A system for inspecting board
The present invention relates to a substrate inspecting system. The substrate inspecting system according to one embodiment of the present invention preferably comprises: a substrate transferring unit which transfers a substrate to at least one inspection area; and a substrate inspecting unit which...
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| creator | NA JAE DEOK CHO CHEOL HOON YOO YOUNG WOONG KIM JONG HYUN |
| description | The present invention relates to a substrate inspecting system. The substrate inspecting system according to one embodiment of the present invention preferably comprises: a substrate transferring unit which transfers a substrate to at least one inspection area; and a substrate inspecting unit which photographs the upper surface and the lower surface of the substrate placed in the inspection area and inspects a status of the substrate from an upper surface image wherein the upper surface of the substrate is photographed and a lower surface image wherein the lower surface of the substrate.
본 발명의 일 실시예에 따른 기판 검사 시스템은, 기판을 적어도 하나의 검사영역으로 이송하는 기판 이송부; 및 검사영역에 놓인 기판의 상면과 하면을 각각 촬영하여, 기판의 상면이 촬영된 상면이미지와, 기판의 하면이 촬영된 하면이미지로부터, 기판의 상태를 검사하는 기판 검사부를 포함하는 것이 바람직하다. |
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본 발명의 일 실시예에 따른 기판 검사 시스템은, 기판을 적어도 하나의 검사영역으로 이송하는 기판 이송부; 및 검사영역에 놓인 기판의 상면과 하면을 각각 촬영하여, 기판의 상면이 촬영된 상면이미지와, 기판의 하면이 촬영된 하면이미지로부터, 기판의 상태를 검사하는 기판 검사부를 포함하는 것이 바람직하다.</description><subject>CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS</subject><subject>CONVEYING</subject><subject>ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR</subject><subject>ELECTRICITY</subject><subject>HANDLING THIN OR FILAMENTARY MATERIAL</subject><subject>INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES</subject><subject>MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS</subject><subject>MEASURING</subject><subject>PACKING</subject><subject>PERFORMING OPERATIONS</subject><subject>PHYSICS</subject><subject>PNEUMATIC TUBE CONVEYORS</subject><subject>PRINTED CIRCUITS</subject><subject>SHOP CONVEYOR SYSTEMS</subject><subject>STORING</subject><subject>TESTING</subject><subject>TRANSPORT OR STORAGE DEVICES, e.g. CONVEYORS FOR LOADING ORTIPPING</subject><subject>TRANSPORTING</subject><fulltext>true</fulltext><rsrctype>patent</rsrctype><creationdate>2023</creationdate><recordtype>patent</recordtype><sourceid>EVB</sourceid><recordid>eNrjZJB1VCiuLC5JzVVIyy9SyMwrLkhNLsnMS1dIyk8sSuFhYE1LzClO5YXS3AzKbq4hzh66qQX58anFBYnJqXmpJfHeQUYGRsYGhsbmpkamjsbEqQIAQtYkxQ</recordid><startdate>20231005</startdate><enddate>20231005</enddate><creator>NA JAE DEOK</creator><creator>CHO CHEOL HOON</creator><creator>YOO YOUNG WOONG</creator><creator>KIM JONG HYUN</creator><scope>EVB</scope></search><sort><creationdate>20231005</creationdate><title>A system for inspecting board</title><author>NA JAE DEOK ; CHO CHEOL HOON ; YOO YOUNG WOONG ; KIM JONG HYUN</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-epo_espacenet_KR20230137525A3</frbrgroupid><rsrctype>patents</rsrctype><prefilter>patents</prefilter><language>eng ; kor</language><creationdate>2023</creationdate><topic>CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS</topic><topic>CONVEYING</topic><topic>ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR</topic><topic>ELECTRICITY</topic><topic>HANDLING THIN OR FILAMENTARY MATERIAL</topic><topic>INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES</topic><topic>MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS</topic><topic>MEASURING</topic><topic>PACKING</topic><topic>PERFORMING OPERATIONS</topic><topic>PHYSICS</topic><topic>PNEUMATIC TUBE CONVEYORS</topic><topic>PRINTED CIRCUITS</topic><topic>SHOP CONVEYOR SYSTEMS</topic><topic>STORING</topic><topic>TESTING</topic><topic>TRANSPORT OR STORAGE DEVICES, e.g. CONVEYORS FOR LOADING ORTIPPING</topic><topic>TRANSPORTING</topic><toplevel>online_resources</toplevel><creatorcontrib>NA JAE DEOK</creatorcontrib><creatorcontrib>CHO CHEOL HOON</creatorcontrib><creatorcontrib>YOO YOUNG WOONG</creatorcontrib><creatorcontrib>KIM JONG HYUN</creatorcontrib><collection>esp@cenet</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>NA JAE DEOK</au><au>CHO CHEOL HOON</au><au>YOO YOUNG WOONG</au><au>KIM JONG HYUN</au><format>patent</format><genre>patent</genre><ristype>GEN</ristype><title>A system for inspecting board</title><date>2023-10-05</date><risdate>2023</risdate><abstract>The present invention relates to a substrate inspecting system. The substrate inspecting system according to one embodiment of the present invention preferably comprises: a substrate transferring unit which transfers a substrate to at least one inspection area; and a substrate inspecting unit which photographs the upper surface and the lower surface of the substrate placed in the inspection area and inspects a status of the substrate from an upper surface image wherein the upper surface of the substrate is photographed and a lower surface image wherein the lower surface of the substrate.
본 발명의 일 실시예에 따른 기판 검사 시스템은, 기판을 적어도 하나의 검사영역으로 이송하는 기판 이송부; 및 검사영역에 놓인 기판의 상면과 하면을 각각 촬영하여, 기판의 상면이 촬영된 상면이미지와, 기판의 하면이 촬영된 하면이미지로부터, 기판의 상태를 검사하는 기판 검사부를 포함하는 것이 바람직하다.</abstract><oa>free_for_read</oa></addata></record> |
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| subjects | CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS CONVEYING ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR ELECTRICITY HANDLING THIN OR FILAMENTARY MATERIAL INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS MEASURING PACKING PERFORMING OPERATIONS PHYSICS PNEUMATIC TUBE CONVEYORS PRINTED CIRCUITS SHOP CONVEYOR SYSTEMS STORING TESTING TRANSPORT OR STORAGE DEVICES, e.g. CONVEYORS FOR LOADING ORTIPPING TRANSPORTING |
| title | A system for inspecting board |
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