Method And Apparatus for Detecting Defect Based on Cascade Pass-Fail Determination
Provided are a method and apparatus for detecting a defect based on cascade pass-fail determination. According to one aspect of the present disclosure, a method and apparatus for detecting a defect are provided. The method includes: obtaining a product image; inputting it into a first determination...
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| creator | SONG KYU HA CHO YU MIN KIM TAE HYUN |
| description | Provided are a method and apparatus for detecting a defect based on cascade pass-fail determination. According to one aspect of the present disclosure, a method and apparatus for detecting a defect are provided. The method includes: obtaining a product image; inputting it into a first determination model; performing pass-fail determination; inputting the product image to a second determination model when the result of the pass-fail determination cannot be determined; and performing pass-fail determination.
본 개시는 단계적 합부 판정을 기반으로 한 불량 검출방법 및 장치를 제공한다. 본 개시의 일 측면에 의하면, 제품 이미지를 획득하여 제1 판정 모델에 입력하여 합부 판정을 수행하고, 합부 판정 결과, 판정 불가 판단을 받은 경우에 제2 판정 모델에 제품 이미지를 입력하여 합부 판정을 수행하는, 불량 검출방법 및 장치를 제공한다. |
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| fullrecord | <record><control><sourceid>epo_EVB</sourceid><recordid>TN_cdi_epo_espacenet_KR20230028050A</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>KR20230028050A</sourcerecordid><originalsourceid>FETCH-epo_espacenet_KR20230028050A3</originalsourceid><addsrcrecordid>eNqNikEKwjAQAHPxIOofFjwXQorgtVaLIIIU72VJNhqoSciu_zeID_AwzBxmqcYryTM56GIlZywobwafChxJyEqIj1q-FhyQyUGK0CNbdAQ3ZG4GDPP3La8QUUKKa7XwODNtfl6p7XC69-eGcpqIM1qKJNNlNNq0Wpu93umu_e_6ADguN4I</addsrcrecordid><sourcetype>Open Access Repository</sourcetype><iscdi>true</iscdi><recordtype>patent</recordtype></control><display><type>patent</type><title>Method And Apparatus for Detecting Defect Based on Cascade Pass-Fail Determination</title><source>esp@cenet</source><creator>SONG KYU HA ; CHO YU MIN ; KIM TAE HYUN</creator><creatorcontrib>SONG KYU HA ; CHO YU MIN ; KIM TAE HYUN</creatorcontrib><description>Provided are a method and apparatus for detecting a defect based on cascade pass-fail determination. According to one aspect of the present disclosure, a method and apparatus for detecting a defect are provided. The method includes: obtaining a product image; inputting it into a first determination model; performing pass-fail determination; inputting the product image to a second determination model when the result of the pass-fail determination cannot be determined; and performing pass-fail determination.
본 개시는 단계적 합부 판정을 기반으로 한 불량 검출방법 및 장치를 제공한다. 본 개시의 일 측면에 의하면, 제품 이미지를 획득하여 제1 판정 모델에 입력하여 합부 판정을 수행하고, 합부 판정 결과, 판정 불가 판단을 받은 경우에 제2 판정 모델에 제품 이미지를 입력하여 합부 판정을 수행하는, 불량 검출방법 및 장치를 제공한다.</description><language>eng ; kor</language><subject>CALCULATING ; COMPUTING ; COUNTING ; ELECTRIC DIGITAL DATA PROCESSING ; IMAGE DATA PROCESSING OR GENERATION, IN GENERAL ; PHYSICS</subject><creationdate>2023</creationdate><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20230228&DB=EPODOC&CC=KR&NR=20230028050A$$EHTML$$P50$$Gepo$$Hfree_for_read</linktohtml><link.rule.ids>230,308,776,881,25543,76294</link.rule.ids><linktorsrc>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20230228&DB=EPODOC&CC=KR&NR=20230028050A$$EView_record_in_European_Patent_Office$$FView_record_in_$$GEuropean_Patent_Office$$Hfree_for_read</linktorsrc></links><search><creatorcontrib>SONG KYU HA</creatorcontrib><creatorcontrib>CHO YU MIN</creatorcontrib><creatorcontrib>KIM TAE HYUN</creatorcontrib><title>Method And Apparatus for Detecting Defect Based on Cascade Pass-Fail Determination</title><description>Provided are a method and apparatus for detecting a defect based on cascade pass-fail determination. According to one aspect of the present disclosure, a method and apparatus for detecting a defect are provided. The method includes: obtaining a product image; inputting it into a first determination model; performing pass-fail determination; inputting the product image to a second determination model when the result of the pass-fail determination cannot be determined; and performing pass-fail determination.
