METHOD AND APPARATUS FOR GENERATING PROCESS SIMULATION MODEL
According to the technological idea of the present disclosure, provided is a method for generating a simulation model based on simulation data and measurement data for an object, which includes the steps of: classifying weight parameters included in a pre-learning model learned based on simulation d...
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creator | JEONG CHANG WOOK MOON HYO WON MYUNG SANG HOON CHOE JAE MYUNG JEON YONG WOO |
description | According to the technological idea of the present disclosure, provided is a method for generating a simulation model based on simulation data and measurement data for an object, which includes the steps of: classifying weight parameters included in a pre-learning model learned based on simulation data into a first weight group and a second weight group according to importance; re-learning the first weight group of the pre-learning model based on the simulation data; and learning the second weight group of a transfer learning model including the first weight group re-learned based on the measurement data.
본 개시의 기술적 사상에 따른 대상에 대한 시뮬레이션 데이터 및 측정 데이터를 기초로 시뮬레이션 모델을 생성하는 방법은 상기 시뮬레이션 데이터를 기초로 학습된 사전 학습 모델에 포함된 가중치 파라미터들을 중요도에 따라 제1 가중치 그룹과 제2 가중치 그룹으로 분류하는 단계, 상기 시뮬레이션 데이터를 기초로 상기 사전 학습 모델의 상기 제1 가중치 그룹을 재학습시키는 단계 및 상기 측정 데이터를 기초로 재학습된 상기 제1 가중치 그룹을 포함하는 전이 학습 모델의 상기 제2 가중치 그룹을 학습시키는 단계를 포함한다. |
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fullrecord | <record><control><sourceid>epo_EVB</sourceid><recordid>TN_cdi_epo_espacenet_KR20230013995A</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>KR20230013995A</sourcerecordid><originalsourceid>FETCH-epo_espacenet_KR20230013995A3</originalsourceid><addsrcrecordid>eNrjZLDxdQ3x8HdRcPQD4oAAxyDHkNBgBTf_IAV3Vz9XIM_Tz10hIMjf2TU4WCHY0zfUByjk76fg6-_i6sPDwJqWmFOcyguluRmU3VxDnD10Uwvy41OLCxKTU_NSS-K9g4wMjIwNDAyNLS1NHY2JUwUAsdgqiA</addsrcrecordid><sourcetype>Open Access Repository</sourcetype><iscdi>true</iscdi><recordtype>patent</recordtype></control><display><type>patent</type><title>METHOD AND APPARATUS FOR GENERATING PROCESS SIMULATION MODEL</title><source>esp@cenet</source><creator>JEONG CHANG WOOK ; MOON HYO WON ; MYUNG SANG HOON ; CHOE JAE MYUNG ; JEON YONG WOO</creator><creatorcontrib>JEONG CHANG WOOK ; MOON HYO WON ; MYUNG SANG HOON ; CHOE JAE MYUNG ; JEON YONG WOO</creatorcontrib><description>According to the technological idea of the present disclosure, provided is a method for generating a simulation model based on simulation data and measurement data for an object, which includes the steps of: classifying weight parameters included in a pre-learning model learned based on simulation data into a first weight group and a second weight group according to importance; re-learning the first weight group of the pre-learning model based on the simulation data; and learning the second weight group of a transfer learning model including the first weight group re-learned based on the measurement data.
