성막 장치 및 성막 방법

[해결 수단] 본 개시의 장치는, 내부의 처리 공간이 진공 분위기가 되도록 배기되는 처리 용기에, 제 1 처리 가스, 치환 가스, 플라즈마에 의해 활성화한 제 2 처리 가스, 치환 가스의 순번으로 각 가스를 교대로 공급해서 기판에 성막하는 것에 있어서, 제 2 처리 가스를 활성화하기 위한 플라즈마 생성 기구를 구비하는 플라즈마 생성실과, 플라즈마 생성실을 배기하는 배기 기구와, 플라즈마 생성실과 배기 기구를 접속하는 배기로에 설치되고, 플라즈마에 의해 활성화한 제 2 처리 가스의 공급처가 상기 배기로의 하류측과 상기 처리 공간과의...

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description [해결 수단] 본 개시의 장치는, 내부의 처리 공간이 진공 분위기가 되도록 배기되는 처리 용기에, 제 1 처리 가스, 치환 가스, 플라즈마에 의해 활성화한 제 2 처리 가스, 치환 가스의 순번으로 각 가스를 교대로 공급해서 기판에 성막하는 것에 있어서, 제 2 처리 가스를 활성화하기 위한 플라즈마 생성 기구를 구비하는 플라즈마 생성실과, 플라즈마 생성실을 배기하는 배기 기구와, 플라즈마 생성실과 배기 기구를 접속하는 배기로에 설치되고, 플라즈마에 의해 활성화한 제 2 처리 가스의 공급처가 상기 배기로의 하류측과 상기 처리 공간과의 사이에서 전환되도록, 개폐하는 공급처 변경용 밸브를 구비한다. [Solution] A device according to the present disclosure comprises: a plasma generation chamber that is provided with a plasma generation mechanism for activating a second processing gas, when forming a film on a substrate by supplying each of a first processing gas, a substitution gas, the plasma-activated second processing gas, and the substitution gas, in order and by turns, to a processing vessel in which an interior processing space is evacuated so as to become a vacuum atmosphere; an evacuation mechanism that evacuates the plasma generation chamber; and a supply destination changing valve that is provided on an evacuation path connecting the plasma generation chamber and the evacuation mechanism, and opens and closes such that the supply destination of the plasma-activated second processing gas switches between a downstream side of the evacuation path, and the processing space.
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[Solution] A device according to the present disclosure comprises: a plasma generation chamber that is provided with a plasma generation mechanism for activating a second processing gas, when forming a film on a substrate by supplying each of a first processing gas, a substitution gas, the plasma-activated second processing gas, and the substitution gas, in order and by turns, to a processing vessel in which an interior processing space is evacuated so as to become a vacuum atmosphere; an evacuation mechanism that evacuates the plasma generation chamber; and a supply destination changing valve that is provided on an evacuation path connecting the plasma generation chamber and the evacuation mechanism, and opens and closes such that the supply destination of the plasma-activated second processing gas switches between a downstream side of the evacuation path, and the processing space.</description><language>kor</language><subject>BASIC ELECTRIC ELEMENTS ; CHEMICAL SURFACE TREATMENT ; CHEMISTRY ; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATIONOR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL ; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY IONIMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL ; COATING MATERIAL WITH METALLIC MATERIAL ; COATING METALLIC MATERIAL ; DIFFUSION TREATMENT OF METALLIC MATERIAL ; ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR ; ELECTRICITY ; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION INGENERAL ; METALLURGY ; SEMICONDUCTOR DEVICES ; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THESURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION</subject><creationdate>2023</creationdate><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&amp;date=20230919&amp;DB=EPODOC&amp;CC=KR&amp;NR=20230133914A$$EHTML$$P50$$Gepo$$Hfree_for_read</linktohtml><link.rule.ids>230,308,777,882,25546,76297</link.rule.ids><linktorsrc>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&amp;date=20230919&amp;DB=EPODOC&amp;CC=KR&amp;NR=20230133914A$$EView_record_in_European_Patent_Office$$FView_record_in_$$GEuropean_Patent_Office$$Hfree_for_read</linktorsrc></links><search><creatorcontrib>YAMAWAKU JUN</creatorcontrib><title>성막 장치 및 성막 방법</title><description>[해결 수단] 본 개시의 장치는, 내부의 처리 공간이 진공 분위기가 되도록 배기되는 처리 용기에, 제 1 처리 가스, 치환 가스, 플라즈마에 의해 활성화한 제 2 처리 가스, 치환 가스의 순번으로 각 가스를 교대로 공급해서 기판에 성막하는 것에 있어서, 제 2 처리 가스를 활성화하기 위한 플라즈마 생성 기구를 구비하는 플라즈마 생성실과, 플라즈마 생성실을 배기하는 배기 기구와, 플라즈마 생성실과 배기 기구를 접속하는 배기로에 설치되고, 플라즈마에 의해 활성화한 제 2 처리 가스의 공급처가 상기 배기로의 하류측과 상기 처리 공간과의 사이에서 전환되도록, 개폐하는 공급처 변경용 밸브를 구비한다. [Solution] A device according to the present disclosure comprises: a plasma generation chamber that is provided with a plasma generation mechanism for activating a second processing gas, when forming a film on a substrate by supplying each of a first processing gas, a substitution gas, the plasma-activated second processing gas, and the substitution gas, in order and by turns, to a processing vessel in which an interior processing space is evacuated so as to become a vacuum atmosphere; an evacuation mechanism that evacuates the plasma generation chamber; and a supply destination changing valve that is provided on an evacuation path connecting the plasma generation chamber and the evacuation mechanism, and opens and closes such that the supply destination of the plasma-activated second processing gas switches between a downstream side of the evacuation path, and the processing space.