Multi Sequence Checker For Electrical Circuit
The present invention relates to a device for checking a multiple electric circuit sequence, which is able to implement a desired circuit based on the programmable logic controller (PLC) logic and the human machine interface (HMI), and thereby test the operation of an electrical sequence circuit and...
Gespeichert in:
| Hauptverfasser: | , , , |
|---|---|
| Format: | Patent |
| Sprache: | eng ; kor |
| Schlagworte: | |
| Online-Zugang: | Volltext bestellen |
| Tags: |
Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
|
| container_end_page | |
|---|---|
| container_issue | |
| container_start_page | |
| container_title | |
| container_volume | |
| creator | KIM SANG DON KIM WON YOUNG HAN TAEK YUN EO JIN WOO |
| description | The present invention relates to a device for checking a multiple electric circuit sequence, which is able to implement a desired circuit based on the programmable logic controller (PLC) logic and the human machine interface (HMI), and thereby test the operation of an electrical sequence circuit and identify the status. According to the present invention, the present invention is able to implement drawing information with a logic based on the HMI and the PLC, check the circuit operation status, and implement an advanced maintenance which is able to determine the circuit operation status by connecting the device of the present invention and by a simple operation instead of the conventional maintenance pattern using the DVM and a switch. The device comprises: a connection unit; a user interface unit; and a computation control unit.
본 발명은 다중 전기회로 시퀀스 점검용 장치에 관한 것으로, PLC(Programmable Logic Controller) 로직과 HMI(Human Machine Interface)를 기반으로 원하는 회로를 구현하여 전기적 시퀀스 회로 동작 시험 및 상태 파악이 가능한 수준의 다중 전기회로 시퀀스 점검용 장치에 관한 것이다. 본 발명에 따르면, 도면 정보를 HMI와 PLC 기반의 로직으로 구현, 회로 동작상태를 확인하는 장비로 DVM과 스위치로 점검하던 정비패턴을 본 장비를 연결, 간단한 조작으로 회로 동작상태를 판별하는 진보된 정비를 실현할 수 있는 효과가 있다. |
| format | Patent |
| fullrecord | <record><control><sourceid>epo_EVB</sourceid><recordid>TN_cdi_epo_espacenet_KR20230103538A</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>KR20230103538A</sourcerecordid><originalsourceid>FETCH-epo_espacenet_KR20230103538A3</originalsourceid><addsrcrecordid>eNrjZND1Lc0pyVQITi0sTc1LTlVwzkhNzk4tUnDLL1JwzUlNLinKTE7MUXDOLEouzSzhYWBNS8wpTuWF0twMym6uIc4euqkF-fGpxQWJyal5qSXx3kFGBkbGBoYGxqbGFo7GxKkCACzTKnE</addsrcrecordid><sourcetype>Open Access Repository</sourcetype><iscdi>true</iscdi><recordtype>patent</recordtype></control><display><type>patent</type><title>Multi Sequence Checker For Electrical Circuit</title><source>esp@cenet</source><creator>KIM SANG DON ; KIM WON YOUNG ; HAN TAEK YUN ; EO JIN WOO</creator><creatorcontrib>KIM SANG DON ; KIM WON YOUNG ; HAN TAEK YUN ; EO JIN WOO</creatorcontrib><description>The present invention relates to a device for checking a multiple electric circuit sequence, which is able to implement a desired circuit based on the programmable logic controller (PLC) logic and the human machine interface (HMI), and thereby test the operation of an electrical sequence circuit and identify the status. According to the present invention, the present invention is able to implement drawing information with a logic based on the HMI and the PLC, check the circuit operation status, and implement an advanced maintenance which is able to determine the circuit operation status by connecting the device of the present invention and by a simple operation instead of the conventional maintenance pattern using the DVM and a switch. The device comprises: a connection unit; a user interface unit; and a computation control unit.
