TOF-MEIS SIGNAL IMPROVEMENT SYSTEM OF TOF-MEIS

Disclosed is a TOF-MEIS signal improvement system comprising a signal removal part that is located at a front end of a particle detector that detects ions scattered from a sample, applies a force in a direction that disrupts a direction wherein the ions move when a power supply is supplied, and prev...

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Bibliographische Detailangaben
Hauptverfasser:	YU KYU SANG, KIM WAN SUP, KIM SOOBANG, MIN WON JA, PARK KYUNG SU, HWANG YOUNG BOK, KIM HYO DONG, SIM CHANG SIK
Format:	Patent
Sprache:	eng ; kor
Schlagworte:	BASIC ELECTRIC ELEMENTS ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS ELECTRICITY
Online-Zugang:	Volltext bestellen
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Beschreibung
Zusammenfassung:	Disclosed is a TOF-MEIS signal improvement system comprising a signal removal part that is located at a front end of a particle detector that detects ions scattered from a sample, applies a force in a direction that disrupts a direction wherein the ions move when a power supply is supplied, and prevents the ions from reaching the particle detector. Therefore, an objective of the present invention is to provide an efficient TOF-MEIS signal improvement system. 시료에서 산란된 이온을 검출하는 입자검출기의 전단에 위치되어 전원이 공급되면 상기 이온이 이동되는 방향을 방해하는 방향으로 힘을 인가하여 상기 이온이 상기 입자검출기에 도달하지 못하게 하는 신호제거부를 포함하는 TOF-MEIS 신호 개선 시스템이 개시된다.