</description><subject>BASIC ELECTRIC ELEMENTS</subject><subject>CHEMICAL SURFACE TREATMENT</subject><subject>CHEMISTRY</subject><subject>COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATIONOR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL</subject><subject>COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY IONIMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL</subject><subject>COATING MATERIAL WITH METALLIC MATERIAL</subject><subject>COATING METALLIC MATERIAL</subject><subject>DIFFUSION TREATMENT OF METALLIC MATERIAL</subject><subject>ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR</subject><subject>ELECTRICITY</subject><subject>INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION INGENERAL</subject><subject>METALLURGY</subject><subject>SEMICONDUCTOR DEVICES</subject><subject>SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THESURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION</subject><fulltext>true</fulltext><rsrctype>patent</rsrctype><creationdate>2023</creationdate><recordtype>patent</recordtype><sourceid>EVB</sourceid><recordid>eNrjZJB_07Lx9fJOhTfzlr7ZOUPh9YZ-BajI6w0rX2-aysPAmpaYU5zKC6W5GZTdXEOcPXRTC_LjU4sLEpNT81JL4r2DjAyMjA0MjY0tDU0cjYlTBQAq7S3e</recordid><startdate>20230919</startdate><enddate>20230919</enddate><creator>YAMAWAKU JUN</creator><scope>EVB</scope></search><sort><creationdate>20230919</creationdate><title>성막 장치 및 성막 방법</title><author>YAMAWAKU JUN</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-epo_espacenet_KR20230133914A3</frbrgroupid><rsrctype>patents</rsrctype><prefilter>patents</prefilter><language>kor</language><creationdate>2023</creationdate><topic>BASIC ELECTRIC ELEMENTS</topic><topic>CHEMICAL SURFACE TREATMENT</topic><topic>CHEMISTRY</topic><topic>COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATIONOR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL</topic><topic>COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY IONIMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL</topic><topic>COATING MATERIAL WITH METALLIC MATERIAL</topic><topic>COATING METALLIC MATERIAL</topic><topic>DIFFUSION TREATMENT OF METALLIC MATERIAL</topic><topic>ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR</topic><topic>ELECTRICITY</topic><topic>INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION INGENERAL</topic><topic>METALLURGY</topic><topic>SEMICONDUCTOR DEVICES</topic><topic>SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THESURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION</topic><toplevel>online_resources</toplevel><creatorcontrib>YAMAWAKU JUN</creatorcontrib><collection>esp@cenet</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>YAMAWAKU JUN</au><format>patent</format><genre>patent</genre><ristype>GEN</ristype><title>성막 장치 및 성막 방법</title><date>2023-09-19</date><risdate>2023</risdate><abstract>[해결 수단] 본 개시의 장치는, 내부의 처리 공간이 진공 분위기가 되도록 배기되는 처리 용기에, 제 1 처리 가스, 치환 가스, 플라즈마에 의해 활성화한 제 2 처리 가스, 치환 가스의 순번으로 각 가스를 교대로 공급해서 기판에 성막하는 것에 있어서, 제 2 처리 가스를 활성화하기 위한 플라즈마 생성 기구를 구비하는 플라즈마 생성실과, 플라즈마 생성실을 배기하는 배기 기구와, 플라즈마 생성실과 배기 기구를 접속하는 배기로에 설치되고, 플라즈마에 의해 활성화한 제 2 처리 가스의 공급처가 상기 배기로의 하류측과 상기 처리 공간과의 사이에서 전환되도록, 개폐하는 공급처 변경용 밸브를 구비한다. [Solution] A device according to the present disclosure comprises: a plasma generation chamber that is provided with a plasma generation mechanism for activating a second processing gas, when forming a film on a substrate by supplying each of a first processing gas, a substitution gas, the plasma-activated second processing gas, and the substitution gas, in order and by turns, to a processing vessel in which an interior processing space is evacuated so as to become a vacuum atmosphere; an evacuation mechanism that evacuates the plasma generation chamber; and a supply destination changing valve that is provided on an evacuation path connecting the plasma generation chamber and the evacuation mechanism, and opens and closes such that the supply destination of the plasma-activated second processing gas switches between a downstream side of the evacuation path, and the processing space.</abstract><oa>free_for_read</oa></addata></record>
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subjects BASIC ELECTRIC ELEMENTS
CHEMICAL SURFACE TREATMENT
CHEMISTRY
COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATIONOR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY IONIMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
COATING MATERIAL WITH METALLIC MATERIAL
COATING METALLIC MATERIAL
DIFFUSION TREATMENT OF METALLIC MATERIAL
ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR
ELECTRICITY
INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION INGENERAL
METALLURGY
SEMICONDUCTOR DEVICES
SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THESURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION
title 성막 장치 및 성막 방법
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