본 발명은 다중 전기회로 시퀀스 점검용 장치에 관한 것으로, PLC(Programmable Logic Controller) 로직과 HMI(Human Machine Interface)를 기반으로 원하는 회로를 구현하여 전기적 시퀀스 회로 동작 시험 및 상태 파악이 가능한 수준의 다중 전기회로 시퀀스 점검용 장치에 관한 것이다. 본 발명에 따르면, 도면 정보를 HMI와 PLC 기반의 로직으로 구현, 회로 동작상태를 확인하는 장비로 DVM과 스위치로 점검하던 정비패턴을 본 장비를 연결, 간단한 조작으로 회로 동작상태를 판별하는 진보된 정비를 실현할 수 있는 효과가 있다.</description><language>eng ; kor</language><subject>CONTROL OR REGULATING SYSTEMS IN GENERAL ; CONTROLLING ; FUNCTIONAL ELEMENTS OF SUCH SYSTEMS ; MONITORING OR TESTING ARRANGEMENTS FOR SUCH SYSTEMS ORELEMENTS ; PHYSICS ; REGULATING</subject><creationdate>2023</creationdate><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20230707&DB=EPODOC&CC=KR&NR=20230103538A$$EHTML$$P50$$Gepo$$Hfree_for_read</linktohtml><link.rule.ids>230,308,778,883,25551,76302</link.rule.ids><linktorsrc>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20230707&DB=EPODOC&CC=KR&NR=20230103538A$$EView_record_in_European_Patent_Office$$FView_record_in_$$GEuropean_Patent_Office$$Hfree_for_read</linktorsrc></links><search><creatorcontrib>KIM SANG DON</creatorcontrib><creatorcontrib>KIM WON YOUNG</creatorcontrib><creatorcontrib>HAN TAEK YUN</creatorcontrib><creatorcontrib>EO JIN WOO</creatorcontrib><title>Multi Sequence Checker For Electrical Circuit</title><description>The present invention relates to a device for checking a multiple electric circuit sequence, which is able to implement a desired circuit based on the programmable logic controller (PLC) logic and the human machine interface (HMI), and thereby test the operation of an electrical sequence circuit and identify the status. According to the present invention, the present invention is able to implement drawing information with a logic based on the HMI and the PLC, check the circuit operation status, and implement an advanced maintenance which is able to determine the circuit operation status by connecting the device of the present invention and by a simple operation instead of the conventional maintenance pattern using the DVM and a switch. The device comprises: a connection unit; a user interface unit; and a computation control unit.
본 발명은 다중 전기회로 시퀀스 점검용 장치에 관한 것으로, PLC(Programmable Logic Controller) 로직과 HMI(Human Machine Interface)를 기반으로 원하는 회로를 구현하여 전기적 시퀀스 회로 동작 시험 및 상태 파악이 가능한 수준의 다중 전기회로 시퀀스 점검용 장치에 관한 것이다. 본 발명에 따르면, 도면 정보를 HMI와 PLC 기반의 로직으로 구현, 회로 동작상태를 확인하는 장비로 DVM과 스위치로 점검하던 정비패턴을 본 장비를 연결, 간단한 조작으로 회로 동작상태를 판별하는 진보된 정비를 실현할 수 있는 효과가 있다.</description><subject>CONTROL OR REGULATING SYSTEMS IN GENERAL</subject><subject>CONTROLLING</subject><subject>FUNCTIONAL ELEMENTS OF SUCH SYSTEMS</subject><subject>MONITORING OR TESTING ARRANGEMENTS FOR SUCH SYSTEMS ORELEMENTS</subject><subject>PHYSICS</subject><subject>REGULATING</subject><fulltext>true</fulltext><rsrctype>patent</rsrctype><creationdate>2023</creationdate><recordtype>patent</recordtype><sourceid>EVB</sourceid><recordid>eNrjZND1Lc0pyVQITi0sTc1LTlVwzkhNzk4tUnDLL1JwzUlNLinKTE7MUXDOLEouzSzhYWBNS8wpTuWF0twMym6uIc4euqkF-fGpxQWJyal5qSXx3kFGBkbGBoYGxqbGFo7GxKkCACzTKnE</recordid><startdate>20230707</startdate><enddate>20230707</enddate><creator>KIM SANG DON</creator><creator>KIM WON YOUNG</creator><creator>HAN TAEK YUN</creator><creator>EO JIN