본 개시의 기술적 사상에 따른 대상에 대한 시뮬레이션 데이터 및 측정 데이터를 기초로 시뮬레이션 모델을 생성하는 방법은 상기 시뮬레이션 데이터를 기초로 학습된 사전 학습 모델에 포함된 가중치 파라미터들을 중요도에 따라 제1 가중치 그룹과 제2 가중치 그룹으로 분류하는 단계, 상기 시뮬레이션 데이터를 기초로 상기 사전 학습 모델의 상기 제1 가중치 그룹을 재학습시키는 단계 및 상기 측정 데이터를 기초로 재학습된 상기 제1 가중치 그룹을 포함하는 전이 학습 모델의 상기 제2 가중치 그룹을 학습시키는 단계를 포함한다.</description><language>eng ; kor</language><subject>CALCULATING ; COMPUTER SYSTEMS BASED ON SPECIFIC COMPUTATIONAL MODELS ; COMPUTING ; CONTROL OR REGULATING SYSTEMS IN GENERAL ; CONTROLLING ; COUNTING ; FUNCTIONAL ELEMENTS OF SUCH SYSTEMS ; MONITORING OR TESTING ARRANGEMENTS FOR SUCH SYSTEMS ORELEMENTS ; PHYSICS ; REGULATING</subject><creationdate>2023</creationdate><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20230127&DB=EPODOC&CC=KR&NR=20230013995A$$EHTML$$P50$$Gepo$$Hfree_for_read</linktohtml><link.rule.ids>230,308,776,881,25542,76289</link.rule.ids><linktorsrc>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20230127&DB=EPODOC&CC=KR&NR=20230013995A$$EView_record_in_European_Patent_Office$$FView_record_in_$$GEuropean_Patent_Office$$Hfree_for_read</linktorsrc></links><search><creatorcontrib>JEONG CHANG WOOK</creatorcontrib><creatorcontrib>MOON HYO WON</creatorcontrib><creatorcontrib>MYUNG SANG HOON</creatorcontrib><creatorcontrib>CHOE JAE MYUNG</creatorcontrib><creatorcontrib>JEON YONG WOO</creatorcontrib><title>METHOD AND APPARATUS FOR GENERATING PROCESS SIMULATION MODEL</title><description>According to the technological idea of the present disclosure, provided is a method for generating a simulation model based on simulation data and measurement data for an object, which includes the steps of: classifying weight parameters included in a pre-learning model learned based on simulation data into a first weight group and a second weight group according to importance; re-learning the first weight group of the pre-learning model based on the simulation data; and learning the second weight group of a transfer learning model including the first weight group re-learned based on the measurement data.
본 개시의 기술적 사상에 따른 대상에 대한 시뮬레이션 데이터 및 측정 데이터를 기초로 시뮬레이션 모델을 생성하는 방법은 상기 시뮬레이션 데이터를 기초로 학습된 사전 학습 모델에 포함된 가중치 파라미터들을 중요도에 따라 제1 가중치 그룹과 제2 가중치 그룹으로 분류하는 단계, 상기 시뮬레이션 데이터를 기초로 상기 사전 학습 모델의 상기 제1 가중치 그룹을 재학습시키는 단계 및 상기 측정 데이터를 기초로 재학습된 상기 제1 가중치 그룹을 포함하는 전이 학습 모델의 상기 제2 가중치 그룹을 학습시키는 단계를 포함한다.</description><subject>CALCULATING</subject><subject>COMPUTER SYSTEMS BASED ON SPECIFIC COMPUTATIONAL MODELS</subject><subject>COMPUTING</subject><subject>CONTROL OR REGULATING SYSTEMS IN GENERAL</subject><subject>CONTROLLING</subject><subject>COUNTING</subject><subject>FUNCTIONAL ELEMENTS OF SUCH SYSTEMS</subject><subject>MONITORING OR TESTING ARRANGEMENTS FOR SUCH SYSTEMS ORELEMENTS</subject><subject>PHYSICS</subject><subject>REGULATING</subject><fulltext>true</fulltext><rsrctype>patent</rsrctype><creationdate>2023</creationdate><recordtype>patent</recordtype><sourceid>EVB</sourceid><recordid>eNrjZLDxdQ3x8HdRcPQD4oAAxyDHkNBgBTf_IAV3Vz9XIM_Tz10hIMjf2TU4WCHY0zfUByjk76fg6-_i6sPDwJqWmFOcyguluRmU3VxDnD10Uwvy41OLCxKTU_NSS-K9g4wMjIwNDAyNLS1NHY2JUwUAsdgqiA</recordid><startdate>20230127</startdate><enddate>20230127</enddate><creator>JEONG