본 개시는 단계적 합부 판정을 기반으로 한 불량 검출방법 및 장치를 제공한다. 본 개시의 일 측면에 의하면, 제품 이미지를 획득하여 제1 판정 모델에 입력하여 합부 판정을 수행하고, 합부 판정 결과, 판정 불가 판단을 받은 경우에 제2 판정 모델에 제품 이미지를 입력하여 합부 판정을 수행하는, 불량 검출방법 및 장치를 제공한다.</description><subject>CALCULATING</subject><subject>COMPUTING</subject><subject>COUNTING</subject><subject>ELECTRIC DIGITAL DATA PROCESSING</subject><subject>IMAGE DATA PROCESSING OR GENERATION, IN GENERAL</subject><subject>PHYSICS</subject><fulltext>true</fulltext><rsrctype>patent</rsrctype><creationdate>2023</creationdate><recordtype>patent</recordtype><sourceid>EVB</sourceid><recordid>eNqNikEKwjAQAHPxIOofFjwXQorgtVaLIIIU72VJNhqoSciu_zeID_AwzBxmqcYryTM56GIlZywobwafChxJyEqIj1q-FhyQyUGK0CNbdAQ3ZG4GDPP3La8QUUKKa7XwODNtfl6p7XC69-eGcpqIM1qKJNNlNNq0Wpu93umu_e_6ADguN4I</recordid><startdate>20230228</startdate><enddate>20230228</enddate><creator>SONG KYU HA</creator><creator>CHO YU MIN</creator><creator>KIM TAE HYUN</creator><scope>EVB</scope></search><sort><creationdate>20230228</creationdate><title>Method And Apparatus for Detecting Defect Based on Cascade Pass-Fail Determination</title><author>SONG KYU HA ; CHO YU MIN ; KIM TAE HYUN</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-epo_espacenet_KR20230028050A3</frbrgroupid><rsrctype>patents</rsrctype><prefilter>patents</prefilter><language>eng ; kor</language><creationdate>2023</creationdate><topic>CALCULATING</topic><topic>COMPUTING</topic><topic>COUNTING</topic><topic>ELECTRIC DIGITAL DATA PROCESSING</topic><topic>IMAGE DATA PROCESSING OR GENERATION, IN GENERAL</topic><topic>PHYSICS</topic><toplevel>online_resources</toplevel><creatorcontrib>SONG KYU HA</creatorcontrib><creatorcontrib>CHO YU MIN</creatorcontrib><creatorcontrib>KIM TAE HYUN</creatorcontrib><collection>esp@cenet</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>SONG KYU HA</au><au>CHO YU MIN</au><au>KIM TAE HYUN</au><format>patent</format><genre>patent</genre><ristype>GEN</ristype><title>Method And Apparatus for Detecting Defect Based on Cascade Pass-Fail Determination</title><date>2023-02-28</date><risdate>2023</risdate><abstract>Provided are a method and apparatus for detecting a defect based on cascade pass-fail determination. According to one aspect of the present disclosure, a method and apparatus for detecting a defect are provided. The method includes: obtaining a product image; inputting it into a first determination model; performing pass-fail determination; inputting the product image to a second determination model when the result of the pass-fail determination cannot be determined; and performing pass-fail determination.
본 개시는 단계적 합부 판정을 기반으로 한 불량 검출방법 및 장치를 제공한다. 본 개시의 일 측면에 의하면, 제품 이미지를 획득하여 제1 판정 모델에 입력하여 합부 판정을 수행하고, 합부 판정 결과, 판정 불가 판단을 받은 경우에 제2 판정 모델에 제품 이미지를 입력하여 합부 판정을 수행하는, 불량 검출방법 및 장치를 제공한다.</abstract><oa>free_for_read</oa></addata></record> |
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| subjects | CALCULATING COMPUTING COUNTING ELECTRIC DIGITAL DATA PROCESSING IMAGE DATA PROCESSING OR GENERATION, IN GENERAL PHYSICS |
| title | Method And Apparatus for Detecting Defect Based on Cascade Pass-Fail Determination |
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