WOO</creator><scope>EVB</scope></search><sort><creationdate>20230707</creationdate><title>Multi Sequence Checker For Electrical Circuit</title><author>KIM SANG DON ; KIM WON YOUNG ; HAN TAEK YUN ; EO JIN WOO</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-epo_espacenet_KR20230103538A3</frbrgroupid><rsrctype>patents</rsrctype><prefilter>patents</prefilter><language>eng ; kor</language><creationdate>2023</creationdate><topic>CONTROL OR REGULATING SYSTEMS IN GENERAL</topic><topic>CONTROLLING</topic><topic>FUNCTIONAL ELEMENTS OF SUCH SYSTEMS</topic><topic>MONITORING OR TESTING ARRANGEMENTS FOR SUCH SYSTEMS ORELEMENTS</topic><topic>PHYSICS</topic><topic>REGULATING</topic><toplevel>online_resources</toplevel><creatorcontrib>KIM SANG DON</creatorcontrib><creatorcontrib>KIM WON YOUNG</creatorcontrib><creatorcontrib>HAN TAEK YUN</creatorcontrib><creatorcontrib>EO JIN WOO</creatorcontrib><collection>esp@cenet</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>KIM SANG DON</au><au>KIM WON YOUNG</au><au>HAN TAEK YUN</au><au>EO JIN WOO</au><format>patent</format><genre>patent</genre><ristype>GEN</ristype><title>Multi Sequence Checker For Electrical Circuit</title><date>2023-07-07</date><risdate>2023</risdate><abstract>The present invention relates to a device for checking a multiple electric circuit sequence, which is able to implement a desired circuit based on the programmable logic controller (PLC) logic and the human machine interface (HMI), and thereby test the operation of an electrical sequence circuit and identify the status. According to the present invention, the present invention is able to implement drawing information with a logic based on the HMI and the PLC, check the circuit operation status, and implement an advanced maintenance which is able to determine the circuit operation status by connecting the device of the present invention and by a simple operation instead of the conventional maintenance pattern using the DVM and a switch. The device comprises: a connection unit; a user interface unit; and a computation control unit.
본 발명은 다중 전기회로 시퀀스 점검용 장치에 관한 것으로, PLC(Programmable Logic Controller) 로직과 HMI(Human Machine Interface)를 기반으로 원하는 회로를 구현하여 전기적 시퀀스 회로 동작 시험 및 상태 파악이 가능한 수준의 다중 전기회로 시퀀스 점검용 장치에 관한 것이다. 본 발명에 따르면, 도면 정보를 HMI와 PLC 기반의 로직으로 구현, 회로 동작상태를 확인하는 장비로 DVM과 스위치로 점검하던 정비패턴을 본 장비를 연결, 간단한 조작으로 회로 동작상태를 판별하는 진보된 정비를 실현할 수 있는 효과가 있다.</abstract><oa>free_for_read</oa></addata></record> |
| fulltext | fulltext_linktorsrc |
| identifier | |
| ispartof | |
| issn | |
| language | eng ; kor |
| recordid | cdi_epo_espacenet_KR20230103538A |
| source | esp@cenet |
| subjects | CONTROL OR REGULATING SYSTEMS IN GENERAL CONTROLLING FUNCTIONAL ELEMENTS OF SUCH SYSTEMS MONITORING OR TESTING ARRANGEMENTS FOR SUCH SYSTEMS ORELEMENTS PHYSICS REGULATING |
| title | Multi Sequence Checker For Electrical Circuit |
| url | https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2025-01-16T03%3A16%3A40IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-epo_EVB&rft_val_fmt=info:ofi/fmt:kev:mtx:patent&rft.genre=patent&rft.au=KIM%20SANG%20DON&rft.date=2023-07-07&rft_id=info:doi/&rft_dat=%3Cepo_EVB%3EKR20230103538A%3C/epo_EVB%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_id=info:pmid/&rfr_iscdi=true |