CHANG WOOK</creator><creator>MOON HYO WON</creator><creator>MYUNG SANG HOON</creator><creator>CHOE JAE MYUNG</creator><creator>JEON YONG WOO</creator><scope>EVB</scope></search><sort><creationdate>20230127</creationdate><title>METHOD AND APPARATUS FOR GENERATING PROCESS SIMULATION MODEL</title><author>JEONG CHANG WOOK ; MOON HYO WON ; MYUNG SANG HOON ; CHOE JAE MYUNG ; JEON YONG WOO</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-epo_espacenet_KR20230013995A3</frbrgroupid><rsrctype>patents</rsrctype><prefilter>patents</prefilter><language>eng ; kor</language><creationdate>2023</creationdate><topic>CALCULATING</topic><topic>COMPUTER SYSTEMS BASED ON SPECIFIC COMPUTATIONAL MODELS</topic><topic>COMPUTING</topic><topic>CONTROL OR REGULATING SYSTEMS IN GENERAL</topic><topic>CONTROLLING</topic><topic>COUNTING</topic><topic>FUNCTIONAL ELEMENTS OF SUCH SYSTEMS</topic><topic>MONITORING OR TESTING ARRANGEMENTS FOR SUCH SYSTEMS ORELEMENTS</topic><topic>PHYSICS</topic><topic>REGULATING</topic><toplevel>online_resources</toplevel><creatorcontrib>JEONG CHANG WOOK</creatorcontrib><creatorcontrib>MOON HYO WON</creatorcontrib><creatorcontrib>MYUNG SANG HOON</creatorcontrib><creatorcontrib>CHOE JAE MYUNG</creatorcontrib><creatorcontrib>JEON YONG WOO</creatorcontrib><collection>esp@cenet</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>JEONG CHANG WOOK</au><au>MOON HYO WON</au><au>MYUNG SANG HOON</au><au>CHOE JAE MYUNG</au><au>JEON YONG WOO</au><format>patent</format><genre>patent</genre><ristype>GEN</ristype><title>METHOD AND APPARATUS FOR GENERATING PROCESS SIMULATION MODEL</title><date>2023-01-27</date><risdate>2023</risdate><abstract>According to the technological idea of the present disclosure, provided is a method for generating a simulation model based on simulation data and measurement data for an object, which includes the steps of: classifying weight parameters included in a pre-learning model learned based on simulation data into a first weight group and a second weight group according to importance; re-learning the first weight group of the pre-learning model based on the simulation data; and learning the second weight group of a transfer learning model including the first weight group re-learned based on the measurement data.
본 개시의 기술적 사상에 따른 대상에 대한 시뮬레이션 데이터 및 측정 데이터를 기초로 시뮬레이션 모델을 생성하는 방법은 상기 시뮬레이션 데이터를 기초로 학습된 사전 학습 모델에 포함된 가중치 파라미터들을 중요도에 따라 제1 가중치 그룹과 제2 가중치 그룹으로 분류하는 단계, 상기 시뮬레이션 데이터를 기초로 상기 사전 학습 모델의 상기 제1 가중치 그룹을 재학습시키는 단계 및 상기 측정 데이터를 기초로 재학습된 상기 제1 가중치 그룹을 포함하는 전이 학습 모델의 상기 제2 가중치 그룹을 학습시키는 단계를 포함한다.</abstract><oa>free_for_read</oa></addata></record> |
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subjects | CALCULATING COMPUTER SYSTEMS BASED ON SPECIFIC COMPUTATIONAL MODELS COMPUTING CONTROL OR REGULATING SYSTEMS IN GENERAL CONTROLLING COUNTING FUNCTIONAL ELEMENTS OF SUCH SYSTEMS MONITORING OR TESTING ARRANGEMENTS FOR SUCH SYSTEMS ORELEMENTS PHYSICS REGULATING |
title | METHOD AND APPARATUS FOR GENERATING PROCESS SIMULATION MODEL |
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