possible to perform an inspection during transfer of the secondary battery in the manufacturing process.
본 발명의 일 실시예에 따르는, OCT장치에 의해 수행되는, 이차전지 정렬상태 검사 방법은, (a) 이차전지의 양 측면 중 적어도 한 면을 향해 OCT장치의 광을 조사하고 상기 이차전지로부터 반사된 광을 수집하는 단계; (b) 상기 수집된 광을 기초로 획득된 OCT영상으로부터 상기 이차전지에 포함된 전극판들의 에지(edge)를 파악하는 단계; 및 (c) 각 에지의 위치를 비교하여 상기 전극판들 간 정렬상태를 판단하는 단계;를 포함한다.</description><subject>BASIC ELECTRIC ELEMENTS</subject><subject>ELECTRICITY</subject><subject>MEASURING</subject><subject>MEASURING ANGLES</subject><subject>MEASURING AREAS</subject><subject>MEASURING IRREGULARITIES OF SURFACES OR CONTOURS</subject><subject>MEASURING LENGTH, THICKNESS OR SIMILAR LINEARDIMENSIONS</subject><subject>PHYSICS</subject><subject>PROCESSES OR MEANS, e.g. BATTERIES, FOR THE DIRECT CONVERSIONOF CHEMICAL INTO ELECTRICAL ENERGY</subject><subject>TESTING</subject><fulltext>true</fulltext><rsrctype>patent</rsrctype><creationdate>2023</creationdate><recordtype>patent</recordtype><sourceid>EVB</sourceid><recordid>eNqNyr8KwjAQgPEuDqK-w4Gz0D9QXM_kmhSbXElu6VSKxKloob4_QvEBnH7w8e2z2ZFY1oBeQxyikIOGA2gSUtJ6A2IJsGuNd-QFuNlCJMVeYxjghiK0GUkDe-BeWoUdKLYUyCsCYccmYG-HY7Z7TvOaTj8P2bkhUfaSlveY1mV6pFf6jPdQ5mWVF3VRX2us_ru-qqc3Yw</recordid><startdate>20231128</startdate><enddate>20231128</enddate><creator>CHUNG JUNG HO</creator><creator>JANG GWANG HOON</creator><creator>OH HYUN HO</creator><scope>EVB</scope></search><sort><creationdate>20231128</creationdate><title>METHOD AND SYSTEM FOR DETECTING THE ALIGNMENT OF THE SECONDARY BATTERY BASED ON OPTICAL COHERENCE TOMOGRAPHY</title><author>CHUNG JUNG HO ; JANG GWANG HOON ; OH HYUN HO</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-epo_espacenet_KR20230161686A3</frbrgroupid><rsrctype>patents</rsrctype><prefilter>patents</prefilter><language>eng ; kor</language><creationdate>2023</creationdate><topic>BASIC ELECTRIC ELEMENTS</topic><topic>ELECTRICITY</topic><topic>MEASURING</topic><topic>MEASURING ANGLES</topic><topic>MEASURING AREAS</topic><topic>MEASURING IRREGULARITIES OF SURFACES OR CONTOURS</topic><topic>MEASURING LENGTH, THICKNESS OR SIMILAR LINEARDIMENSIONS</topic><topic>PHYSICS</topic><topic>PROCESSES OR MEANS, e.g. BATTERIES, FOR THE DIRECT CONVERSIONOF CHEMICAL INTO ELECTRICAL ENERGY</topic><topic>TESTING</topic><toplevel>online_resources</toplevel><creatorcontrib>CHUNG JUNG HO</creatorcontrib><creatorcontrib>JANG GWANG HOON</creatorcontrib><creatorcontrib>OH HYUN HO</creatorcontrib><collection>esp@cenet</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>CHUNG JUNG HO</au><au>JANG GWANG HOON</au><au>OH HYUN HO</au><format>patent</format><genre>patent</genre><ristype>GEN</ristype><title>METHOD AND SYSTEM FOR DETECTING THE ALIGNMENT OF THE SECONDARY BATTERY BASED ON OPTICAL COHERENCE TOMOGRAPHY</title><date>2023-11-28</date><risdate>2023</risdate><abstract>According to one embodiment of the present invention, a method for inspecting an alignment state of a secondary battery, which is performed by an optical coherence tomography (OCT) device, includes the steps of: (a) irradiating light of the OCT device toward at least one surface of both sides of the secondary battery and collecting the light reflected from the secondary battery; (b) identifying edges of electrode plates included in the secondary battery from an OCT image obtained based on the collected light; and (c) determining an alignment state between the electrode plates by comparing positions of the edges. According to one embodiment of the present invention, it is possible to perform an inspection during transfer of the secondary battery in the manufacturing process.
본 발명의 일 실시예에 따르는, OCT장치에 의해 수행되는, 이차전지 정렬상태 검사 방법은, (a) 이차전지의 양 측면 중 적어도 한 면을 향해 OCT장치의 광을 조사하고 상기 이차전지로부터 반사된 광을 수집하는 단계; (b) 상기 수집된 광을 기초로 획득된 OCT영상으로부터 상기 이차전지에 포함된 전극판들의 에지(edge)를 파악하는 단계; 및 (c) 각 에지의 위치를 비교하여 상기 전극판들 간 정렬상태를 판단하는 단계;를 포함한다.</abstract><oa>free_for_read</oa></addata></record> |
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subjects | BASIC ELECTRIC ELEMENTS ELECTRICITY MEASURING MEASURING ANGLES MEASURING AREAS MEASURING IRREGULARITIES OF SURFACES OR CONTOURS MEASURING LENGTH, THICKNESS OR SIMILAR LINEARDIMENSIONS PHYSICS PROCESSES OR MEANS, e.g. BATTERIES, FOR THE DIRECT CONVERSIONOF CHEMICAL INTO ELECTRICAL ENERGY TESTING |
title | METHOD AND SYSTEM FOR DETECTING THE ALIGNMENT OF THE SECONDARY BATTERY BASED ON OPTICAL COHERENCE TOMOGRAPHY |
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